PROCEEDINGS VOLUME 1242
ELECTRONIC IMAGING: ADVANCED DEVICES AND SYSTEMS | 11-16 FEBRUARY 1990
Charge-Coupled Devices and Solid State Optical Sensors
IN THIS VOLUME

0 Sessions, 27 Papers, 0 Presentations
Large Arrays  (5)
New Sensors  (5)
ELECTRONIC IMAGING: ADVANCED DEVICES AND SYSTEMS
11-16 February 1990
Santa Clara, CA, United States
Large Arrays
Proc. SPIE 1242, Four-million-pixel CCD image sensor, 0000 (1 July 1990); doi: 10.1117/12.19427
Proc. SPIE 1242, Design aspects and characterization of EEV large-area CCDs for scientific and medical applications, 0000 (1 July 1990); doi: 10.1117/12.19428
New Sensors
Proc. SPIE 1242, 1-megapixel IL-CCD image sensor with a progressive scan, antiblooming control, and lag-free operation, 0000 (1 July 1990); doi: 10.1117/12.19430
Large Arrays
Proc. SPIE 1242, THX 31162: 768 x 576 pixel area array CCD sensor, 0000 (1 July 1990); doi: 10.1117/12.19432
New Technology
Proc. SPIE 1242, High-performance mechanically butted 12,000 x 1 pixel VIS/NIR focal-plane array, 0000 (1 July 1990); doi: 10.1117/12.19433
CCD Applications and Characterization
Proc. SPIE 1242, Charge-coupled devices for quantitative confocal microscopy of the eye, 0000 (1 July 1990); doi: 10.1117/12.19435
New Sensors
CCD Applications and Characterization
Proc. SPIE 1242, Medical x-ray imaging applications of the TEK2048 CCD, 0000 (1 July 1990); doi: 10.1117/12.19437
Large Arrays
Proc. SPIE 1242, Development of a 2048 X 2048 imager for scientific applications, 0000 (1 July 1990); doi: 10.1117/12.19438
CCD Applications and Characterization
Proc. SPIE 1242, Characterization of soft x-ray damage in charge-coupled devices, 0000 (1 July 1990); doi: 10.1117/12.19439
New Technology
Proc. SPIE 1242, Effects of transistor geometry on CCD output sensitivity, 0000 (1 July 1990); doi: 10.1117/12.19440
Focal-Plane Image Processing
Proc. SPIE 1242, Design of a CCD focal-plane codec preprocessor for lossless image compression, 0000 (1 July 1990); doi: 10.1117/12.19443
Proc. SPIE 1242, Design of a CCD focal-plane image halftoner, 0000 (1 July 1990); doi: 10.1117/12.19444
Proc. SPIE 1242, Retinalike space variant CCD sensor, 0000 (1 July 1990); doi: 10.1117/12.19445
Proc. SPIE 1242, Analog neural networks for focal-plane image processing, 0000 (1 July 1990); doi: 10.1117/12.19446
Proc. SPIE 1242, CCD/CMOS process for integrated image acquisition and early vision signal processing, 0000 (1 July 1990); doi: 10.1117/12.19448
New Technology
Proc. SPIE 1242, Recent charge-coupled device optimization results at Steward Observatory, 0000 (1 July 1990); doi: 10.1117/12.19449
Proc. SPIE 1242, Wire transfer of charge packets for on-chip CCD signal processing, 0000 (1 July 1990); doi: 10.1117/12.19451
New Sensors
Proc. SPIE 1242, New advancements in charge-coupled device technology: subelectron noise and 4096 x 4096 pixel CCDs, 0000 (1 July 1990); doi: 10.1117/12.19452
Proc. SPIE 1242, High-speed, low-noise, fine-resolution TDI CCD imagers, 0000 (1 July 1990); doi: 10.1117/12.19453
New Technology
Proc. SPIE 1242, Signal-to-noise ratio analysis of charge-coupled device imagers, 0000 (1 July 1990); doi: 10.1117/12.19454
CCD Applications and Characterization
Proc. SPIE 1242, Line illumination system and detector for film digitization, 0000 (1 July 1990); doi: 10.1117/12.19455
Proc. SPIE 1242, Computer image acquisition using a low-resolution CCD array, 0000 (1 July 1990); doi: 10.1117/12.19456
New Sensors
Proc. SPIE 1242, Sub-electron noise charge-coupled devices, 0000 (1 July 1990); doi: 10.1117/12.19457
CCD Applications and Characterization
Proc. SPIE 1242, Proton radiation effects on multi-pinned-phased CCDs, 0000 (1 July 1990); doi: 10.1117/12.19458
Proc. SPIE 1242, Charge transfer efficiency measurements at low signal levels on STIS/SOHO TK1024 CCDs, 0000 (1 July 1990); doi: 10.1117/12.19459
Large Arrays
Proc. SPIE 1242, Large-screen displays for consumer and theatre use, 0000 (1 July 1990); doi: 10.1117/12.19460
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