PROCEEDINGS VOLUME 1265
THE INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING | 12-16 MARCH 1990
Industrial Inspection II
THE INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING
12-16 March 1990
The Hague, Netherlands
Techniques and Instrumentation
Proc. SPIE 1265, Integration of design and inspection, 0000 (1 August 1990); doi: 10.1117/12.20226
Proc. SPIE 1265, CAD/CAM-coupled image processing systems, 0000 (1 August 1990); doi: 10.1117/12.20227
Proc. SPIE 1265, Optical noninvasive and nondestructive sensing of the glass transition temperature of 1-um-thick polymer films, 0000 (1 August 1990); doi: 10.1117/12.20228
Proc. SPIE 1265, Fiber optic illumination systems, 0000 (1 August 1990); doi: 10.1117/12.34697
Proc. SPIE 1265, Method of image transferring by a noncoherent fiber optic bundle, 0000 (1 August 1990); doi: 10.1117/12.20230
Proc. SPIE 1265, Laser computer-aided phase microscope with 10-nm resolution, 0000 (1 August 1990); doi: 10.1117/12.20231
Proc. SPIE 1265, 3-D camera based on conoscopic holography, 0000 (1 August 1990); doi: 10.1117/12.20232
Proc. SPIE 1265, New stereoscopic approach for the electro-optical coordinate measurement, 0000 (1 August 1990); doi: 10.1117/12.20233
Inferential Techniques and Neural Networks
Proc. SPIE 1265, Photometric ranging and 3-D vision, 0000 (1 August 1990); doi: 10.1117/12.20235
Proc. SPIE 1265, Neural-network-based inspection of machined surfaces using laser scattering, 0000 (1 August 1990); doi: 10.1117/12.20236
Proc. SPIE 1265, Color and shape classification with competing paradigms: neural networks versus trainable table classifiers, 0000 (1 August 1990); doi: 10.1117/12.20237
Proc. SPIE 1265, Neuronal networks for pattern recognition, 0000 (1 August 1990); doi: 10.1117/12.20238
Metrology and its Applications
Proc. SPIE 1265, Laser scanner for thickness measurements on the production line, 0000 (1 August 1990); doi: 10.1117/12.20239
Proc. SPIE 1265, Profile measurement for printed wiring boards, 0000 (1 August 1990); doi: 10.1117/12.20240
Proc. SPIE 1265, Reflectance method for the verification of integrated circuit and masking structures, 0000 (1 August 1990); doi: 10.1117/12.20241
Proc. SPIE 1265, Automatic optical detection and classification of submicron defects on e-beam mask blanks, 0000 (1 August 1990); doi: 10.1117/12.20242
Proc. SPIE 1265, Universal pixel-synchronous data acquisition system for high-resolution CCD image sensors, 0000 (1 August 1990); doi: 10.1117/12.20243
Proc. SPIE 1265, Measurement accuracy of noncontact video inspection systems, 0000 (1 August 1990); doi: 10.1117/12.20244
Proc. SPIE 1265, Full-field Fourier fringe analysis for industrial inspection, 0000 (1 August 1990); doi: 10.1117/12.20245
Proc. SPIE 1265, Measurement of hot surfaces by pulsed time-of-flight laser radar techniques, 0000 (1 August 1990); doi: 10.1117/12.20246
Surface Inspection and ESPI
Proc. SPIE 1265, Automatic quality and ripeness inspection system, 0000 (1 August 1990); doi: 10.1117/12.20248
Proc. SPIE 1265, Optical classification of metal-milled samples using Fourier spectrum sampling, 0000 (1 August 1990); doi: 10.1117/12.20249
Proc. SPIE 1265, Multiresolution image processing for rough defect classification, 0000 (1 August 1990); doi: 10.1117/12.20250
Proc. SPIE 1265, Image processing and TV-holography, 0000 (1 August 1990); doi: 10.1117/12.20253
Back to Top