PROCEEDINGS VOLUME 1270
THE INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING | 12-16 MARCH 1990
Optical Thin Films and Applications
IN THIS VOLUME

0 Sessions, 34 Papers, 0 Presentations
Applications  (9)
THE INTERNATIONAL CONGRESS ON OPTICAL SCIENCE AND ENGINEERING
12-16 March 1990
The Hague, Netherlands
Thin Film Design
Proc. SPIE 1270, Epstein equivalent layer versus Chebyshev polynomial synthesis in optical interference coating design, 0000 (1 August 1990); doi: 10.1117/12.20358
Proc. SPIE 1270, Dielectric filter optimization by simulated thermal annealing: a simulated zone-melting approach, 0000 (1 August 1990); doi: 10.1117/12.20359
Proc. SPIE 1270, Stochastic synthesis of multilayers, 0000 (1 August 1990); doi: 10.1117/12.20360
Proc. SPIE 1270, Optimality of thin film optical coating design, 0000 (1 August 1990); doi: 10.1117/12.20361
Proc. SPIE 1270, Design of wideband antireflection coating with the Fourier transform method, 0000 (1 August 1990); doi: 10.1117/12.20362
Proc. SPIE 1270, Generalized properties of superfine stratified periodic structures, 0000 (1 August 1990); doi: 10.1117/12.20363
Proc. SPIE 1270, Approach to the development of CAD/CAM system for multilayer optical coatings, 0000 (1 August 1990); doi: 10.1117/12.20364
Characterization
Proc. SPIE 1270, Further studies on thermal aspects of inclusion-dominated processes in laser-induced thin film damage, 0000 (1 August 1990); doi: 10.1117/12.20365
Proc. SPIE 1270, Scattering from optical surfaces and coatings: an easy investigation of microroughness, 0000 (1 August 1990); doi: 10.1117/12.20366
Proc. SPIE 1270, Photothermal deflection spectroscopy for the study of thin films and optical coatings: measurements of absorption losses and detection of photoinduced changes, 0000 (1 August 1990); doi: 10.1117/12.20367
Proc. SPIE 1270, Classical oscillator dispersion model for optical coatings, 0000 (1 August 1990); doi: 10.1117/12.20368
Proc. SPIE 1270, Characterization of optical thin films for applications at 10.6 um, 0000 (1 August 1990); doi: 10.1117/12.20369
Proc. SPIE 1270, Recent improvements in PDS technique for low-absorption measurements, 0000 (1 August 1990); doi: 10.1117/12.20370
Proc. SPIE 1270, Optical characterization of low-absorbing thin films in the visible and infrared spectrum, 0000 (1 August 1990); doi: 10.1117/12.20371
Proc. SPIE 1270, Developments in in-situ ellipsometer monitoring of thin film growth during reactive ion plating deposition, 0000 (1 August 1990); doi: 10.1117/12.20372
Proc. SPIE 1270, Measuring surface roughness of an optical thin film with scanning tunneling microscopes, 0000 (1 August 1990); doi: 10.1117/12.20373
New Coating Technoligies
Proc. SPIE 1270, Comparison of different technologies for high-quality optical coatings, 0000 (1 August 1990); doi: 10.1117/12.20374
Proc. SPIE 1270, Interference filters from molecular beam deposition, 0000 (1 August 1990); doi: 10.1117/12.20375
Proc. SPIE 1270, PLISD: a new high-vacuum sputtering technique for thin film deposition, 0000 (1 August 1990); doi: 10.1117/12.20376
Proc. SPIE 1270, Large-area IAD with a new plasma source, 0000 (1 August 1990); doi: 10.1117/12.20377
Proc. SPIE 1270, Recent progress in optical coating technology: low-voltage ion plating deposition, 0000 (1 August 1990); doi: 10.1117/12.20378
Proc. SPIE 1270, Deposition and characterization of sputtered vanadium dioxide films, 0000 (1 August 1990); doi: 10.1117/12.20379
Proc. SPIE 1270, Combined filter method for spectral response matching, 0000 (1 August 1990); doi: 10.1117/12.20380
Applications
Proc. SPIE 1270, System performance in IR atmospheric radiometry, 0000 (1 August 1990); doi: 10.1117/12.20381
Proc. SPIE 1270, How an optical coating alters the path of a ray, 0000 (1 August 1990); doi: 10.1117/12.20382
Proc. SPIE 1270, Control of parameters of diffraction gratings on mirrors with multilayer coatings, 0000 (1 August 1990); doi: 10.1117/12.20383
Proc. SPIE 1270, Dielectric films deposition with cross-section variable thickness for amplitude filters on the basis of frustrated total internal reflection, 0000 (1 August 1990); doi: 10.1117/12.20384
Proc. SPIE 1270, Design of optical coatings, 0000 (1 August 1990); doi: 10.1117/12.20385
Proc. SPIE 1270, Design and manufacturing of ophthalmic antireflection coatings with low angular color shift, 0000 (1 August 1990); doi: 10.1117/12.20386
Proc. SPIE 1270, Thickness distribution of evaporated films, 0000 (1 August 1990); doi: 10.1117/12.20387
Proc. SPIE 1270, Geometrical limiting performances of a thermal evaporation PVD unit for lens coating, 0000 (1 August 1990); doi: 10.1117/12.20388
Characterization
Proc. SPIE 1270, Ellipsometry of thin uniaxial layers, 0000 (1 August 1990); doi: 10.1117/12.20389
Proc. SPIE 1270, Investigation of scattering caused by thin film columnar structure, 0000 (1 August 1990); doi: 10.1117/12.20390
Applications
Proc. SPIE 1270, Laser-induced damage thresholds and optical constants of ion-plated and ion-beam-sputtered Al2O3 and HfO2 coatings for the ultraviolet, 0000 (1 August 1990); doi: 10.1117/12.20391
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