PROCEEDINGS VOLUME 1400
SINGAPORE | 22-27 OCTOBER 1990
Optical Fabrication and Testing
IN THIS VOLUME

0 Sessions, 23 Papers, 0 Presentations
SINGAPORE
22-27 October 1990
-, Singapore
Fabrication and Manufacture
Proc. SPIE 1400, Application and machining of Zerodur for optical purposes, 0000 (1 March 1991); doi: 10.1117/12.47835
Interferometry and Associated Techniques
Proc. SPIE 1400, Investigation of fiber-reinforced-plastics-based components by means of holographic interferometry, 0000 (1 March 1991); doi: 10.1117/12.47836
Interferometry
Proc. SPIE 1400, Interferometer accuracy and precision, 0000 (1 March 1991); doi: 10.1117/12.26110
Interferometry and Associated Techniques
Proc. SPIE 1400, Absolute interferometric testing of spherical surfaces, 0000 (1 March 1991); doi: 10.1117/12.26111
Surface Metrology and Testing
Proc. SPIE 1400, Noncontact optical microtopography, 0000 (1 March 1991); doi: 10.1117/12.47837
Interferometry and Associated Techniques
Proc. SPIE 1400, Three-dimensional inspection using laser-based dynamic fringe projection, 0000 (1 March 1991); doi: 10.1117/12.26112
Fabrication and Manufacture
Proc. SPIE 1400, New glasses for optics and optoelectronics, 0000 (1 March 1991); doi: 10.1117/12.47838
Proc. SPIE 1400, Theory and experiment as tools for assessing surface finish in the UV-visible wavelength region, 0000 (1 March 1991); doi: 10.1117/12.47839
Interferometry
Proc. SPIE 1400, Optical testing with wavelength scanning interferometer, 0000 (1 March 1991); doi: 10.1117/12.26113
Surface Metrology and Testing
Proc. SPIE 1400, Design and testing of a cube-corner array for laser ranging, 0000 (1 March 1991); doi: 10.1117/12.47840
Interferometry
Proc. SPIE 1400, Interferometry with laser diodes, 0000 (1 March 1991); doi: 10.1117/12.26114
Fabrication and Manufacture
Proc. SPIE 1400, High-speed oscillation free lapping and polishing process for optical lenses, 0000 (1 March 1991); doi: 10.1117/12.47841
Interferometry
Proc. SPIE 1400, Digital Talbot interferometer, 0000 (1 March 1991); doi: 10.1117/12.26115
Surface Metrology and Testing
Proc. SPIE 1400, Photon scanning tunneling microscopy, 0000 (1 March 1991); doi: 10.1117/12.47842
Proc. SPIE 1400, Laser scan microscope and infrared laser scan microcope: two important tools for device testing, 0000 (1 March 1991); doi: 10.1117/12.47843
Interferometry and Associated Techniques
Proc. SPIE 1400, High-sensitivity interferometric technique for strain measurements, 0000 (1 March 1991); doi: 10.1117/12.26116
Surface Metrology and Testing
Proc. SPIE 1400, Study on the mode and far-field pattern of diode laser-phased arrays, 0000 (1 March 1991); doi: 10.1117/12.47844
Interferometry and Associated Techniques
Proc. SPIE 1400, Method for evaluating displacement of objects using the Wigner distribution function, 0000 (1 March 1991); doi: 10.1117/12.47845
Fabrication and Manufacture
Proc. SPIE 1400, Optical properties of Li-doped ZnO films, 0000 (1 March 1991); doi: 10.1117/12.47846
Interferometry and Associated Techniques
Proc. SPIE 1400, Contouring using gratings created on a LCD panel, 0000 (1 March 1991); doi: 10.1117/12.26117
Surface Metrology and Testing
Proc. SPIE 1400, Combination-matching problems in the layout design of minilaser rangefinder, 0000 (1 March 1991); doi: 10.1117/12.26118
Interferometry
Proc. SPIE 1400, New methods for economic production of prisms and lenses, 0000 (1 March 1991); doi: 10.1117/12.26119
Fabrication and Manufacture
Proc. SPIE 1400, Finish machining of optical components in mass production, 0000 (1 March 1991); doi: 10.1117/12.47847
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