PROCEEDINGS VOLUME 1573
SIRA | 1-7 NOVEMBER 1991
Commercial Applications of Precision Manufacturing at the Sub-Micron Level
IN THIS VOLUME

0 Sessions, 31 Papers, 0 Presentations
Keynote  (1)
SIRA
1-7 November 1991
London, United Kingdom
Keynote
Proc. SPIE 1573, Commercial applications of precision manufacturing at the sub-micron level, 0000 (1 April 1992); doi: 10.1117/12.57736
Materials, Processes, and Components
Proc. SPIE 1573, Overview: materials and processes, 0000 (1 April 1992); doi: 10.1117/12.57737
Proc. SPIE 1573, Trends in optical design and optical surfaces, 0000 (1 April 1992); doi: 10.1117/12.57738
Proc. SPIE 1573, Computer-controlled polishing to fabricate special optics, 0000 (1 April 1992); doi: 10.1117/12.57739
Proc. SPIE 1573, Cost-effective fabrication of optical components using sub-nanometer closed-loop control of the polishing surface shape, 0000 (1 April 1992); doi: 10.1117/12.57740
Proc. SPIE 1573, Electrolytically assisted ductile-mode diamond grinding of BK7 and SF10 optical glasses, 0000 (1 April 1992); doi: 10.1117/12.57741
Proc. SPIE 1573, Single-point diamond form-finishing of glasses and other macroscopically brittle materials, 0000 (1 April 1992); doi: 10.1117/12.57742
Proc. SPIE 1573, Fundamental axial spindle motions and optical tolerancing, 0000 (1 April 1992); doi: 10.1117/12.57743
Proc. SPIE 1573, Manufacture of large-scale mechanical devices in single-crystal silicon by high-speed grinding, 0000 (1 April 1992); doi: 10.1117/12.57744
Proc. SPIE 1573, Production and testing of precision plastics optical components, 0000 (1 April 1992); doi: 10.1117/12.57745
Proc. SPIE 1573, High-precision silicon nitride balls for bearings, 0000 (1 April 1992); doi: 10.1117/12.57746
Emerging Technologies
Proc. SPIE 1573, Excimer lasers for submicron feature generation, 0000 (1 April 1992); doi: 10.1117/12.57747
Proc. SPIE 1573, Optoelectronic packaging, 0000 (1 April 1992); doi: 10.1117/12.57748
Proc. SPIE 1573, Microlens arrays, 0000 (1 April 1992); doi: 10.1117/12.57749
Proc. SPIE 1573, Hybrid refractive-diffractive lens for manufacture by diamond turning, 0000 (1 April 1992); doi: 10.1117/12.57750
Proc. SPIE 1573, Tetraform grinding, 0000 (1 April 1992); doi: 10.1117/12.57751
Proc. SPIE 1573, Cost-effective production of microgrooves for drag reduction on the surface of aircraft in situ, 0000 (1 April 1992); doi: 10.1117/12.57752
Proc. SPIE 1573, Personal manufacturing systems, 0000 (1 April 1992); doi: 10.1117/12.57753
Proc. SPIE 1573, Total joint prostheses: a bearing problem, 0000 (1 April 1992); doi: 10.1117/12.57754
Proc. SPIE 1573, Sol-gel technology, 0000 (1 April 1992); doi: 10.1117/12.57755
Measurement and Characterisation
Proc. SPIE 1573, Overview: sensitive techniques for surface measurement and characterization, 0000 (1 April 1992); doi: 10.1117/12.57756
Proc. SPIE 1573, Advances in interferometric wavefront-measuring technology through the direct measuring interferometry method, 0000 (1 April 1992); doi: 10.1117/12.57757
Proc. SPIE 1573, Surface characterisation via optical diffraction, 0000 (1 April 1992); doi: 10.1117/12.57758
Proc. SPIE 1573, Fast linear measurement and surface metrology techniques, 0000 (1 April 1992); doi: 10.1117/12.57759
Proc. SPIE 1573, Measurement of complex shapes: optical noncontact methods, 0000 (1 April 1992); doi: 10.1117/12.57760
Proc. SPIE 1573, Standard for surface damage, 0000 (1 April 1992); doi: 10.1117/12.57761
Proc. SPIE 1573, Some problems in the characterisation of surface microtopography, 0000 (1 April 1992); doi: 10.1117/12.57762
Proc. SPIE 1573, Compensation of residual form errors in precision-machined components, 0000 (1 April 1992); doi: 10.1117/12.57763
Proc. SPIE 1573, Pneumatic method for making fast, higher resolution, noncontacting measurement of surface topography, 0000 (1 April 1992); doi: 10.1117/12.57764
Proc. SPIE 1573, Noncontact surface profiling using a novel capacitive technique: scanning capacitance microscopy, 0000 (1 April 1992); doi: 10.1117/12.57765
Proc. SPIE 1573, Calibration of height-measuring probes, 0000 (1 April 1992); doi: 10.1117/12.57766
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