PROCEEDINGS VOLUME 1614
ROBOTICS '91 | 14-15 NOVEMBER 1991
Optics, Illumination, and Image Sensing for Machine Vision VI
ROBOTICS '91
14-15 November 1991
Boston, MA, United States
Illumination and Sensing Methods and Systems
Proc. SPIE 1614, Light source design for machine vision, 0000 (1 March 1992); doi: 10.1117/12.57965
Proc. SPIE 1614, Grazing-incidence lighting techniques for machine vision inspection, 0000 (1 March 1992); doi: 10.1117/12.57966
Proc. SPIE 1614, Multisource and color lighting for detection of small protuberance, 0000 (1 March 1992); doi: 10.1117/12.57967
Proc. SPIE 1614, Optical scattering measurement instrument for the design of machine vision illumination, 0000 (1 March 1992); doi: 10.1117/12.57968
Proc. SPIE 1614, Development and characterization of a liquid-crystal projection unit for adaptive structured illumination, 0000 (1 March 1992); doi: 10.1117/12.57969
Proc. SPIE 1614, Distinguishing cast shadow boundaries from abrupt object boundaries via edge detection, 0000 (1 March 1992); doi: 10.1117/12.57970
Proc. SPIE 1614, Three-dimensional shape and source location from depth and reflectance, 0000 (1 March 1992); doi: 10.1117/12.57971
Proc. SPIE 1614, VLSI sensor/processor circuitry for autonomous robots, 0000 (1 March 1992); doi: 10.1117/12.57972
Image and Instrument Models and Analysis
Proc. SPIE 1614, Matching solid state camera with frame grabber: a must for accurate gauging, 0000 (1 March 1992); doi: 10.1117/12.57973
Proc. SPIE 1614, Modeling and calibrating CCD cameras for illumination-insensitive machine vision, 0000 (1 March 1992); doi: 10.1117/12.57974
Proc. SPIE 1614, Efficient and accurate camera calibration technique for 3-D computer vision, 0000 (1 March 1992); doi: 10.1117/12.57975
Proc. SPIE 1614, Calibration of an active stereoscopic imaging system, 0000 (1 March 1992); doi: 10.1117/12.57976
Proc. SPIE 1614, Scene reconstruction from distorted images using self-calibration of camera parameters, 0000 (1 March 1992); doi: 10.1117/12.57977
Proc. SPIE 1614, Image processor development with synthetic images, 0000 (1 March 1992); doi: 10.1117/12.57978
Optical Processing and Data Manipulation
Proc. SPIE 1614, Optical morphological processing of disordered structures, 0000 (1 March 1992); doi: 10.1117/12.57979
Proc. SPIE 1614, Detection, location, and quantification of structural damage by neural-net-processed moire profilometry, 0000 (1 March 1992); doi: 10.1117/12.57980
Proc. SPIE 1614, High-speed coherent optical correlator based on two MOSLMs, 0000 (1 March 1992); doi: 10.1117/12.57981
Proc. SPIE 1614, Double MOSLM neural-like coherent optical processor for distorted image recognition, 0000 (1 March 1992); doi: 10.1117/12.57982
Three-Dimensional Imaging Techniques and Systems
Proc. SPIE 1614, Fusion of range and intensity data in a scanning sensor, 0000 (1 March 1992); doi: 10.1117/12.57983
Proc. SPIE 1614, Three-dimensional line-scan intensity ratio sensing, 0000 (1 March 1992); doi: 10.1117/12.57984
Proc. SPIE 1614, Hybrid system of optics and computer for 3-D object recognition, 0000 (1 March 1992); doi: 10.1117/12.57985
Proc. SPIE 1614, Absolute measurement using field-shifted moire, 0000 (1 March 1992); doi: 10.1117/12.57986
Proc. SPIE 1614, Signal-to-noise improvements in moire profilometry by acousto-optic scanned gratings and video processing, 0000 (1 March 1992); doi: 10.1117/12.57987
Proc. SPIE 1614, Pulsed time-of-flight laser range-finding techniques for industrial applications, 0000 (1 March 1992); doi: 10.1117/12.57988
Proc. SPIE 1614, Comparison of continuous-wave and pulsed time-of-flight laser range-finding techniques, 0000 (1 March 1992); doi: 10.1117/12.57989
Proc. SPIE 1614, Influence of object structure on the accuracy of 3-D systems for metrology, 0000 (1 March 1992); doi: 10.1117/12.57990
Proc. SPIE 1614, Phase-grating use for slope discrimination in moire contouring, 0000 (1 March 1992); doi: 10.1117/12.57991
Illumination and Sensing Methods and Systems
Proc. SPIE 1614, On-line detection of surface defects on steel billets using multiple grazing-incidence light sources, 0000 (1 March 1992); doi: 10.1117/12.57992
Proc. SPIE 1614, Optical system for the detection of surface imperfections in ceramics for use in a computer-based quality control machine, 0000 (1 March 1992); doi: 10.1117/12.57993
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