PROCEEDINGS VOLUME 1620
SPIE TECHNICAL: OPTCON '91 | 1-30 NOVEMBER 1991
Laser Testing and Reliability
SPIE TECHNICAL: OPTCON '91
1-30 November 1991
San Jose, CA, United States
Semiconductor Laser Reliability and Testing I
Proc. SPIE 1620, Application of OBIC and photoluminescence to the failure analysis of laser diode devices, 0000 (1 February 1992); doi: 10.1117/12.56856
Proc. SPIE 1620, Implementation of a system to life test 2-D laser arrays, 0000 (1 February 1992); doi: 10.1117/12.56857
Proc. SPIE 1620, Optical feedback in diagnostic methods and testing of semiconductor laser diodes, 0000 (1 February 1992); doi: 10.1117/12.56858
Semiconductor Laser Reliability and Testing II
Proc. SPIE 1620, Reliability of ridge waveguide GaInAsP/InP laser, 0000 (1 February 1992); doi: 10.1117/12.56859
Proc. SPIE 1620, Effect of degradation modes on the lifetime assessment of GaAlAs/GaAs laser, 0000 (1 February 1992); doi: 10.1117/12.56860
Proc. SPIE 1620, Lambdameter for accurate stability measurements of optical transmitters, 0000 (1 February 1992); doi: 10.1117/12.56861
Proc. SPIE 1620, Reliability of a self-pulsating CD laser for fiber optic data links, 0000 (1 February 1992); doi: 10.1117/12.56862
Solid State and Gas Laser Reliability and Testing
Proc. SPIE 1620, Experimental methods for designing, testing, and producing reliable high-power ion lasers, 0000 (1 February 1992); doi: 10.1117/12.56863
Semiconductor Laser Reliability and Testing II
Proc. SPIE 1620, Effects of F2 concentration on the degradation of discharge-pumped KrF laser output, 0000 (1 February 1992); doi: 10.1117/12.56864
Solid State and Gas Laser Reliability and Testing
Proc. SPIE 1620, Characteristics of laser-induced luminescence in poly(paraphenylene), 0000 (1 February 1992); doi: 10.1117/12.56865
Proc. SPIE 1620, Reliability requirements for solid state lasers in space applications, 0000 (1 February 1992); doi: 10.1117/12.56866
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