PROCEEDINGS VOLUME 1624
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1991 | 23-25 OCTOBER 1991
Laser-Induced Damage in Optical Materials: 1991
IN THIS VOLUME

0 Sessions, 46 Papers, 0 Presentations
Thin Films  (18)
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1991
23-25 October 1991
Boulder, CO, United States
Materials and Measurements
Proc. SPIE 1624, Laser damage threshold measurements of AgGaSe2 crystal at 9 um, 0000 (29 July 1992); doi: 10.1117/12.60090
Thin Films
Proc. SPIE 1624, Broadband optical coatings for the novel high-power wide-tuning-range OPO lasers, 0000 (29 July 1992); doi: 10.1117/12.60091
Materials and Measurements
Proc. SPIE 1624, Laser-induced functional damage to silicon CCD sensor arrays, 0000 (29 July 1992); doi: 10.1117/12.60092
Proc. SPIE 1624, Laser-induced damage threshold comparison of reactive low-voltage ion-plated and e-beam coatings, 0000 (29 July 1992); doi: 10.1117/12.60093
Fundamental Mechanisms
Proc. SPIE 1624, Transient stress evolution and crystallization in laser-irradiated amorphous titania sol-gel films, 0000 (29 July 1992); doi: 10.1117/12.60094
Thin Films
Proc. SPIE 1624, High damage threshold mirrors and polarizers in the ZrO2/SiO2 and HfO2/SiO2 dielectric systems, 0000 (29 July 1992); doi: 10.1117/12.60095
Fundamental Mechanisms
Proc. SPIE 1624, Two-dimensional modeling of mechanical and thermal effects of high-power lasers on thin films, 0000 (29 July 1992); doi: 10.1117/12.60096
Materials and Measurements
Proc. SPIE 1624, Effect of fabrication techniques on photodiode performance under 1.06-um pulsed-laser irradiation, 0000 (29 July 1992); doi: 10.1117/12.60097
Surfaces and Mirrors
Proc. SPIE 1624, Particle removal from surfaces by pulsed-laser irradiation, 0000 (29 July 1992); doi: 10.1117/12.60098
Thin Films
Proc. SPIE 1624, Optical properties of titania films prepared by ion-assisted deposition, 0000 (29 July 1992); doi: 10.1117/12.60099
Materials and Measurements
Proc. SPIE 1624, Laser-Hardened Materials Evaluation Laboratory testing facility, 0000 (29 July 1992); doi: 10.1117/12.60100
Thin Films
Proc. SPIE 1624, Perfluorinated copolymer coatings for high-power laser applications, 0000 (29 July 1992); doi: 10.1117/12.60101
Materials and Measurements
Proc. SPIE 1624, Absorption and damage threshold of KCl and KBr at 10.6 um, 0000 (29 July 1992); doi: 10.1117/12.60102
Surfaces and Mirrors
Proc. SPIE 1624, Fabrication of optical surfaces with low subsurface damage using a float polishing process, 0000 (29 July 1992); doi: 10.1117/12.60103
Materials and Measurements
Proc. SPIE 1624, Laser-induced damage studies on step-index multimode fibers, 0000 (29 July 1992); doi: 10.1117/12.60104
Thin Films
Proc. SPIE 1624, Microstructural control of thin film thermal conductivity, 0000 (29 July 1992); doi: 10.1117/12.60105
Materials and Measurements
Proc. SPIE 1624, Near-angle transmission scattering in excimer laser components, 0000 (29 July 1992); doi: 10.1117/12.60106
Proc. SPIE 1624, Damage test capabilities using a high-repetition-rate visible laser at LLNL, 0000 (29 July 1992); doi: 10.1117/12.60107
Fundamental Mechanisms
Proc. SPIE 1624, Limits of survivability and damage for optical components used in a high-repetition-rate visible laser, 0000 (29 July 1992); doi: 10.1117/12.60108
Proc. SPIE 1624, Energy dissipation during laser breakdown in solids, 0000 (29 July 1992); doi: 10.1117/12.60109
Thin Films
Proc. SPIE 1624, Mapping of absorption in optical coatings, 0000 (29 July 1992); doi: 10.1117/12.60110
Proc. SPIE 1624, Observation and control of thin-film defects using in-situ total-internal-reflection microscopy, 0000 (29 July 1992); doi: 10.1117/12.60111
Proc. SPIE 1624, Absorption and damage threshold measurements of optical coatings, 0000 (29 July 1992); doi: 10.1117/12.60112
Materials and Measurements
Proc. SPIE 1624, Thermal diffusivity of thin films and surfaces investigated by transient thermal gratings, 0000 (29 July 1992); doi: 10.1117/12.60113
Thin Films
Proc. SPIE 1624, In-situ investigation of laser conditioning of optical coatings, 0000 (29 July 1992); doi: 10.1117/12.60114
Proc. SPIE 1624, Thermal transport studies of diamond thin films, 0000 (29 July 1992); doi: 10.1117/12.60115
Proc. SPIE 1624, Defect characterization for thin films through thermal wave detection, 0000 (29 July 1992); doi: 10.1117/12.60116
Proc. SPIE 1624, Photothermal measurement of thermal conductivity of optical coatings, 0000 (29 July 1992); doi: 10.1117/12.60117
Proc. SPIE 1624, Damage frequency measurements and optical properties of NIR coatings produced by ion-assisted deposition, 0000 (29 July 1992); doi: 10.1117/12.60118
Fundamental Mechanisms
Proc. SPIE 1624, Diamond windows for high-power lasers: an initial assessment, 0000 (29 July 1992); doi: 10.1117/12.60119
Thin Films
Proc. SPIE 1624, Optical properties and damage thresholds of dielectric UV/VUV coatings deposited by conventional evaporation, IAD, and IBS, 0000 (29 July 1992); doi: 10.1117/12.60120
Fundamental Mechanisms
Proc. SPIE 1624, Examination of laser conditioning using atomic-force microscopy, 0000 (29 July 1992); doi: 10.1117/12.60121
Surfaces and Mirrors
Proc. SPIE 1624, Super-lightweight mirror for laser fusion produced by porous fused silica, 0000 (29 July 1992); doi: 10.1117/12.60122
Proc. SPIE 1624, Laser damage of optically polished KDP crystal, 0000 (29 July 1992); doi: 10.1117/12.60123
Thin Films
Proc. SPIE 1624, Low-pressure reactive dc-magnetron sputter deposition of metal-oxide thin films, 0000 (29 July 1992); doi: 10.1117/12.60124
Materials and Measurements
Proc. SPIE 1624, Diffusion-bonded composites of YAG single crystals, 0000 (29 July 1992); doi: 10.1117/12.60125
Fundamental Mechanisms
Proc. SPIE 1624, Optical damage mechanisms in hafnia and silica thin films, 0000 (29 July 1992); doi: 10.1117/12.60126
Proc. SPIE 1624, Photon absorption and the decay of surface excitation on sapphire (1120)-(3x1), 0000 (29 July 1992); doi: 10.1117/12.60127
Materials and Measurements
Proc. SPIE 1624, Four-harmonic database of laser-damage testing, 0000 (29 July 1992); doi: 10.1117/12.60128
Thin Films
Proc. SPIE 1624, In-situ atomic-force microscopy of laser-conditioned and laser-damaged HfO2/SiO2 dielectric mirror coatings, 0000 (29 July 1992); doi: 10.1117/12.60129
Surfaces and Mirrors
Proc. SPIE 1624, Processes for the elimination of fogging on KDP crystals prior to and during use in laser systems, 0000 (29 July 1992); doi: 10.1117/12.60130
Materials and Measurements
Proc. SPIE 1624, Nonlinear refraction in UV transmitting materials, 0000 (29 July 1992); doi: 10.1117/12.60131
Thin Films
Proc. SPIE 1624, Light scattering of highest damage resistant fluoride HR coating for KrF laser, 0000 (29 July 1992); doi: 10.1117/12.60132
Fundamental Mechanisms
Proc. SPIE 1624, Influence of the laser pulse length and shape on the damage threshold of UV optics, 0000 (29 July 1992); doi: 10.1117/12.60133
Special Presentation
Proc. SPIE 1624, NASA's needs for damage-resistant optics, 0000 (29 July 1992); doi: 10.1117/12.60134
Thin Films
Proc. SPIE 1624, Laser damage results on planar high-temperature chemical vapor deposition coatings, 0000 (29 July 1992); doi: 10.1117/12.60135
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