PROCEEDINGS VOLUME 1661
SPIE/IS&T 1992 SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY | 9-14 FEBRUARY 1992
Machine Vision Applications in Character Recognition and Industrial Inspection
SPIE/IS&T 1992 SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY
9-14 February 1992
San Jose, CA, United States
Image Enhancement, Segmentation, and Pre-Recognition Analysis
Proc. SPIE 1661, Characteristics of digitized images of technical articles, 0000 (1 August 1992); doi: 10.1117/12.130269
Proc. SPIE 1661, Using morphology and associative memories to associate salt-and-pepper noise with OCR error rates in document images, 0000 (1 August 1992); doi: 10.1117/12.130270
Proc. SPIE 1661, Contrast enhancement of mail piece images, 0000 (1 August 1992); doi: 10.1117/12.130271
Proc. SPIE 1661, Extraction of text boxes from engineering drawings, 0000 (1 August 1992); doi: 10.1117/12.130272
Proc. SPIE 1661, Document understanding using layout styles of title page images, 0000 (1 August 1992); doi: 10.1117/12.130273
Proc. SPIE 1661, Segmenting handwritten text lines into words using distance algorithms, 0000 (1 August 1992); doi: 10.1117/12.130274
Proc. SPIE 1661, Evaluation system for handwritten characters, 0000 (1 August 1992); doi: 10.1117/12.130275
Proc. SPIE 1661, Recognition of characteristic symbols in engineering drawings, 0000 (1 August 1992); doi: 10.1117/12.130276
Character Recognition I
Proc. SPIE 1661, Estimation of linear stroke parameters using iterative total least squares methods, 0000 (1 August 1992); doi: 10.1117/12.130277
Proc. SPIE 1661, Gray-scale character recognition using boundary features, 0000 (1 August 1992); doi: 10.1117/12.130278
Proc. SPIE 1661, Morphological approach to machine-printed character recognition: a feasibility study, 0000 (1 August 1992); doi: 10.1117/12.130279
Proc. SPIE 1661, Recognition of poorly printed text by direct extraction of features from gray scale, 0000 (1 August 1992); doi: 10.1117/12.130280
Proc. SPIE 1661, Noisy Hangul character recognition with fuzzy tree classifier, 0000 (1 August 1992); doi: 10.1117/12.130281
Proc. SPIE 1661, Regression approach to combination of decisions by multiple character recognition algorithms, 0000 (1 August 1992); doi: 10.1117/12.130282
Proc. SPIE 1661, Use of a priori knowledge for character recognition, 0000 (1 August 1992); doi: 10.1117/12.130283
Character Recognition II
Proc. SPIE 1661, Character recognition: a unified approach, 0000 (1 August 1992); doi: 10.1117/12.130284
Proc. SPIE 1661, One view of the methodology in handwriting character recognition, 0000 (1 August 1992); doi: 10.1117/12.130285
Proc. SPIE 1661, Training feed-forward neural networks using conjugate gradients, 0000 (1 August 1992); doi: 10.1117/12.130286
Proc. SPIE 1661, Comparison of neural network classifiers for optical character recognition, 0000 (1 August 1992); doi: 10.1117/12.130287
Proc. SPIE 1661, Automated optical recognition of degraded handwritten characters, 0000 (1 August 1992); doi: 10.1117/12.130288
Proc. SPIE 1661, Syntactic neural network for character recognition, 0000 (1 August 1992); doi: 10.1117/12.130289
Proc. SPIE 1661, Offline recognition of handwritten cursive words, 0000 (1 August 1992); doi: 10.1117/12.130290
Contextual Analysis, Control Structures, and Parallel Processing
Proc. SPIE 1661, System for line drawings interpretation, 0000 (1 August 1992); doi: 10.1117/12.130291
Proc. SPIE 1661, Model-based control strategy for document image analysis, 0000 (1 August 1992); doi: 10.1117/12.130292
Proc. SPIE 1661, Contextual analysis of machine-printed addresses, 0000 (1 August 1992); doi: 10.1117/12.130293
Proc. SPIE 1661, Massively parallel implementation of character recognition systems, 0000 (1 August 1992); doi: 10.1117/12.130294
Proc. SPIE 1661, Neural network approach to text processing, 0000 (1 August 1992); doi: 10.1117/12.130295
IC Inspection and Measurement
Proc. SPIE 1661, Recent advances in inspecting integrated circuits for pattern defects, 0000 (1 August 1992); doi: 10.1117/12.130296
Proc. SPIE 1661, Minimization of false defect reporting in a patterned silicon wafer inspection system, 0000 (1 August 1992); doi: 10.1117/12.130297
Proc. SPIE 1661, Wafer examination and critical dimension estimation using scattered light, 0000 (1 August 1992); doi: 10.1117/12.130298
Proc. SPIE 1661, Wafer pattern inspection using a Coherent Optical Processor, 0000 (1 August 1992); doi: 10.1117/12.130299
Proc. SPIE 1661, Efficient Fourier image analysis algorithm for aligned rectangular and trapezoidal wafer structures, 0000 (1 August 1992); doi: 10.1117/12.130300
Ancillary Techniques
Proc. SPIE 1661, Calibration, setup, and performance evaluation in an IC inspection system, 0000 (1 August 1992); doi: 10.1117/12.130301
Proc. SPIE 1661, Three-dimensional inspection of integrated circuits: a depth from focus approach, 0000 (1 August 1992); doi: 10.1117/12.130302
Proc. SPIE 1661, CCD photoresponse calibration and contrast adjustment for reliable material discrimination in the inspection of electronic packages, 0000 (1 August 1992); doi: 10.1117/12.130303
Proc. SPIE 1661, Alignment mark detection using signed-contrast gradient edge maps, 0000 (1 August 1992); doi: 10.1117/12.130304
Packaging
Proc. SPIE 1661, Advanced Via Inspection Tool, 0000 (1 August 1992); doi: 10.1117/12.130305
Proc. SPIE 1661, Automated vision system for inspection of wedge bonds, 0000 (1 August 1992); doi: 10.1117/12.130306
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