PROCEEDINGS VOLUME 1720
INTERNATIONAL SYMPOSIUM ON OPTICAL FABRICATION, TESTING, AND SURFACE EVALUATION | 10-12 JUNE 1992
Intl Symp on Optical Fabrication, Testing, and Surface Evaluation
INTERNATIONAL SYMPOSIUM ON OPTICAL FABRICATION, TESTING, AND SURFACE EVALUATION
10-12 June 1992
Tokyo, Japan
Optical Fabrication and Machining I
Proc. SPIE 1720, Needs for super-smooth surfaces (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132104
Proc. SPIE 1720, Aspheric machining form correction by form-measuring instrument and aspheric programming system, 0000 (20 October 1992); doi: 10.1117/12.132105
Proc. SPIE 1720, Super-smooth surface polishing on aspherical optics, 0000 (20 October 1992); doi: 10.1117/12.132106
Proc. SPIE 1720, Measurement of large-scale and high-precision optics using a noncontact form-measuring probe, 0000 (20 October 1992); doi: 10.1117/12.132107
Optical Fabrication and Machining II
Proc. SPIE 1720, New machining method of a large-size asymmetric aspheric mirror, 0000 (20 October 1992); doi: 10.1117/12.132108
Proc. SPIE 1720, Development of ultraprecise injection molding method for thermoplasticlenses, 0000 (20 October 1992); doi: 10.1117/12.132109
Proc. SPIE 1720, Computer-controlled polishing of aspheric surfaces, 0000 (20 October 1992); doi: 10.1117/12.132110
Proc. SPIE 1720, Present situation and prospect on optical components processing and measuring techniques in China, 0000 (20 October 1992); doi: 10.1117/12.132111
Surface Metrology I
Proc. SPIE 1720, Present and future standard specimens for surface-finish metrology (Summary Only), 0000 (20 October 1992); doi: 10.1117/12.132112
Proc. SPIE 1720, Development of new instrument detecting integrated intensity fluctuations for surface roughness measurements, 0000 (20 October 1992); doi: 10.1117/12.132113
Proc. SPIE 1720, Real-time surface roughness measurement under speckle pattern illumination, 0000 (20 October 1992); doi: 10.1117/12.132114
Proc. SPIE 1720, Noncontact measuring methods of optical surface roughness, 0000 (20 October 1992); doi: 10.1117/12.132115
Proc. SPIE 1720, Aspheric technology for zoom lenses (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132116
Proc. SPIE 1720, Comparison of surface roughness measured with an optical profiler and a scanning probe microscope (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132117
Proc. SPIE 1720, Surface roughness and waviness measurements for optical parts (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132118
Surface Metrology II
Proc. SPIE 1720, Fringe-scanning white-light microscope for surface profile measurement and material identification, 0000 (20 October 1992); doi: 10.1117/12.132119
Proc. SPIE 1720, Phase-shifting common-path interferometers using double-focus lenses for surface profiling, 0000 (20 October 1992); doi: 10.1117/12.132120
Proc. SPIE 1720, Scattering characteristics of dielectric optical multilayers in visible region, 0000 (20 October 1992); doi: 10.1117/12.132121
Proc. SPIE 1720, Multiobjective space datum line available through paralleled plate, 0000 (20 October 1992); doi: 10.1117/12.132122
Proc. SPIE 1720, New type of instrument for the orientation of the optical axis of crystal, 0000 (20 October 1992); doi: 10.1117/12.132123
X-Ray Optics I
Proc. SPIE 1720, X-ray imaging optics in Japan (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132124
Proc. SPIE 1720, Structure and x-ray optical properties of MBE-grown multilayers (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132125
Proc. SPIE 1720, X-ray multilayer mirrors for grazing incidence, 0000 (20 October 1992); doi: 10.1117/12.132126
Proc. SPIE 1720, Fabrication and evaluation of Cr-C multilayer mirrors for soft x rays, 0000 (20 October 1992); doi: 10.1117/12.132127
Proc. SPIE 1720, Design and fabrication of the Schwarzschild objective for soft x-ray microscopes, 0000 (20 October 1992); doi: 10.1117/12.132128
Proc. SPIE 1720, Radiation damage of multilayer mirrors for soft x-ray lasers, 0000 (20 October 1992); doi: 10.1117/12.132129
X-Ray Optics II
Proc. SPIE 1720, X-ray mirrors for SR lithography (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132130
Proc. SPIE 1720, Thickness dependence of the optical constants of thin Pt, Au, and Rh films in the soft x-ray region, 0000 (20 October 1992); doi: 10.1117/12.132131
Proc. SPIE 1720, Two-stage x-ray mirror system for microscopic x-ray photoelectron spectroscopy, 0000 (20 October 1992); doi: 10.1117/12.132132
Proc. SPIE 1720, Fabrication of Wolter type I mirror for soft x-ray, 0000 (20 October 1992); doi: 10.1117/12.132133
Proc. SPIE 1720, Fabrication and testing of grazing incidence mirrors for hard x rays, 0000 (20 October 1992); doi: 10.1117/12.132134
Advanced Optical Technology I
Proc. SPIE 1720, Technological challenges in the Japan National Large Telescope project (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132135
Proc. SPIE 1720, Advances in optical disk lens (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132136
Proc. SPIE 1720, Zone-plate null interferometer for measuring aspherical mirror with large aperture, 0000 (20 October 1992); doi: 10.1117/12.132137
Proc. SPIE 1720, Analysis of zone-plate interference fringe pattern, 0000 (20 October 1992); doi: 10.1117/12.132138
Proc. SPIE 1720, Application of a fringe scanning method to zone-plate interferometry, 0000 (20 October 1992); doi: 10.1117/12.132139
Proc. SPIE 1720, Precision polarimetry of optical components (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132140
Advanced Optical Technology II
Proc. SPIE 1720, Two-dimensional birefringence measurement using the phase-shifting technique, 0000 (20 October 1992); doi: 10.1117/12.132141
Proc. SPIE 1720, Contour mapping of dynamic stress distributions by novel polarization interferometry, 0000 (20 October 1992); doi: 10.1117/12.132142
Proc. SPIE 1720, Measurement of 2D birefringence distribution, 0000 (20 October 1992); doi: 10.1117/12.132143
Proc. SPIE 1720, Adhesive analysis of the thin film on the different optical polishing surface, 0000 (20 October 1992); doi: 10.1117/12.132144
Proc. SPIE 1720, Fabrication and testing of x-ray telescope, 0000 (20 October 1992); doi: 10.1117/12.132145
Proc. SPIE 1720, Soft x-ray polarization measurement with a laboratory reflectometer, 0000 (20 October 1992); doi: 10.1117/12.132146
Proc. SPIE 1720, Design, fabrication, and polarization of soft x-ray transmission multilayers, 0000 (20 October 1992); doi: 10.1117/12.132147
Proc. SPIE 1720, Fringe contrast improvement in Twyman-Green interferometer for lens test, 0000 (20 October 1992); doi: 10.1117/12.132148
Proc. SPIE 1720, Heterodyne common-path interferometer for testing surface roughness, 0000 (20 October 1992); doi: 10.1117/12.132149
Advanced Interferometry I
Proc. SPIE 1720, Error sources in phase-measuring interferometry (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132150
Proc. SPIE 1720, Measurement of phase change of light on reflection, 0000 (20 October 1992); doi: 10.1117/12.132151
Proc. SPIE 1720, Measurement of large plane surface shape with interferometric aperture synthesis, 0000 (20 October 1992); doi: 10.1117/12.132152
Proc. SPIE 1720, Measurement of radius of concave mirror by zone-plate interferometer, 0000 (20 October 1992); doi: 10.1117/12.132153
Proc. SPIE 1720, Advanced interferometry at Carl Zeiss (Summary Only), 0000 (20 October 1992); doi: 10.1117/12.132154
Advanced Interferometry II
Proc. SPIE 1720, Two-wavelength laser-diode interferometry with electronic calibration techniques, 0000 (20 October 1992); doi: 10.1117/12.132155
Proc. SPIE 1720, Oblique incidence interferometry for gear-tooth surface profiling, 0000 (20 October 1992); doi: 10.1117/12.132156
Proc. SPIE 1720, Talbot projected 3D profilometry by means of one-step phase-shift algorithms, 0000 (20 October 1992); doi: 10.1117/12.132157
Proc. SPIE 1720, Surface condition measurement using optical heterodyne method, 0000 (20 October 1992); doi: 10.1117/12.132158
Proc. SPIE 1720, Two holographic methods for flatness testing with subwavelength or multiple-wavelength sensitivity, 0000 (20 October 1992); doi: 10.1117/12.132159
Advanced Optical Technology III
Proc. SPIE 1720, Approach to high-accuracy qualification of long-radius spherical surfaces (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132160
Proc. SPIE 1720, Fabrication of lenslet grating with multilevel phases, 0000 (20 October 1992); doi: 10.1117/12.132161
Proc. SPIE 1720, General principles behind JCII's testing of optical instruments (Invited Paper), 0000 (20 October 1992); doi: 10.1117/12.132162