PROCEEDINGS VOLUME 1723
LAMILADIS '91: INTERNATIONAL WORKSHOP: LASER MICROTECHNOLOGY AND LASER DIAGNOSTICS OF SURFACES | 16-19 APRIL 1991
LAMILADIS '91 Intl Workshop: Laser Microtechnology and Laser Diagnostics of Surfaces
IN THIS VOLUME

0 Sessions, 32 Papers, 0 Presentations
LAMILADIS '91: INTERNATIONAL WORKSHOP: LASER MICROTECHNOLOGY AND LASER DIAGNOSTICS OF SURFACES
16-19 April 1991
Chernivsti, Ukraine
Laser-Induced Processes on Metal, Semiconductor, and Dielectric Surfaces
Proc. SPIE 1723, Strain-induced collapse of the vacancy field and threshold voids formation in solids, 0000 (1 April 1992); doi: 10.1117/12.58626
Proc. SPIE 1723, Control of spectrum of laser-induced periodical relief on GaAs surface in photochemical etching, 0000 (1 April 1992); doi: 10.1117/12.58627
Proc. SPIE 1723, Titanium nitride: titanium silicide structures obtained by multipulse excimer laser irradiation, 0000 (1 April 1992); doi: 10.1117/12.58628
Proc. SPIE 1723, Dynamics of silicon etching in chlorine-containing gases induced by pulsed excimer laser radiation, 0000 (1 April 1992); doi: 10.1117/12.58629
Proc. SPIE 1723, Effect of bulk doping on the etching rate of silicon by halogen atoms, 0000 (1 April 1992); doi: 10.1117/12.58630
Proc. SPIE 1723, Laser-induced surface modification: regular and chaotic structures on metals and polymers, 0000 (1 April 1992); doi: 10.1117/12.58631
Proc. SPIE 1723, Action of powerful laser radiation on 1-2-3 superconducting thin films and bulk materials, 0000 (1 April 1992); doi: 10.1117/12.58632
Proc. SPIE 1723, Use of lasers in microtechnology of high-temperature superconducting thin films, 0000 (1 April 1992); doi: 10.1117/12.58633
Proc. SPIE 1723, UV-laser-induced formation of color centers in oxygen deficient silica glasses, 0000 (1 April 1992); doi: 10.1117/12.58634
Proc. SPIE 1723, Local laser-induced deposition of thin films, 0000 (1 April 1992); doi: 10.1117/12.58635
Proc. SPIE 1723, Laser cleaning of optical surfaces of laser components, 0000 (1 April 1992); doi: 10.1117/12.58636
Proc. SPIE 1723, Structural and phase transitions in technically pure iron under influence of laser radiation, 0000 (1 April 1992); doi: 10.1117/12.58637
Proc. SPIE 1723, Commercial excimer laser for scientific researches and microtechnologies, 0000 (1 April 1992); doi: 10.1117/12.58638
Laser Diagnostics of Surfaces
Proc. SPIE 1723, Optical studies of the nature of the GaAs (100) surface during MOVPE growth of GaAs, 0000 (1 April 1992); doi: 10.1117/12.58639
Proc. SPIE 1723, Femtosecond laser diagnostics of ultrafast laser-induced melting of the GaAs surface, 0000 (1 April 1992); doi: 10.1117/12.58640
Proc. SPIE 1723, Dynamics of nonlinear absorption of femtosecond laser pulses in GaP, 0000 (1 April 1992); doi: 10.1117/12.58641
Proc. SPIE 1723, Effect of crystal disordering on the nonlinear susceptibilities of metals and semiconductors, 0000 (1 April 1992); doi: 10.1117/12.58642
Proc. SPIE 1723, Nonlinear optical diagnostics of the properties of IV-VI semiconductor epitaxial structures, 0000 (1 April 1992); doi: 10.1117/12.58643
Proc. SPIE 1723, Nonlinear optical diagnostics of a crystalline film in molecular-beam-epitaxy devices, 0000 (1 April 1992); doi: 10.1117/12.58644
Proc. SPIE 1723, Optical correlation diagnostics of rough surfaces, 0000 (1 April 1992); doi: 10.1117/12.58645
Proc. SPIE 1723, Focused laser beam scattering on moving nonsmooth surfaces with one-dimensional profile, 0000 (1 April 1992); doi: 10.1117/12.58646
Proc. SPIE 1723, Interferential methods of speckle optics in laser diagnostics of surface, 0000 (1 April 1992); doi: 10.1117/12.58647
Proc. SPIE 1723, Optical diagnostics of surface layers containing oriented particles, 0000 (1 April 1992); doi: 10.1117/12.58648
Proc. SPIE 1723, Method of thin film thickness and constants measurement by surface plasmons excitation, 0000 (1 April 1992); doi: 10.1117/12.58649
Proc. SPIE 1723, Scanning microscopy using optical fibers, 0000 (1 April 1992); doi: 10.1117/12.58650
Proc. SPIE 1723, Optical phase relief reconstruction by using differential phase optical microscope, 0000 (1 April 1992); doi: 10.1117/12.58651
Proc. SPIE 1723, Laser interferential profilometer, 0000 (1 April 1992); doi: 10.1117/12.58652
Proc. SPIE 1723, Muller matrix for laser light reflected from surface with small periodic profile, 0000 (1 April 1992); doi: 10.1117/12.58653
Proc. SPIE 1723, Investigation of the possibility of noncontact obtaining mode-selection elements of gas laser cavity, 0000 (1 April 1992); doi: 10.1117/12.58654
Proc. SPIE 1723, Far-infrared SEW spectroscopy of semiconductors and dielectrics, 0000 (1 April 1992); doi: 10.1117/12.58655
Proc. SPIE 1723, Reconstruction of phase and amplitude components of diffraction field resulting from light scattering by an object using hologram without reference beam, 0000 (1 April 1992); doi: 10.1117/12.58656
Laser-Induced Processes on Metal, Semiconductor, and Dielectric Surfaces
Proc. SPIE 1723, Direct laser doping of various materials, 0000 (1 April 1992); doi: 10.1117/12.58657
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