PROCEEDINGS VOLUME 1781
OPTICAL SYSTEMS DESIGN '92 | 1-30 SEPTEMBER 1992
Specification and Measurement of Optical Systems
IN THIS VOLUME

0 Sessions, 39 Papers, 0 Presentations
OPTICAL SYSTEMS DESIGN '92
1-30 September 1992
Berlin, Germany
Plenary Session
Proc. SPIE 1781, Optics in hostile environments, 0000 (1 January 1993); doi: 10.1117/12.140965
Proc. SPIE 1781, ISO standards: a means for quality assurance for optical elements and systems, 0000 (1 January 1993); doi: 10.1117/12.140976
Proc. SPIE 1781, Characterization of partially coherent beams, 0000 (1 January 1993); doi: 10.1117/12.140993
Surface Measurement
Proc. SPIE 1781, Specification of the surface figure and finish of optical elements in terms of system performance, 0000 (1 January 1993); doi: 10.1117/12.140999
Proc. SPIE 1781, Sphericity and twist as functional parameters to represent surface geometries, 0000 (1 January 1993); doi: 10.1117/12.141000
Proc. SPIE 1781, Roughness and defect characterization of optical surfaces by light-scattering measurements, 0000 (1 January 1993); doi: 10.1117/12.141001
Proc. SPIE 1781, Discrimination of surface properties using BRDF-variance estimators as feature variables, 0000 (1 January 1993); doi: 10.1117/12.141002
Proc. SPIE 1781, All-fiber compact near-field scanning optical microscope, 0000 (1 January 1993); doi: 10.1117/12.141003
Proc. SPIE 1781, Measure of surface and bulk defects in any transmitting or reflecting optical component, 0000 (1 January 1993); doi: 10.1117/12.140966
Proc. SPIE 1781, Speckle-based interferometric technique for surface-finish measurements, 0000 (1 January 1993); doi: 10.1117/12.140967
Proc. SPIE 1781, Micro phase-shifting interferometer for surface measurement, 0000 (1 January 1993); doi: 10.1117/12.140968
Wavefront Measurement
Proc. SPIE 1781, Phase detection deflectometry: an industrial solution for three-dimensional form measurement of aspheric and spheric surfaces, 0000 (1 January 1993); doi: 10.1117/12.140969
Surface Measurement
Proc. SPIE 1781, Photothermal measurement of temperature-dependent absorbance of infrared components, 0000 (1 January 1993); doi: 10.1117/12.140970
Proc. SPIE 1781, Thin-film characterization and photothermal absolute calibration measurements using high-frequency electric currents, 0000 (1 January 1993); doi: 10.1117/12.140971
Wavefront Measurement
Proc. SPIE 1781, Testing aspherics without rotational symmetry using a Fizeau interferometer with computer-generated holograms, 0000 (1 January 1993); doi: 10.1117/12.140972
Proc. SPIE 1781, Wavefront sensor optimization in astronomical applications, 0000 (1 January 1993); doi: 10.1117/12.140973
Proc. SPIE 1781, Testing aspherical surfaces using multiple annular interferograms, 0000 (1 January 1993); doi: 10.1117/12.140974
Proc. SPIE 1781, Interferometric testing of annular apertures, 0000 (1 January 1993); doi: 10.1117/12.140975
Proc. SPIE 1781, New approach for quantitative interferogram analysis, 0000 (1 January 1993); doi: 10.1117/12.140977
Proc. SPIE 1781, Interferometric methods for the measurement of wavefront aberrations, 0000 (1 January 1993); doi: 10.1117/12.140978
Proc. SPIE 1781, Absolute interferometric surface testing: a stringent need, 0000 (1 January 1993); doi: 10.1117/12.140979
Proc. SPIE 1781, Fabrication and optical characteristics of microlens arrays engraved in photoresist coatings, 0000 (1 January 1993); doi: 10.1117/12.140980
Proc. SPIE 1781, Wavefront sensors and beam-control systems, 0000 (1 January 1993); doi: 10.1117/12.140981
Proc. SPIE 1781, Software design for a compact interferometer, 0000 (1 January 1993); doi: 10.1117/12.140982
Image Quality and Standards
Proc. SPIE 1781, Improvements in OTF measurement technique, 0000 (1 January 1993); doi: 10.1117/12.140983
Proc. SPIE 1781, Evaluation of point spread functions of microscope objectives using moments by modified definitions, 0000 (1 January 1993); doi: 10.1117/12.140984
Proc. SPIE 1781, Optical performance and specification for ground-based telescopes, 0000 (1 January 1993); doi: 10.1117/12.140985
Proc. SPIE 1781, International standardization of measurement methods for x-ray image intensifier tubes, 0000 (1 January 1993); doi: 10.1117/12.140986
Proc. SPIE 1781, Measurement of the MTF of staring-array imaging systems, 0000 (1 January 1993); doi: 10.1117/12.140987
Proc. SPIE 1781, Damage threshold determination according to ISO-DIS 11254: first results, 0000 (1 January 1993); doi: 10.1117/12.140988
Surface Measurement
Proc. SPIE 1781, Characterization and measurement of localized surface quality, 0000 (1 January 1993); doi: 10.1117/12.140989
Image Quality and Standards
Proc. SPIE 1781, Measurement equipment for CAQ-based final control of optical systems, 0000 (1 January 1993); doi: 10.1117/12.140990
Proc. SPIE 1781, Application of the PST-function to radiometric thermometers, 0000 (1 January 1993); doi: 10.1117/12.140991
Proc. SPIE 1781, Target coding to improve the performance of optical measurement systems, 0000 (1 January 1993); doi: 10.1117/12.140992
Plenary Session
Proc. SPIE 1781, Geometrical and physical theory of image formation: a synthesis, 0000 (1 January 1993); doi: 10.1117/12.140994
Proc. SPIE 1781, Global optimization for lens design: an emerging technology, 0000 (1 January 1993); doi: 10.1117/12.140995
Proc. SPIE 1781, Generation of lens designs for optimization, 0000 (1 January 1993); doi: 10.1117/12.140996
Proc. SPIE 1781, Design of optical interference coatings 1992, 0000 (1 January 1993); doi: 10.1117/12.140997
Proc. SPIE 1781, Thin films for magneto-optical recording, 0000 (1 January 1993); doi: 10.1117/12.140998
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