OPTICAL SYSTEMS DESIGN '92
1-30 September 1992
Berlin, Germany
Plenary Papers
Proc. SPIE 1782, Design of optical interference coatings 1992, 0000 (4 March 1993); doi: 10.1117/12.141004
Proc. SPIE 1782, Optical losses in dielectric multilayer coatings and their influence on characteristics of laser resonators, 0000 (4 March 1993); doi: 10.1117/12.141014
Proc. SPIE 1782, High-power optical coatings for a megajoule-class ICF laser, 0000 (4 March 1993); doi: 10.1117/12.141024
Proc. SPIE 1782, Thin films for magneto-optical recording, 0000 (4 March 1993); doi: 10.1117/12.141034
Theory and Design of Optical Thin Films
Proc. SPIE 1782, Induced resonance absorption (INDAB) in thin films: a current example for versatile and efficient use of optical coatings in semi-optical processes, 0000 (4 March 1993); doi: 10.1117/12.141045
Proc. SPIE 1782, New viewpoint on the synthesis of thin films using Fourier transforms, 0000 (4 March 1993); doi: 10.1117/12.141052
Proc. SPIE 1782, Optical coatings for improving laser beam quality, 0000 (4 March 1993); doi: 10.1117/12.141057
Proc. SPIE 1782, Thin-film coatings design using second-order optimization methods, 0000 (4 March 1993); doi: 10.1117/12.141058
Practical Problems and Solutions in Coating Manufacture
Proc. SPIE 1782, Rugate filters obtained by a mechanical modulation technique, 0000 (4 March 1993); doi: 10.1117/12.141059
Theory and Design of Optical Thin Films
Proc. SPIE 1782, Principles of thin-film system design, 0000 (4 March 1993); doi: 10.1117/12.141005
Practical Problems and Solutions in Coating Manufacture
Proc. SPIE 1782, Optical coatings for remote sensing on FY-1 meteorological satellite and airborne remote sensing instrumentations, 0000 (4 March 1993); doi: 10.1117/12.141006
Proc. SPIE 1782, Planetary system for high-uniformity deposited layers on large substrates, 0000 (4 March 1993); doi: 10.1117/12.141007
Thin Films for Electro-Optical and Infrared Applications
Proc. SPIE 1782, Optical properties, bistability, and nonlinearity of evaporated ternary II-VI semiconductor thin films, 0000 (4 March 1993); doi: 10.1117/12.141008
Proc. SPIE 1782, New approach to variable-angle spectroscopic ellipsometry in anisotropic uniaxial films: application to oriented polymers for nonlinear optics, 0000 (4 March 1993); doi: 10.1117/12.141009
Proc. SPIE 1782, Optical performance of amorphous carbon layers: nonuniformity of transmittance, reflectance, and scattering, 0000 (4 March 1993); doi: 10.1117/12.141010
Proc. SPIE 1782, Antireflection coating on GaAs for the range 8-12 um, 0000 (4 March 1993); doi: 10.1117/12.141011
Proc. SPIE 1782, Low absorption measurements of optical thin films at 10.6 microns, 0000 (4 March 1993); doi: 10.1117/12.141012
Thin-Film Characterization
Proc. SPIE 1782, Guided-wave characterization techniques for the comparison of properties of different optical coatings, 0000 (4 March 1993); doi: 10.1117/12.141013
Proc. SPIE 1782, Scattering losses of oxide and fluoride coatings for lasers, 0000 (4 March 1993); doi: 10.1117/12.141015
Proc. SPIE 1782, Stable starting materials of tantalum pentaoxide and titanium dioxide, 0000 (4 March 1993); doi: 10.1117/12.141016
Optical Thin Films for Communication Systems
Proc. SPIE 1782, Robust and reliable thin films for optical telecommunications systems: an overview, 0000 (4 March 1993); doi: 10.1117/12.141017
Proc. SPIE 1782, End coating on optical fibers for multiplexers-demultiplexers in optical communications, 0000 (4 March 1993); doi: 10.1117/12.141018
Thin Films for Excimer and High-Power Lasers
Proc. SPIE 1782, Low-loss optical coatings for high-power laser systems, 0000 (4 March 1993); doi: 10.1117/12.141019
Proc. SPIE 1782, Investigation of inhomogeneties and impurities in fluoride coatings for high-power excimer lasers, 0000 (4 March 1993); doi: 10.1117/12.141020
Proc. SPIE 1782, Optical losses of dielectric VUV-mirrors deposited by conventional evaporation, IAD, and IBS, 0000 (4 March 1993); doi: 10.1117/12.141021
Proc. SPIE 1782, Structural influences on the laser damage thresholds of oxide coatings, 0000 (4 March 1993); doi: 10.1117/12.141022
Proc. SPIE 1782, Laser-induced damage in optical coatings, 0000 (4 March 1993); doi: 10.1117/12.141023
Thin Films for Optical Data Storage
Proc. SPIE 1782, Systematic design and angular performance of phase-optimized magneto-optic quadrilayers, 0000 (4 March 1993); doi: 10.1117/12.141025
Proc. SPIE 1782, Ellipsometric analysis of quadrilayer magneto-optic recording media, 0000 (4 March 1993); doi: 10.1117/12.141026
Proc. SPIE 1782, Thermal and laser-induced phase transformation in rf-sputtered GeSb2Te4 thin films, 0000 (4 March 1993); doi: 10.1117/12.141027
Proc. SPIE 1782, Phase-change and magneto-optical recording media for optical data storage, 0000 (4 March 1993); doi: 10.1117/12.141028
Theory and Design of Optical Thin Films
Proc. SPIE 1782, Optimization of color properties of multielement optical lenses, 0000 (4 March 1993); doi: 10.1117/12.141029
Proc. SPIE 1782, Planar integration of optical multilayer and its application to the design of IR multispectral filter arrays, 0000 (4 March 1993); doi: 10.1117/12.141030
Proc. SPIE 1782, Influence of angular-dependent transmission spectra of dichroic layers on color shading, 0000 (4 March 1993); doi: 10.1117/12.141031
Proc. SPIE 1782, Nature-intelligence-oriented program package for thin-film design, 0000 (4 March 1993); doi: 10.1117/12.141032
Proc. SPIE 1782, Modification of spectral characteristics of multilayer dielectric systems, 0000 (4 March 1993); doi: 10.1117/12.141033
Practical Problems and Solutions in Coating Manufacture
Proc. SPIE 1782, Narrowband interference filters for use in UV-B-spectral region, 0000 (4 March 1993); doi: 10.1117/12.141035
Proc. SPIE 1782, Ion-beam sputter deposition techniques for the production of optical coatings of the highest quality, 0000 (4 March 1993); doi: 10.1117/12.141036
Proc. SPIE 1782, Coatings based on alpha-C:H films for laser and soft x-rays technique, 0000 (4 March 1993); doi: 10.1117/12.141037
Thin Films for Excimer and High-Power Lasers
Proc. SPIE 1782, Thermal-optical controllable thin-film device at 10.6 um, 0000 (4 March 1993); doi: 10.1117/12.141038
Theory and Design of Optical Thin Films
Proc. SPIE 1782, Polarizing laser mirrors for normal light incidence, 0000 (4 March 1993); doi: 10.1117/12.141039
Thin-Film Characterization
Proc. SPIE 1782, Amount of information contained in data of ellipsometric measurements, 0000 (4 March 1993); doi: 10.1117/12.141040
Proc. SPIE 1782, Laterally and depth resolved photothermal absorption measurements on ZrO2 and MgF2 single-layer films, 0000 (4 March 1993); doi: 10.1117/12.141041
Proc. SPIE 1782, Dyanamic characteristics in optically inhomogeneous films, 0000 (4 March 1993); doi: 10.1117/12.141042
Thin Films for Excimer and High-Power Lasers
Proc. SPIE 1782, Temperature distribution of single layer, 0000 (4 March 1993); doi: 10.1117/12.141043
Proc. SPIE 1782, Dielectric and metal coatings for excimer laser optics, 0000 (4 March 1993); doi: 10.1117/12.141044
Proc. SPIE 1782, Preparation and properities of high-index oxide films for application to laser optics, 0000 (4 March 1993); doi: 10.1117/12.141046
Theory and Design of Optical Thin Films
Proc. SPIE 1782, Computer drawing of the envelopes of spectra with interference, 0000 (4 March 1993); doi: 10.1117/12.141047
Thin-Film Characterization
Proc. SPIE 1782, Optical thin films deposited by energetic particle processes, 0000 (4 March 1993); doi: 10.1117/12.141048
Proc. SPIE 1782, Microstructure of metal coatings deposited using ion-beam processes, 0000 (4 March 1993); doi: 10.1117/12.141049
Optical-Coating Design Problem and Solutions
Proc. SPIE 1782, Coating design contest: antireflection coating for lenses to be used with normal and infrared photographic film, 0000 (4 March 1993); doi: 10.1117/12.141050
Proc. SPIE 1782, Design of an antireflection coating for glass over the region 400 nm to 900 nm, 0000 (4 March 1993); doi: 10.1117/12.141051
Plenary Papers
Proc. SPIE 1782, ISO standards: a means for quality assurance for optical elements and systems, 0000 (4 March 1993); doi: 10.1117/12.141053
Proc. SPIE 1782, Characterization of partially coherent beams, 0000 (4 March 1993); doi: 10.1117/12.141054
Proc. SPIE 1782, Resolution versus depth of focus in the resolution-enhanced optical system for lithography, 0000 (4 March 1993); doi: 10.1117/12.141055
Proc. SPIE 1782, Principles of adaptive optics, 0000 (4 March 1993); doi: 10.1117/12.141056
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