PROCEEDINGS VOLUME 1821
APPLICATIONS IN OPTICAL SCIENCE AND ENGINEERING | 16-16 NOVEMBER 1992
Industrial Applications of Optical Inspection, Metrology, and Sensing
IN THIS VOLUME

0 Sessions, 48 Papers, 0 Presentations
APPLICATIONS IN OPTICAL SCIENCE AND ENGINEERING
16-16 November 1992
Boston, MA, United States
Nondestructive Testing
Proc. SPIE 1821, Suppression of fringe-modulating in-plane displacement fields in shearing speckle interferometry, 0000 (28 May 1993); doi: 10.1117/12.145534
Proc. SPIE 1821, Determining the optimum image recording conditions in shearography based on spatial frequency considerations, 0000 (28 May 1993); doi: 10.1117/12.145543
Proc. SPIE 1821, ESPI with synchronized pressure stressing, 0000 (28 May 1993); doi: 10.1117/12.145561
Proc. SPIE 1821, Phase-stepping DSPI and its applications, 0000 (28 May 1993); doi: 10.1117/12.145574
Proc. SPIE 1821, Holographic and computational study of coupled vibrations of channel beams, 0000 (28 May 1993); doi: 10.1117/12.145575
Proc. SPIE 1821, Integration of ESPI and structural analysis to determine the impact of structural defects, 0000 (28 May 1993); doi: 10.1117/12.145576
Proc. SPIE 1821, Quantitative evaluation of vibration information, 0000 (28 May 1993); doi: 10.1117/12.145529
Surface Contouring
Proc. SPIE 1821, Laser gage using chirped synthetic wavelength interferometry, 0000 (28 May 1993); doi: 10.1117/12.145530
Proc. SPIE 1821, Characterization of optical parameters for an injection-molded parabola, 0000 (28 May 1993); doi: 10.1117/12.145531
Surface Monitoring
Proc. SPIE 1821, Detection and refractive index identification of submicron particles on surfaces, 0000 (28 May 1993); doi: 10.1117/12.145532
Proc. SPIE 1821, Measuring surface roughness on wood: a comparison of laser-scatter and stylus-tracing approaches, 0000 (28 May 1993); doi: 10.1117/12.145533
Proc. SPIE 1821, Gloss-related surface topography visualized with the scanning electron microscope, 0000 (28 May 1993); doi: 10.1117/12.145535
Proc. SPIE 1821, Improving the quality of fiber-optic-based surface-roughness sensing instrument using robust design methodology, 0000 (28 May 1993); doi: 10.1117/12.145536
Proc. SPIE 1821, High-resolution fast-response profilometer based on active stabilized interferometry, 0000 (28 May 1993); doi: 10.1117/12.145537
Proc. SPIE 1821, Mapping of microstructural surface changes by phase-shifting electronic speckle pattern interferometry, 0000 (28 May 1993); doi: 10.1117/12.145538
Instrumentation
Proc. SPIE 1821, Incorporation of a FADOF to an ESPI system, 0000 (28 May 1993); doi: 10.1117/12.145539
Proc. SPIE 1821, Improved processing technique for dichromated gelatin holograms, 0000 (28 May 1993); doi: 10.1117/12.145540
Proc. SPIE 1821, Electronic speckle pattern interferometry with holo-optical element, 0000 (28 May 1993); doi: 10.1117/12.145541
Proc. SPIE 1821, Automatic air and surface temperature measure by IR thermography with perspective correction, 0000 (28 May 1993); doi: 10.1117/12.145542
Measurement Technologies
Proc. SPIE 1821, Multidetector photopolarimeters for industrial optical sensing and metrology, 0000 (28 May 1993); doi: 10.1117/12.145544
Proc. SPIE 1821, Partial coherence theory of multilayer thin-film optical properties, 0000 (28 May 1993); doi: 10.1117/12.145545
Proc. SPIE 1821, Variable-resolution video moire error map system for inspection of continuously manufactured objects, 0000 (28 May 1993); doi: 10.1117/12.145546
Proc. SPIE 1821, Generation of surface shape from variable-resolution video moire contours, 0000 (28 May 1993); doi: 10.1117/12.145547
Proc. SPIE 1821, Real-time 3D range sensor, 0000 (28 May 1993); doi: 10.1117/12.145548
Proc. SPIE 1821, Strategy for grading natural materials using a two-step classification procedure, 0000 (28 May 1993); doi: 10.1117/12.145549
Measurement Method Analysis
Proc. SPIE 1821, Effect of measurement spot size on the accuracy of laser radar devices in industrial metrology, 0000 (28 May 1993); doi: 10.1117/12.145550
Proc. SPIE 1821, Alignment of image profiles in optical gauging, 0000 (28 May 1993); doi: 10.1117/12.145551
Proc. SPIE 1821, Method for evaluating the performance of range imaging devices, 0000 (28 May 1993); doi: 10.1117/12.145552
Proc. SPIE 1821, Profiling of multichip module interconnects with a hybrid high-speed triangulation range sensor, 0000 (28 May 1993); doi: 10.1117/12.145553
Proc. SPIE 1821, Subnanosecond high-power laser pulses for time-of-flight laser distance meters, 0000 (28 May 1993); doi: 10.1117/12.145554
Proc. SPIE 1821, Fiber laser as the pulse source for a laser rangefinder system, 0000 (28 May 1993); doi: 10.1117/12.145555
Proc. SPIE 1821, Novel fiber optic laser probe for the inspection of internal cylindrical surfaces, 0000 (28 May 1993); doi: 10.1117/12.145556
Measurement Applications
Proc. SPIE 1821, Use of laser triangulation probes in coordinate measuring machines for part tolerance inspection and reverse engineering, 0000 (28 May 1993); doi: 10.1117/12.145557
Proc. SPIE 1821, Detection and location of pipe damage by artificial-neural-net-processed moire error maps, 0000 (28 May 1993); doi: 10.1117/12.145558
Proc. SPIE 1821, Feasibility of moire contouring for flatness checking of steel plates, 0000 (28 May 1993); doi: 10.1117/12.145559
Proc. SPIE 1821, Design of an on-machine gauge for diameter measurements, 0000 (28 May 1993); doi: 10.1117/12.145560
Proc. SPIE 1821, Closed-loop laser beam alignment along active robot arm, 0000 (28 May 1993); doi: 10.1117/12.145562
Proc. SPIE 1821, Active optics for the focus control of material processing CO2-laser machines, 0000 (28 May 1993); doi: 10.1117/12.145563
Proc. SPIE 1821, Sensorized robolaser for material processing, 0000 (28 May 1993); doi: 10.1117/12.145564
Nondestructive Testing
Proc. SPIE 1821, Fourier transform fringe analysis of ESPI fringes from rotating components, 0000 (28 May 1993); doi: 10.1117/12.145565
Measurement Method Analysis
Proc. SPIE 1821, Three-dimensional measurements and surface properties from a projected grid, 0000 (28 May 1993); doi: 10.1117/12.145566
Measurement Applications
Proc. SPIE 1821, Supersmooth surface profile on-line testing, 0000 (28 May 1993); doi: 10.1117/12.145567
Surface Monitoring
Proc. SPIE 1821, Computer modeling of data processing method for optical control of the thin-film structures in lithography, 0000 (28 May 1993); doi: 10.1117/12.145568
Instrumentation
Proc. SPIE 1821, Design review of a unique camera-aided positioning system, 0000 (28 May 1993); doi: 10.1117/12.145569
Nondestructive Testing
Proc. SPIE 1821, Electronic shearography and electronic holography working side by side, 0000 (28 May 1993); doi: 10.1117/12.145570
Proc. SPIE 1821, Investigation of a submillimeter cantilever beam of variable cross section by computational and hologram interferometry methods, 0000 (28 May 1993); doi: 10.1117/12.145571
Surface Monitoring
Proc. SPIE 1821, Virtual image superposing comparator, 0000 (28 May 1993); doi: 10.1117/12.145572
Instrumentation
Proc. SPIE 1821, Aberration-free spectral image formed by a concave aspherical diffraction grating, 0000 (28 May 1993); doi: 10.1117/12.145573
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