PROCEEDINGS VOLUME 1848
OPTICAL MATERIALS FOR HIGH POWER LASERS | 28-30 SEPTEMBER 1992
24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials: 1992
IN THIS VOLUME

0 Sessions, 59 Papers, 0 Presentations
Thin Films  (20)
OPTICAL MATERIALS FOR HIGH POWER LASERS
28-30 September 1992
Boulder, CO, United States
Materials and Measurements
Proc. SPIE 1848, New challenges in optical materials development, 0000 (24 June 1993); doi: 10.1117/12.147388
Proc. SPIE 1848, Gray-track damage in KTiOPO4 crystals, 0000 (24 June 1993); doi: 10.1117/12.147398
Proc. SPIE 1848, Laser damage threshold measurements in Q-switch materials, 0000 (24 June 1993); doi: 10.1117/12.147776
Proc. SPIE 1848, Laser damage to production- and research-grade KDP crystals, 0000 (24 June 1993); doi: 10.1117/12.147418
Proc. SPIE 1848, Transient laser-induced surface deformation of silicon in relation to damage, 0000 (24 June 1993); doi: 10.1117/12.147429
Proc. SPIE 1848, Investigation of the accuracy and precision of the damage-frequency method of measuring laser damage threshold, 0000 (24 June 1993); doi: 10.1117/12.147440
Proc. SPIE 1848, Normal incidence complex-index refractometry, 0000 (24 June 1993); doi: 10.1117/12.147444
Surfaces and Mirrors
Proc. SPIE 1848, Test facility for long-focal-length mirrors, 0000 (24 June 1993); doi: 10.1117/12.147445
Proc. SPIE 1848, Thermal behavior of optical mirrors under high-power continuous wave CO2 laser irradiation, 0000 (24 June 1993); doi: 10.1117/12.147389
Proc. SPIE 1848, Damage thresholds of AR coating on subsurface-damage-removed fused silica glass, 0000 (24 June 1993); doi: 10.1117/12.147390
Mini-Symposium on Damage Issues for Lithographic Optics
Proc. SPIE 1848, Optical degradation issues for XUV projection lithography systems, 0000 (24 June 1993); doi: 10.1117/12.147391
Proc. SPIE 1848, Laser plasma sources for soft x-ray projection lithography, 0000 (24 June 1993); doi: 10.1117/12.147392
Proc. SPIE 1848, XUV projection lithography: is optical surface contamination an important limitation?, 0000 (24 June 1993); doi: 10.1117/12.147393
Proc. SPIE 1848, Care and feeding of soft x-ray and extreme ultraviolet filters, 0000 (24 June 1993); doi: 10.1117/12.147394
Proc. SPIE 1848, Control of debris production of laser plasma sources with high-average XUV power, 0000 (24 June 1993); doi: 10.1117/12.147395
Proc. SPIE 1848, Use of Raman spectroscopy in characterizing soft x-ray multilayers: tools in understanding structure and interfaces, 0000 (24 June 1993); doi: 10.1117/12.147396
Proc. SPIE 1848, Excimer-laser induced degradation in bulk-fused silica, 0000 (24 June 1993); doi: 10.1117/12.147397
Thin Films
Proc. SPIE 1848, Laser damage in electron-beam-patterned surface resonant structures, 0000 (24 June 1993); doi: 10.1117/12.147399
Proc. SPIE 1848, Damage threshold study of ion-beam-sputtered coatings for a visible high-repetition laser at LLNL, 0000 (24 June 1993); doi: 10.1117/12.147400
Proc. SPIE 1848, Photodisplacement studies of the incubation behavior of oxide coatings on fused silica at 248 nm, 0000 (24 June 1993); doi: 10.1117/12.147401
Proc. SPIE 1848, Correlation of damage threshold and surface geometry of nodular defects on HR coatings as determined by in-situ atomic force microscopy, 0000 (24 June 1993); doi: 10.1117/12.147402
Proc. SPIE 1848, Atomic force microscopy of laser-conditioned and laser-damaged amorphous TiO2 sol-gel thin films, 0000 (24 June 1993); doi: 10.1117/12.147403
By Title Only
Proc. SPIE 1848, Effect of laser irradiation conditions on the optical damage resistance of dielectric coatings, 0000 (24 June 1993); doi: 10.1117/12.147404
Thin Films
Proc. SPIE 1848, Effect of binders on the damage threshold and refractive index of coatings prepared from colloidal suspensions, 0000 (24 June 1993); doi: 10.1117/12.147405
Proc. SPIE 1848, New room-temperature deposition technique for optical coatings, 0000 (24 June 1993); doi: 10.1117/12.147406
Proc. SPIE 1848, Surface morphology, phase characterization, and stability of solution-deposited zirconia films, 0000 (24 June 1993); doi: 10.1117/12.147407
Proc. SPIE 1848, Effect of hydrogen concentration in conventional and IAD coatings on the absorption and laser-induced damage at 10.6 um, 0000 (24 June 1993); doi: 10.1117/12.147408
Proc. SPIE 1848, Absorption and damage thresholds of low-defect-density hafnia deposited with activated oxygen, 0000 (24 June 1993); doi: 10.1117/12.147409
Proc. SPIE 1848, Thermal transport studies of nanometric layer stacks by mirage detection, 0000 (24 June 1993); doi: 10.1117/12.147410
Fundamental Mechanisms
Proc. SPIE 1848, GOI's investigations of the interaction of high-power radiation with matter, 0000 (24 June 1993); doi: 10.1117/12.147411
Proc. SPIE 1848, Pulse-width dependence of laser damage in optical materials: critical analysis of available data and recent results for nanopicosecond region, 0000 (24 June 1993); doi: 10.1117/12.147412
Proc. SPIE 1848, Theory and modeling of laser-induced free-electron heating in wide-gap solids, 0000 (24 June 1993); doi: 10.1117/12.147413
Proc. SPIE 1848, Modeling of electric-field enhancement at nodular defects in dielectric mirror coatings, 0000 (24 June 1993); doi: 10.1117/12.147414
Materials and Measurements
Proc. SPIE 1848, Research at the SUMMA International Research Institute radiation test facility, 0000 (24 June 1993); doi: 10.1117/12.147415
Proc. SPIE 1848, International standard test method for laser-induced damage threshold of optical surfaces, 0000 (24 June 1993); doi: 10.1117/12.147416
Thin Films
Proc. SPIE 1848, Laser damage of HR, AR-coatings, monolayers, and bare surfaces at 1064 nm, 0000 (24 June 1993); doi: 10.1117/12.147417
Surfaces and Mirrors
Proc. SPIE 1848, Unoccupied surface states on GaP(111) surfaces, 0000 (24 June 1993); doi: 10.1117/12.147419
Fundamental Mechanisms
Proc. SPIE 1848, Nonequilibrium behavior and defect diffusion in laser heating of semiconductors, 0000 (24 June 1993); doi: 10.1117/12.147420
Mini-Symposium on Damage Issues for Lithographic Optics
Proc. SPIE 1848, Effects of KrF laser radiation on fused-silica glass: a comparison of samples exposed in air vs vacuum, 0000 (24 June 1993); doi: 10.1117/12.147421
Proc. SPIE 1848, 248-nm lens materials: performance and durability issues in an industrial environment, 0000 (24 June 1993); doi: 10.1117/12.147422
Materials and Measurements
Proc. SPIE 1848, Laser-induced damage in step-index multimode fibers, 0000 (24 June 1993); doi: 10.1117/12.147423
Fundamental Mechanisms
Proc. SPIE 1848, Intrinsic optical breakdown of glasses, 0000 (24 June 1993); doi: 10.1117/12.147424
Thin Films
Proc. SPIE 1848, Damage thresholds of fluoride multilayers at 355 nm, 0000 (24 June 1993); doi: 10.1117/12.147425
Proc. SPIE 1848, Developments in ion-assisted multilayer coatings, 0000 (24 June 1993); doi: 10.1117/12.147426
Proc. SPIE 1848, Relaxation of dielectric thin films under Ar+ laser irradiation, 0000 (24 June 1993); doi: 10.1117/12.147427
Proc. SPIE 1848, Photothermal comparison of reactive low-voltage ion-plated and electron-beam-deposited TiO2 thin films, 0000 (24 June 1993); doi: 10.1117/12.147428
Surfaces and Mirrors
Proc. SPIE 1848, Damage to copper mirrors by high-power CO2 laser radiation, 0000 (24 June 1993); doi: 10.1117/12.147430
Thin Films
Proc. SPIE 1848, Laser damage studies of silicon oxy-nitride narrowband reflectors, 0000 (24 June 1993); doi: 10.1117/12.147431
Fundamental Mechanisms
Proc. SPIE 1848, Self-focusing and optical damage in Cr:LiSAF and Cr:LiCAF, 0000 (24 June 1993); doi: 10.1117/12.147432
Proc. SPIE 1848, Defect-induced variations in the local electric fields in inhomogeneous media, 0000 (24 June 1993); doi: 10.1117/12.147433
Materials and Measurements
Proc. SPIE 1848, OPO lasers: high-power reflectors and couplers, 0000 (24 June 1993); doi: 10.1117/12.147434
Thin Films
Proc. SPIE 1848, Antireflective coatings on optical fibers for high-power solid state lasers, 0000 (24 June 1993); doi: 10.1117/12.147435
Proc. SPIE 1848, Damage threshold of fluoride HR coatings at 352 nm, 0000 (24 June 1993); doi: 10.1117/12.147436
Proc. SPIE 1848, High-threshold fluoride AR coatings for KDP crystal at 352 nm, 0000 (24 June 1993); doi: 10.1117/12.147437
By Title Only
Proc. SPIE 1848, Repetitively pulsed laser damage in optical thin films, 0000 (24 June 1993); doi: 10.1117/12.147438
Proc. SPIE 1848, Investigation of nonlinear absorption and laser damage on lithium niobate single crystals, 0000 (24 June 1993); doi: 10.1117/12.147439
Proc. SPIE 1848, Laser treatment to improve the ability to resist laser damage in potassium dihydrogen phosphate crystals, 0000 (24 June 1993); doi: 10.1117/12.147441
Surfaces and Mirrors
Proc. SPIE 1848, Degradation of vacuum-exposed SiO2 laser windows, 0000 (24 June 1993); doi: 10.1117/12.147442