PROCEEDINGS VOLUME 1855
OE/LASE'93: OPTICS, ELECTRO-OPTICS, AND LASER APPLICATIONS IN SCIENCEAND ENGINEERING | 17-22 JANUARY 1993
Scanning Probe Microscopies II
IN THIS VOLUME

0 Sessions, 24 Papers, 0 Presentations
Solid State  (7)
OE/LASE'93: OPTICS, ELECTRO-OPTICS, AND LASER APPLICATIONS IN SCIENCEAND ENGINEERING
17-22 January 1993
Los Angeles, CA, United States
Molecular/Biomolecular
Proc. SPIE 1855, Adjacent metal-coated/uncoated regions facilitates interpretation of STM images of DNA, 0000 (4 June 1993); doi: 10.1117/12.146362
Proc. SPIE 1855, Chirality of the local supercoiling of individual DNA molecules assigned by atomic force microscopy, 0000 (4 June 1993); doi: 10.1117/12.146374
Proc. SPIE 1855, Tooth structure studied using the atomic force microscope, 0000 (4 June 1993); doi: 10.1117/12.146381
Proc. SPIE 1855, Deformation observed on soft surfaces studied with an AFM, 0000 (4 June 1993); doi: 10.1117/12.146382
Proc. SPIE 1855, Molecular charge mapping with electrostatic force microscope, 0000 (4 June 1993); doi: 10.1117/12.146383
Proc. SPIE 1855, Gap-modulated versus constant current mode as a tool to discriminate between DNA and substrate structure in STM, 0000 (4 June 1993); doi: 10.1117/12.146384
Near-Field Optical Microscopy
Proc. SPIE 1855, Reflection shear force/reflection near-field scanning optical microscopy, 0000 (4 June 1993); doi: 10.1117/12.146363
Proc. SPIE 1855, Imaging modes and contrast in near-field scanning optical microscopy, 0000 (4 June 1993); doi: 10.1117/12.146364
Proc. SPIE 1855, Near-field photodetection optical microscopy (NPOM): a novel probe for optical characterization on a subwavelength spatial scale, 0000 (4 June 1993); doi: 10.1117/12.146365
Proc. SPIE 1855, Tip/sample interactions, contrast, and near-field microscopy of biological and solid-state samples, 0000 (4 June 1993); doi: 10.1117/12.146366
Proc. SPIE 1855, Estimating the effective optical aperture of a typical laser probe in PSTM imaging, 0000 (4 June 1993); doi: 10.1117/12.168953
Solid State
Proc. SPIE 1855, Quantitative analysis of STM images for surface structure determination: sulfur on Re(0001), 0000 (4 June 1993); doi: 10.1117/12.146367
Proc. SPIE 1855, Process and defect-induced surface morphology of relaxed GexSi1-x films, 0000 (4 June 1993); doi: 10.1117/12.146368
Proc. SPIE 1855, Scanning tunneling and force microscopies of low-dimensional organic conductors and superconductors, 0000 (4 June 1993); doi: 10.1117/12.146369
Proc. SPIE 1855, Some problems in scanning probe microscopy of vortices in superconductors, 0000 (4 June 1993); doi: 10.1117/12.146370
Proc. SPIE 1855, High-resolution scanning Hall probe microscopy, 0000 (4 June 1993); doi: 10.1117/12.146371
Proc. SPIE 1855, Properties and structures of a magnetic shielding material, 0000 (4 June 1993); doi: 10.1117/12.146372
Proc. SPIE 1855, Magnetic scanning tunneling microscopy: theory and experiment, 0000 (4 June 1993); doi: 10.1117/12.146373
Novel Techniques/Applications
Proc. SPIE 1855, Development of a scanned near-field optical microscope for magneto-optic Kerr imaging of magnetic domains with 10nm resolution, 0000 (4 June 1993); doi: 10.1117/12.146375
Proc. SPIE 1855, Further magnetic force and force gradient microscopy utilizing an ultrasensitive vertical cantilever geometry, 0000 (4 June 1993); doi: 10.1117/12.146376
Proc. SPIE 1855, Scanning capacitance detection and charge trapping in NOS, 0000 (4 June 1993); doi: 10.1117/12.146377
Proc. SPIE 1855, Stand-alone atomic force microscope featuring large, scan friction measurement, atomic resolution, and capability of liquid operation, 0000 (4 June 1993); doi: 10.1117/12.146378
Molecular/Biomolecular
Proc. SPIE 1855, Scanning force microscopy and STM imaging of B-chitin, 0000 (4 June 1993); doi: 10.1117/12.146379
Novel Techniques/Applications
Proc. SPIE 1855, Thermal imaging of electronic materials and devices using the Atomic Force Microscope, 0000 (4 June 1993); doi: 10.1117/12.146380
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