PROCEEDINGS VOLUME 1907
IS&T/SPIE'S SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY | JAN 31 - FEB 5 1993
Machine Vision Applications in Industrial Inspection
IS&T/SPIE'S SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY
Jan 31 - Feb 5 1993
San Jose, CA, United States
Architectures for Industrial Inspection Systems
Proc. SPIE 1907, Model matching using multiple data sources, 0000 (6 May 1993); doi: 10.1117/12.144800
Proc. SPIE 1907, Modular system for automated surface inspection, 0000 (6 May 1993); doi: 10.1117/12.144807
Proc. SPIE 1907, Standardized, object-oriented, 3D vision input system, 0000 (6 May 1993); doi: 10.1117/12.144819
Industrial Applications
Proc. SPIE 1907, I/O pin solder-point inspection system, 0000 (6 May 1993); doi: 10.1117/12.144820
Proc. SPIE 1907, System integration of road-crack evaluation system, 0000 (6 May 1993); doi: 10.1117/12.144821
Proc. SPIE 1907, Fill-tube bore inspection with machine vision, 0000 (6 May 1993); doi: 10.1117/12.144822
Proc. SPIE 1907, Prototype model for automatic IC bonding inspection, 0000 (6 May 1993); doi: 10.1117/12.144823
Automatic Defect Classification
Proc. SPIE 1907, Automatic defect classification system for semiconductor wafers, 0000 (6 May 1993); doi: 10.1117/12.144824
Algorithms
Proc. SPIE 1907, Specifications for the development of a 3D visual inspection/diagnosis system for damaged VLSI boards: VLSI reverse engineering, 0000 (6 May 1993); doi: 10.1117/12.144801
Automatic Defect Classification
Proc. SPIE 1907, Automatic defect classification for integrated circuits, 0000 (6 May 1993); doi: 10.1117/12.144802
Proc. SPIE 1907, Automated system for classification of defects in web materials, 0000 (6 May 1993); doi: 10.1117/12.144803
Proc. SPIE 1907, Features for automatic surface inspection, 0000 (6 May 1993); doi: 10.1117/12.144804
Algorithms
Proc. SPIE 1907, Automated direct patterned-wafer inspection, 0000 (6 May 1993); doi: 10.1117/12.144805
Proc. SPIE 1907, Adaptive texture filtering for defect inspection in ultrasound images, 0000 (6 May 1993); doi: 10.1117/12.144806
System Components
Proc. SPIE 1907, PC-based real-time defect imaging system for high-speed web inspection, 0000 (6 May 1993); doi: 10.1117/12.144808
Proc. SPIE 1907, Area parameters in machine vision: a sampling of multiple applications, 0000 (6 May 1993); doi: 10.1117/12.144809
Inspection with Unconventional Sensing Techniques
Proc. SPIE 1907, Scanning probe microscopy: trends and image processing issues, 0000 (6 May 1993); doi: 10.1117/12.144810
Proc. SPIE 1907, Distortion and defect identification on curved objects, 0000 (6 May 1993); doi: 10.1117/12.144811
Proc. SPIE 1907, Panning for gold by the moment method, 0000 (6 May 1993); doi: 10.1117/12.144812
Novel Sensing Techniques
Proc. SPIE 1907, Analyzing simulated and measured optical scatter for semiconductor process verification, 0000 (6 May 1993); doi: 10.1117/12.144813
Proc. SPIE 1907, Diffraction image processing algorithms for in-situ monitoring of submicron polysilicon linewidths, 0000 (6 May 1993); doi: 10.1117/12.144814
Proc. SPIE 1907, Registration error measurements with coherent optical processors, 0000 (6 May 1993); doi: 10.1117/12.144815
Automatic Defect Classification
Proc. SPIE 1907, Poultry grading/inspection using color imaging, 0000 (6 May 1993); doi: 10.1117/12.144816
Proc. SPIE 1907, Color analysis of defects for automated visual inspection of pine wood, 0000 (6 May 1993); doi: 10.1117/12.144817
Proc. SPIE 1907, Computerized image quality inspection system, 0000 (6 May 1993); doi: 10.1117/12.144818
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