PROCEEDINGS VOLUME 1972
8TH MEETING IN ISRAEL ON OPTICAL ENGINEERING | 14-16 DECEMBER 1992
8th Meeting on Optical Engineering in Israel: Optoelectronics and Applications in Industry and Medicine
IN THIS VOLUME

0 Sessions, 51 Papers, 0 Presentations
8TH MEETING IN ISRAEL ON OPTICAL ENGINEERING
14-16 December 1992
Tel Aviv, Israel
Optoelectronics
Proc. SPIE 1972, Tm+3 decay in chromium-thulium-holmium-doped yttrium aluminum garnet at liquid helium temperatures, 0000 (13 August 1993); doi: 10.1117/12.151083
Proc. SPIE 1972, Thermally induced window birefringence in high-power copper vapor laser, 0000 (13 August 1993); doi: 10.1117/12.151094
Proc. SPIE 1972, Angular field of view for Brillouin amplification, 0000 (13 August 1993); doi: 10.1117/12.151105
Proc. SPIE 1972, Experimental and theoretical investigation of statistical fluctuations in phase conjugate mirror reflectivity, 0000 (13 August 1993); doi: 10.1117/12.151116
Proc. SPIE 1972, Interference of nonlinear optical signals generated by multimode lasers: analogy to holography by incoherent light, 0000 (13 August 1993); doi: 10.1117/12.151127
Proc. SPIE 1972, Optical nonlinearities of methyl red in various solid matrices, 0000 (13 August 1993); doi: 10.1117/12.151130
Proc. SPIE 1972, Wavelength control in fiber lasers, 0000 (13 August 1993); doi: 10.1117/12.151131
Proc. SPIE 1972, Fiber optic recirculation type measurement devices, 0000 (13 August 1993); doi: 10.1117/12.151132
Proc. SPIE 1972, Acousto-optic modulators for use in long-distance laser beam communication systems, 0000 (13 August 1993); doi: 10.1117/12.151133
Proc. SPIE 1972, Studies towards molecular optoelectronic devices, 0000 (13 August 1993); doi: 10.1117/12.151084
Proc. SPIE 1972, Energy transfer in manganese-doped fluoride glasses, 0000 (13 August 1993); doi: 10.1117/12.151085
Proc. SPIE 1972, Efficiency of cerium-doped yttrium-aluminum garnet as a phosphorescent source, 0000 (13 August 1993); doi: 10.1117/12.151086
Proc. SPIE 1972, Cr4+ doped crystals for laser applications, 0000 (13 August 1993); doi: 10.1117/12.151087
Proc. SPIE 1972, Optical recording in the mid-IR in photochromic polymers, 0000 (13 August 1993); doi: 10.1117/12.151088
Proc. SPIE 1972, Rapid color-based segmentation in digital image processing, 0000 (13 August 1993); doi: 10.1117/12.151089
Proc. SPIE 1972, Four-quadrant optical matrix vector multiplication machine as a neural network processor, 0000 (13 August 1993); doi: 10.1117/12.151090
Proc. SPIE 1972, Binary joint transform correlation using error-diffusion techniques, 0000 (13 August 1993); doi: 10.1117/12.151091
Proc. SPIE 1972, Long-wavelength IR GaAs/GaAlAs detector array, 0000 (13 August 1993); doi: 10.1117/12.151092
Proc. SPIE 1972, On-the-fly message patching in free-space optical interconnects, 0000 (13 August 1993); doi: 10.1117/12.151093
Proc. SPIE 1972, Dependence of IR optical properties of bulk-doped silicon on carrier concentration, 0000 (13 August 1993); doi: 10.1117/12.151095
Proc. SPIE 1972, Large scale optical interconnects based on substrate-mode holographic elements, 0000 (13 August 1993); doi: 10.1117/12.151096
Proc. SPIE 1972, Recording of an achromatic holographic doublet for focusing laser diodes, 0000 (13 August 1993); doi: 10.1117/12.151097
Proc. SPIE 1972, Design of compact Fourier transform lenses using substrate mode holographic elements, 0000 (13 August 1993); doi: 10.1117/12.151098
Microlithography
Proc. SPIE 1972, Dry lithography of chemically-amplified acid-catalyzed deep-UV and E-beam resist, 0000 (13 August 1993); doi: 10.1117/12.151099
Proc. SPIE 1972, Photoresists based on chalcogenide glasses for submicron lithography, 0000 (13 August 1993); doi: 10.1117/12.151100
Proc. SPIE 1972, New methods for generating microlenses by lithographic processes, 0000 (13 August 1993); doi: 10.1117/12.151101
Proc. SPIE 1972, Improved CD control over topography through process and resist modification, 0000 (13 August 1993); doi: 10.1117/12.151102
Thin Films and Coatings
Proc. SPIE 1972, Protective glass coatings for circuits on ceramic substrates, 0000 (13 August 1993); doi: 10.1117/12.151103
Proc. SPIE 1972, Ion-assisted deposition of oxide films, 0000 (13 August 1993); doi: 10.1117/12.151104
Lasers in Industry
Proc. SPIE 1972, Laser surface alloying of steel with TiC, 0000 (13 August 1993); doi: 10.1117/12.151106
Proc. SPIE 1972, Surface treatments with high power lasers, 0000 (13 August 1993); doi: 10.1117/12.151107
Proc. SPIE 1972, Rock processing with CO2 laser radiation, 0000 (13 August 1993); doi: 10.1117/12.151108
Proc. SPIE 1972, Ultracompact RF-excited diffusion-cooled industrial CO2 laser, 0000 (13 August 1993); doi: 10.1117/12.151109
Proc. SPIE 1972, ICCL: a novel industrial compact CO2 laser, 0000 (13 August 1993); doi: 10.1117/12.151110
Industrial Instrumentation
Proc. SPIE 1972, Vibrational amplitude and phase retrieval from pulsed interferograms, 0000 (13 August 1993); doi: 10.1117/12.151111
Proc. SPIE 1972, Acousto-optical bubble sizing, 0000 (13 August 1993); doi: 10.1117/12.151112
Proc. SPIE 1972, Behavior of materials at dynamic stress conditions using laser-induced shock waves, 0000 (13 August 1993); doi: 10.1117/12.151113
Proc. SPIE 1972, New type of light-guide sensor, 0000 (13 August 1993); doi: 10.1117/12.151114
Proc. SPIE 1972, Spectrally encoded fiber optic sensors based on Fabry-Perot interferometer, 0000 (13 August 1993); doi: 10.1117/12.151115
Proc. SPIE 1972, IR fiber optic nonuniform surface temperature and emissivity distribution monitoring, 0000 (13 August 1993); doi: 10.1117/12.151117
Proc. SPIE 1972, Computerized radiophotometer based on CCD camera, 0000 (13 August 1993); doi: 10.1117/12.151118
Proc. SPIE 1972, Faraday-rotation fiber optic current sensor: response to different locations of the conductor, 0000 (13 August 1993); doi: 10.1117/12.151119
Optoelectronics
Proc. SPIE 1972, Using a depolarizer to reduce the effect of phase-induced intensity noise in fiber optics bit rate limiters, 0000 (13 August 1993); doi: 10.1117/12.151120
Optics in Medicine
Proc. SPIE 1972, New stable tunable solid-state dye laser in the red, 0000 (13 August 1993); doi: 10.1117/12.151121
Proc. SPIE 1972, Spatial frequency analysis of trabecular bone radiographs, 0000 (13 August 1993); doi: 10.1117/12.151122
Proc. SPIE 1972, Analysis of the photoplethysmographic signal, 0000 (13 August 1993); doi: 10.1117/12.151123
Proc. SPIE 1972, Measurement of under-skin temperature using infrared radiometry, 0000 (13 August 1993); doi: 10.1117/12.151124
Proc. SPIE 1972, Testing soft contact lenses with a moire deflectometer, 0000 (13 August 1993); doi: 10.1117/12.151125
Proc. SPIE 1972, Laser spectrofluorimetric device for clinical identification of malignancies and their microscopic diagnosis, 0000 (13 August 1993); doi: 10.1117/12.151126
Thin Films and Coatings
Proc. SPIE 1972, Incorporation of empiric values for refractive indices in multilayer design, 0000 (13 August 1993); doi: 10.1117/12.151128
Optoelectronics
Proc. SPIE 1972, Surface-enhanced photoionization effect, 0000 (13 August 1993); doi: 10.1117/12.151129
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