PROCEEDINGS VOLUME 1982
PHOTOELECTRONIC DETECTION AND IMAGING: TECHNOLOGY AND APPLICATIONS '93 | 17-20 MAY 1993
Photoelectronic Detection and Imaging: Technology and Applications '93
PHOTOELECTRONIC DETECTION AND IMAGING: TECHNOLOGY AND APPLICATIONS '93
17-20 May 1993
Beijing, China
Photoelectronic Imaging: Systems and Assessments
Proc. SPIE 1982, Photonics, 0000 (1 April 1993); doi: 10.1117/12.141990
Proc. SPIE 1982, High-speed solid state camera imaging systems at LLNL-NTES, 0000 (1 April 1993); doi: 10.1117/12.142001
Proc. SPIE 1982, Imaging photon-counting detector systems for ground-based and space applications, 0000 (1 April 1993); doi: 10.1117/12.142012
Proc. SPIE 1982, Development and current status of photoelectronic image devices in China, 0000 (1 April 1993); doi: 10.1117/12.142023
Proc. SPIE 1982, Megapixel high-dynamic-range low-energy x-ray imager for synchrotron applications, 0000 (1 April 1993); doi: 10.1117/12.142034
Proc. SPIE 1982, Approach to the image-recording technology of scenes at low light level, 0000 (1 April 1993); doi: 10.1117/12.142045
Proc. SPIE 1982, Superhigh-sensitive x-ray video camera and its applications, 0000 (1 April 1993); doi: 10.1117/12.142056
Proc. SPIE 1982, Ultrafast time-gated imaging techniques, 0000 (1 April 1993); doi: 10.1117/12.142067
Proc. SPIE 1982, Scanning laser microscopy and laser thermal imaging, 0000 (1 April 1993); doi: 10.1117/12.142076
Proc. SPIE 1982, Research on CCD long-range automatic collimating technique, 0000 (1 April 1993); doi: 10.1117/12.141991
Proc. SPIE 1982, ISEC imaging system and its applications, 0000 (1 April 1993); doi: 10.1117/12.141992
Proc. SPIE 1982, Theoretic analysis of photoelectronic-imaging delay, 0000 (1 April 1993); doi: 10.1117/12.141993
Proc. SPIE 1982, Visual range prediction and revision of temperature difference in thermal imaging systems, 0000 (1 April 1993); doi: 10.1117/12.141994
Proc. SPIE 1982, Threshold of detectability of image-intensifier optically-coupled CCD (I<sup>2</sup>-CCD) at low light level, 0000 (1 April 1993); doi: 10.1117/12.141995
Proc. SPIE 1982, Multiple target infrared-/visual-image tracking system, 0000 (1 April 1993); doi: 10.1117/12.141996
Proc. SPIE 1982, High-resolution CCD camera at Yunnan Observatory, 0000 (1 April 1993); doi: 10.1117/12.141997
Proc. SPIE 1982, Test and analysis on variable-integration low-light-level CCD camera signal and noise properties, 0000 (1 April 1993); doi: 10.1117/12.141998
Proc. SPIE 1982, Control methods of CCD imager characteristics for dynamic image detection, 0000 (1 April 1993); doi: 10.1117/12.141999
Photoemitters and Photodetectors
Proc. SPIE 1982, Thin-film high-gain photodetector and switching devices using a-Si:H and a-SiC:H multilayers, 0000 (1 April 1993); doi: 10.1117/12.142000
Proc. SPIE 1982, Photoemissive thin film with strange property for laser pulse detection, 0000 (1 April 1993); doi: 10.1117/12.142002
Proc. SPIE 1982, Field-assisted photoemission from semiconductor heterostructures up to 1.7 um, 0000 (1 April 1993); doi: 10.1117/12.142003
Proc. SPIE 1982, Photoemission stability of negative-electron-affinity GaAs photocathodes, 0000 (1 April 1993); doi: 10.1117/12.142004
Proc. SPIE 1982, Optimization of the GaAs-delta-doped p-i-n quantum-well APD, 0000 (1 April 1993); doi: 10.1117/12.142005
Proc. SPIE 1982, Study of GaAs-Cs-Sb photoemitter, 0000 (1 April 1993); doi: 10.1117/12.142006
Proc. SPIE 1982, Tapered rib-waveguide for single sideband modulation at 10.6 um, 0000 (1 April 1993); doi: 10.1117/12.142007
Proc. SPIE 1982, Analyzing the thermal stability of CsI photocathodes with XPS, 0000 (1 April 1993); doi: 10.1117/12.142008
Proc. SPIE 1982, Optimum optical local oscillator power levels in coherent detection systems, 0000 (1 April 1993); doi: 10.1117/12.142009
Proc. SPIE 1982, Various improved techniques for reduction of dark current in silicon photoelectric detector, 0000 (1 April 1993); doi: 10.1117/12.142010
Proc. SPIE 1982, Post-annealing effect in HgCdTe photodiodes, 0000 (1 April 1993); doi: 10.1117/12.142011
Proc. SPIE 1982, Theoretical study on the thickness of polycrystalline semiconductor multialkali photocathodes, 0000 (1 April 1993); doi: 10.1117/12.142013
Image Tubes and Camera Tubes
Proc. SPIE 1982, Femtosecond streak tube, 0000 (1 April 1993); doi: 10.1117/12.142014
Proc. SPIE 1982, Development of the 12-inch high-definition x-ray image intensifier, 0000 (1 April 1993); doi: 10.1117/12.142015
Proc. SPIE 1982, Preliminary study of supersensitive camera tube, 0000 (1 April 1993); doi: 10.1117/12.142016
Proc. SPIE 1982, New progress in high-performance x-ray image intensifiers, 0000 (1 April 1993); doi: 10.1117/12.142017
Proc. SPIE 1982, Image tubes for measurements in extreme region, 0000 (1 April 1993); doi: 10.1117/12.142018
Proc. SPIE 1982, New gateable SEC camera tube, 0000 (1 April 1993); doi: 10.1117/12.142019
Proc. SPIE 1982, Novel x-ray image intensifier with catadioptric electron optics, 0000 (1 April 1993); doi: 10.1117/12.142020
Proc. SPIE 1982, New type of x-ray-wafer image intensifier with CsI-CsI/MCP photocathodes: its design and assessment, 0000 (1 April 1993); doi: 10.1117/12.142021
Design of Photoelectronic Imaging Devices
Proc. SPIE 1982, Optimization design of image tubes with electrostatic focusing, 0000 (1 April 1993); doi: 10.1117/12.142022
Proc. SPIE 1982, Computational aspects of photomultiplier design, 0000 (1 April 1993); doi: 10.1117/12.142024
Proc. SPIE 1982, Development of all-electrostatic camera tubes with pattern yoke, 0000 (1 April 1993); doi: 10.1117/12.142025
Proc. SPIE 1982, New study on permanent-magnet focusing image detectors for space astronomy, 0000 (1 April 1993); doi: 10.1117/12.142026
Proc. SPIE 1982, New electron optic for widescreen Gen. I image intensifiers: practical realizations, 0000 (1 April 1993); doi: 10.1117/12.142027
Proc. SPIE 1982, Performance of the phototube in which the photoelectron train is stretched to extend the timebase, 0000 (1 April 1993); doi: 10.1117/12.142028
Photoelectronic Detection
Proc. SPIE 1982, Real-time photocentroid detection for photon-counting and wavefront-sensing cameras, 0000 (1 April 1993); doi: 10.1117/12.142029
Proc. SPIE 1982, Solar spectroscopy with a Tektronix scientific CCD, 0000 (1 April 1993); doi: 10.1117/12.142030
Proc. SPIE 1982, Image sensor used in displacement measuring with high resolution, 0000 (1 April 1993); doi: 10.1117/12.142031
Proc. SPIE 1982, Photoelectronic detection of optical surface defects of optical system, 0000 (1 April 1993); doi: 10.1117/12.142032
Proc. SPIE 1982, Detection of radiation direction of CO<sub>2</sub> pulsed laser by the use of a pyroelectric camera, 0000 (1 April 1993); doi: 10.1117/12.142033
Proc. SPIE 1982, Measurement system for scanner angular linearity, 0000 (1 April 1993); doi: 10.1117/12.142035
Proc. SPIE 1982, Investigation on the correction for the cooling nonuniformity of IR detector arrays, 0000 (1 April 1993); doi: 10.1117/12.142036
Proc. SPIE 1982, Two-dimensional photoelectronic intelligent autocollimator, 0000 (1 April 1993); doi: 10.1117/12.142037
Proc. SPIE 1982, Applications of optoelectrical imaging in automatic inspection of mechanical components, 0000 (1 April 1993); doi: 10.1117/12.142038
Proc. SPIE 1982, Measurement of temperature field of combustion flame by CT and the middle-IR spectral-region optical-fiber-sensor technique, 0000 (1 April 1993); doi: 10.1117/12.142039
Proc. SPIE 1982, Detecting defects and showing their position in a deep hole by means of CCD camera, 0000 (1 April 1993); doi: 10.1117/12.142040
Proc. SPIE 1982, TV system for detection of latent fingerprints, 0000 (1 April 1993); doi: 10.1117/12.142041
Image Processing
Proc. SPIE 1982, Methodology base and problems of information technologies, 0000 (1 April 1993); doi: 10.1117/12.142042
Proc. SPIE 1982, Statistical problems of color-image-recognition theory, 0000 (1 April 1993); doi: 10.1117/12.142043
Proc. SPIE 1982, Wavefront sensing and deconvolution of turbulence-degraded photon-counting images, 0000 (1 April 1993); doi: 10.1117/12.142044
Proc. SPIE 1982, Recent advances in guided-wave correlators for real-time optical processing, 0000 (1 April 1993); doi: 10.1117/12.142046