PROCEEDINGS VOLUME 2113
OPTICAL DIAGNOSTICS OF MATERIALS AND DEVICES FOR OPTO-, MICRO-, AND QUANTUM ELECTRONICS: INTERNATIONAL WORKSHOP | 6-7 MAY 1993
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
OPTICAL DIAGNOSTICS OF MATERIALS AND DEVICES FOR OPTO-, MICRO-, AND QUANTUM ELECTRONICS: INTERNATIONAL WORKSHOP
6-7 May 1993
Kiev, Ukraine
Absorption and Reflection Spectroscopy
Proc. SPIE 2113, Photodiffractive and photoabsorptive techniques for nondestructive control of semiconducting wafers and structures, 0000 (31 October 1994); doi: 10.1117/12.191966
Proc. SPIE 2113, Some aspects of thin-film ellipsometry, 0000 (31 October 1994); doi: 10.1117/12.191977
Proc. SPIE 2113, Optical diagnostics of quaternary narrow-gap semiconductors, 0000 (31 October 1994); doi: 10.1117/12.191988
Proc. SPIE 2113, Technique for studying thermodynamics of local influence laser radiation on thin films, 0000 (31 October 1994); doi: 10.1117/12.191998
Proc. SPIE 2113, Spectral diagnostics of microelectronic material surface structure with high spatial resolution, 0000 (31 October 1994); doi: 10.1117/12.191999
Proc. SPIE 2113, Diagnostics of the parameters, mechanism, and nature of the cadmium iodide crystals light sensitivity by optical absorption spectroscopy, 0000 (31 October 1994); doi: 10.1117/12.192000
Proc. SPIE 2113, Noninterference method of optical surface roughness measurements, 0000 (31 October 1994); doi: 10.1117/12.192001
Proc. SPIE 2113, Diagnostics of multilayer dielectric coating based on reflection and transmission spectra, 0000 (31 October 1994); doi: 10.1117/12.192002
Proc. SPIE 2113, High-resolution IR laser spectral analysis in nondestructive onco-hematological diagnostics and semiconductor technique applications, 0000 (31 October 1994); doi: 10.1117/12.192003
Proc. SPIE 2113, Determination of the optical constants of thin absorbing films on a slightly absorbing substrate from photometric measurements, 0000 (31 October 1994); doi: 10.1117/12.191967
Proc. SPIE 2113, Solid state surface spectroscopy using the ellipsometric characteristics of guided-wave and surface polaritons, 0000 (31 October 1994); doi: 10.1117/12.191968
Proc. SPIE 2113, Compound material investigation by spectroscopic ellipsometry, 0000 (31 October 1994); doi: 10.1117/12.191969
Proc. SPIE 2113, Optical monitoring of vitreous films: structure and composition, 0000 (31 October 1994); doi: 10.1117/12.191970
Luminescent Methods of Diagnostics
Proc. SPIE 2113, Photoluminescence characterization of silicon subjected to various industrial treatments, 0000 (31 October 1994); doi: 10.1117/12.191971
Proc. SPIE 2113, Spectral-luminescent determination of radiation-induced changes in scintillator crystals of registering systems, 0000 (31 October 1994); doi: 10.1117/12.191972
Proc. SPIE 2113, Luminescence diagnostics of direct-gap semiconductors within a wide range of excitation levels, 0000 (31 October 1994); doi: 10.1117/12.191973
Proc. SPIE 2113, ZnSe quality analysis by x-ray luminescence, 0000 (31 October 1994); doi: 10.1117/12.191974
Proc. SPIE 2113, Luminescence profiling: a diagnostic method for an impurities-defects system in semiconductor materials, 0000 (31 October 1994); doi: 10.1117/12.191975
Raman Scattering Diagnostics
Proc. SPIE 2113, Application of hyper-Raman spectroscopy in the study of bulk materials, 0000 (31 October 1994); doi: 10.1117/12.191976
Proc. SPIE 2113, Raman scattering (RS) and photoluminescence (PL) study of AlGaAs films grown from Ga-Bi-Al solution-melt by LPE, 0000 (31 October 1994); doi: 10.1117/12.191978
Optical Modulation Spectroscopy
Proc. SPIE 2113, Intracavity diagnostics of optical inhomogeneity, 0000 (31 October 1994); doi: 10.1117/12.191979
Proc. SPIE 2113, Piezo-optic diagnostic of elastic tension and identification of defect types in CdTe by examination of exciton-defect complexes, 0000 (31 October 1994); doi: 10.1117/12.191980
Proc. SPIE 2113, Stress diagnostics in the plates of semiconductor crystals by means of light polarization modulation, 0000 (31 October 1994); doi: 10.1117/12.191981
Nonlinear Optical Diagnostics
Proc. SPIE 2113, Diagnostics of third-order nonlinear materials by nonlinear coherent polarimetry based on vector two-wave mixing, 0000 (31 October 1994); doi: 10.1117/12.191982
Proc. SPIE 2113, Determination of parameters of transitional layers on metals by linear and nonlinear optical methods, 0000 (31 October 1994); doi: 10.1117/12.191983
Proc. SPIE 2113, Express method for optical strength diagnostics in transparent dielectrics and semiconductors, 0000 (31 October 1994); doi: 10.1117/12.191984
Proc. SPIE 2113, Multiple charging of recombination centers as one of the causes of semiconductor scintillators inertiality, 0000 (31 October 1994); doi: 10.1117/12.191985
Proc. SPIE 2113, Recharging of local centers and diagnostics of laser and nonlinear crystals, 0000 (31 October 1994); doi: 10.1117/12.191986
Holographic and Interferometric Methods of Diagnostics
Proc. SPIE 2113, Laser-thermal diagnostics of multilayer opto- and microelectronic structures, 0000 (31 October 1994); doi: 10.1117/12.191987
Proc. SPIE 2113, Laser-interference dilatometry method for the investigation of thin-film structures mechanical stability, 0000 (31 October 1994); doi: 10.1117/12.191989
Equipment for Optical Nondestructive Testing
Proc. SPIE 2113, Photoacoustic spectro- and microscopy: new diagnostic methods for materials and devices for electronics, 0000 (31 October 1994); doi: 10.1117/12.191990
Proc. SPIE 2113, Light-scattering method for structural perfection testing of both silicon surface and near-surface layers, 0000 (31 October 1994); doi: 10.1117/12.191991
Proc. SPIE 2113, Method and measuring device for micro-optics element assessment, 0000 (31 October 1994); doi: 10.1117/12.191992
Proc. SPIE 2113, Polarization of the subthreshold emission and diagnostic of mechanical strain in semiconductor lasers and light-emitting diodes, 0000 (31 October 1994); doi: 10.1117/12.191993
Proc. SPIE 2113, Optical/digital system for measurements and diagnostics of surface properties of materials for micro- and optoelectronics, 0000 (31 October 1994); doi: 10.1117/12.191994
Proc. SPIE 2113, Thermovisual system for qualitative control of electronic products, 0000 (31 October 1994); doi: 10.1117/12.191995
Proc. SPIE 2113, Express-control method of frequency nonreproducibility sources in frequency-stabilized He-Ne lasers, 0000 (31 October 1994); doi: 10.1117/12.191996
Proc. SPIE 2113, Methods and systems of indestructible contact-free television control of micro-objects, 0000 (31 October 1994); doi: 10.1117/12.191997
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