PROCEEDINGS VOLUME 2114
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1993 | 27-29 OCTOBER 1993
Laser-Induced Damage in Optical Materials: 1993
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1993
27-29 October 1993
Boulder, CO, United States
Materials and Measurements
Proc. SPIE 2114, Solving the optics industry's problems: the bottom line, 0000 (28 July 1994); doi: 10.1117/12.180871
Proc. SPIE 2114, Historical perspective on fifteen years of laser damage thresholds at LLNL, 0000 (28 July 1994); doi: 10.1117/12.180882
Proc. SPIE 2114, Dye-impregnated polymer-filled porous glass: a new composite material for solid state dye lasers and laser beam control optical elements, 0000 (28 July 1994); doi: 10.1117/12.180893
Proc. SPIE 2114, Participation of laser-induced waveguide modes in optical damage of transparent dielectrics, 0000 (28 July 1994); doi: 10.1117/12.180904
Proc. SPIE 2114, Bulk laser damage of large-size KDP crystals obtained at various crystal growth conditions, 0000 (28 July 1994); doi: 10.1117/12.180914
Proc. SPIE 2114, Long-term effects of pulsed KrF laser radiation on crystalline and amorphous SiO2, 0000 (28 July 1994); doi: 10.1117/12.180923
Proc. SPIE 2114, Picosecond light-pulse-induced damage to diamond, 0000 (28 July 1994); doi: 10.1117/12.180932
Surfaces and Mirrors
Proc. SPIE 2114, Role of defects in the laser ablation of wide bandgap materials, 0000 (28 July 1994); doi: 10.1117/12.180947
Proc. SPIE 2114, Optical damage at the part per million level: the role of trace contamination in laser-induced optical damage, 0000 (28 July 1994); doi: 10.1117/12.180872
Proc. SPIE 2114, Laser damage threshold measurement according to ISO 11254: experimental realization at 1064 nm, 0000 (28 July 1994); doi: 10.1117/12.180873
Proc. SPIE 2114, Polarized 10-ns frequency-doubled Nd:YAG laser-induced damage to titanium-doped sapphire, 0000 (28 July 1994); doi: 10.1117/12.180874
Minisymposium: Quest for the Invincible Laser Coating--A Critical Review of Pulsed Laser-Induced Damage to Optical Coatings: Causes and Cures
Proc. SPIE 2114, Why are thin films different from the bulk?, 0000 (28 July 1994); doi: 10.1117/12.180875
Proc. SPIE 2114, Role of defects in laser damage of multilayer coatings, 0000 (28 July 1994); doi: 10.1117/12.180876
Proc. SPIE 2114, Optical characterization of dielectric films and modified surfaces, 0000 (28 July 1994); doi: 10.1117/12.180877
Proc. SPIE 2114, Ion beam sputtering of optical coatings, 0000 (28 July 1994); doi: 10.1117/12.180878
Proc. SPIE 2114, Large-area laser coatings made by energetic reactive processes, 0000 (28 July 1994); doi: 10.1117/12.180879
Proc. SPIE 2114, Coping with the ever-increasing demands of laser-induced damage threshold requirements: a perspective, 0000 (28 July 1994); doi: 10.1117/12.180880
Proc. SPIE 2114, ISO 11254: an international standard for the determination of the laser-induced damage threshold, 0000 (28 July 1994); doi: 10.1117/12.180881
Proc. SPIE 2114, Crystal gazing into the future of optical coatings, 0000 (28 July 1994); doi: 10.1117/12.180883
Thin Films
Proc. SPIE 2114, Sol-gel coatings for high-power laser optics: past, present and future, 0000 (28 July 1994); doi: 10.1117/12.180884
Proc. SPIE 2114, Sol-gel metal oxide and metal oxide/polymer multilayers applied by meniscus coating, 0000 (28 July 1994); doi: 10.1117/12.180885
Proc. SPIE 2114, High-damage threshold antireflectors by physical-vapor-deposited amorphous fluoropolymer, 0000 (28 July 1994); doi: 10.1117/12.180886
Proc. SPIE 2114, Nonlinear absorption in high reflector multilayers, 0000 (28 July 1994); doi: 10.1117/12.180887
Proc. SPIE 2114, Application of liquid crystals in visualizing the dynamically induced structure deformation modes in optical materials, 0000 (28 July 1994); doi: 10.1117/12.180888
Proc. SPIE 2114, Investigation of laser-induced damage to optical coatings, 0000 (28 July 1994); doi: 10.1117/12.180889
By Title Only
Proc. SPIE 2114, Damage to coated ZnSe optical components by high-power CO2 laser radiation, 0000 (28 July 1994); doi: 10.1117/12.180890
Surfaces and Mirrors
Proc. SPIE 2114, Laser damage issues for mid-IR optical parametric oscillator mirrors, 0000 (28 July 1994); doi: 10.1117/12.180891
Fundamental Mechanisms
Proc. SPIE 2114, Theory of laser-induced damage to optical coatings: inclusion-initiated thermal explosion mechanism, 0000 (28 July 1994); doi: 10.1117/12.180892
Thin Films
Proc. SPIE 2114, Electrostatic reduction of particulates for laser resistant hafnia coatings, 0000 (28 July 1994); doi: 10.1117/12.180894
Proc. SPIE 2114, Optical constants and laser damage thresholds of silicon oxinitride thin films, 0000 (28 July 1994); doi: 10.1117/12.180895
Proc. SPIE 2114, Very high-damage threshold Al2O3/SiO2 dielectric coatings for excimer lasers, 0000 (28 July 1994); doi: 10.1117/12.180896
Fundamental Mechanisms
Proc. SPIE 2114, Characterization of nonlinear optical materials, 0000 (28 July 1994); doi: 10.1117/12.180897
Proc. SPIE 2114, Influence of radiation polarization on optical breakdown threshold of glasses by two beams, 0000 (28 July 1994); doi: 10.1117/12.180898
Proc. SPIE 2114, To scale or not to scale, 0000 (28 July 1994); doi: 10.1117/12.180899
Proc. SPIE 2114, Beyond perfection: the need for understanding contamination effects on real-world optics, 0000 (28 July 1994); doi: 10.1117/12.180900
Proc. SPIE 2114, Monte-Carlo-based calculation of measurement quality for three variants of the damage frequency method, 0000 (28 July 1994); doi: 10.1117/12.180901
Proc. SPIE 2114, Generation-diffusion-deformational instabilities and formation of periodic damage structures in solids, 0000 (28 July 1994); doi: 10.1117/12.180902
Surfaces and Mirrors
Proc. SPIE 2114, Novel process for figuring and polishing diamond surfaces, 0000 (28 July 1994); doi: 10.1117/12.180903
Proc. SPIE 2114, Laser damage studies of etched diffractive-optic components, 0000 (28 July 1994); doi: 10.1117/12.180905
Proc. SPIE 2114, Laser damage studies of metal mirrors and ZnSe optics by long-pulse and TEA-CO2 lasers at 10.6 um, 0000 (28 July 1994); doi: 10.1117/12.180906
Proc. SPIE 2114, Critical temperature of mirrors under high-power continuous wave CO2 laser irradiation, 0000 (28 July 1994); doi: 10.1117/12.180907
Proc. SPIE 2114, Contamination of surfaces prior to optical coating by in-situ total internal reflection microscopy, 0000 (28 July 1994); doi: 10.1117/12.180908
Materials and Measurements
Proc. SPIE 2114, Kinoform/lens system for injecting a high-power laser beam into an optical fiber, 0000 (28 July 1994); doi: 10.1117/12.180909
Proc. SPIE 2114, Damage studies in high-power fiber transmission systems, 0000 (28 July 1994); doi: 10.1117/12.180910
Proc. SPIE 2114, 2-um laser damage and 3-6 um optical parametric oscillation in AgGaSe2, 0000 (28 July 1994); doi: 10.1117/12.180911
Proc. SPIE 2114, Thermal and laser conditioning of production and rapid growth KDP and KD*P crystals, 0000 (28 July 1994); doi: 10.1117/12.180912
Fundamental Mechanisms
Proc. SPIE 2114, Development of high repetition-rate glass slab laser, 0000 (28 July 1994); doi: 10.1117/12.180913
Proc. SPIE 2114, Improvement of pumping efficiency for disk amplifier, 0000 (28 July 1994); doi: 10.1117/12.180915
Thin Films
Proc. SPIE 2114, Time- and frequency-resolved investigation of thin film laser damage, 0000 (28 July 1994); doi: 10.1117/12.180916
Materials and Measurements
Proc. SPIE 2114, UV laser patterning of polymers: in-situ and nondestructive evaluation of incubation phenomena by photothermal techniques, 0000 (28 July 1994); doi: 10.1117/12.180917
Thin Films
Proc. SPIE 2114, Atomic force microscopy studies of laser-triggered morphology changes in Y2O3 monolayer coatings, 0000 (28 July 1994); doi: 10.1117/12.180918
Proc. SPIE 2114, Atomic force microscopy observation of water-induced morphological changes in Y2O3 monolayer coatings, 0000 (28 July 1994); doi: 10.1117/12.180919
Proc. SPIE 2114, Morphology investigations by atomic force microscopy of thin films and substrates for excimer laser mirrors, 0000 (28 July 1994); doi: 10.1117/12.180920
Proc. SPIE 2114, Characterization of defect geometries in multilayer optical coatings, 0000 (28 July 1994); doi: 10.1117/12.180921
Proc. SPIE 2114, Laser conditioning of optical coatings: some issues in the characterization by atomic force microscopy, 0000 (28 July 1994); doi: 10.1117/12.180922
Proc. SPIE 2114, High-power 1.315-um laser test of multilayer mirrors, 0000 (28 July 1994); doi: 10.1117/12.180924
Proc. SPIE 2114, 1.064-um laser damage studies of silicon oxy-nitride narrow band reflectors, 0000 (28 July 1994); doi: 10.1117/12.180925
Proc. SPIE 2114, Comparison of the optical properties of oxide films deposited by reactive-dc-magnetron sputtering with those of ion-beam-sputtered and electron-beam-evaporated films, 0000 (28 July 1994); doi: 10.1117/12.180926
Proc. SPIE 2114, Photothermal microscopy of defects and laser damage morphology in Al2O3/SiO2 dielectric mirror coatings for 248 nm, 0000 (28 July 1994); doi: 10.1117/12.180927