PROCEEDINGS VOLUME 2174
IS&T/SPIE 1994 INTERNATIONAL SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY | 6-10 FEBRUARY 1994
Advanced Flat Panel Display Technologies
IN THIS VOLUME

0 Sessions, 30 Papers, 0 Presentations
Manufacturing  (11)
Devices  (6)
IS&T/SPIE 1994 INTERNATIONAL SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY
6-10 February 1994
San Jose, CA, United States
Government Infrastructure Support Programs
Proc. SPIE 2174, ARPA High Definition Systems program, 0000 (1 April 1994); doi: 10.1117/12.172130
Proc. SPIE 2174, National Center for Advanced Information Components Manufacturing: program update, 0000 (1 April 1994); doi: 10.1117/12.172141
Proc. SPIE 2174, Phosphor Technology Center of Excellence: research, education, industrial interactions, 0000 (1 April 1994); doi: 10.1117/12.172151
Proc. SPIE 2174, Policies toward advanced display in the Clinton administration, 0000 (1 April 1994); doi: 10.1117/12.172154
Proc. SPIE 2174, Flat panel display manufacturing infrastructure development, 0000 (1 April 1994); doi: 10.1117/12.172155
Proc. SPIE 2174, Research on flat panel display measurements at the National Institute of Standards and Technology, 0000 (1 April 1994); doi: 10.1117/12.172156
Applications, Requirements, and Interfacing
Proc. SPIE 2174, Performance requirements for electronic displays of color moving images using flat panel technology, 0000 (1 April 1994); doi: 10.1117/12.172157
Proc. SPIE 2174, Application of high-definition display technology to the design of mobile client/server systems, 0000 (1 April 1994); doi: 10.1117/12.172158
Proc. SPIE 2174, Flat panel cockpit display requirements and specification, 0000 (1 April 1994); doi: 10.1117/12.172159
Proc. SPIE 2174, Economical silicon-on-glass interconnection, 0000 (1 April 1994); doi: 10.1117/12.172131
Proc. SPIE 2174, Ultra-thin silicon-on-sapphire for high-density active-matrix liquid crystal display (AMLCD) drivers, 0000 (1 April 1994); doi: 10.1117/12.172132
Manufacturing
Proc. SPIE 2174, Automatic repair in active-matrix liquid crystal display (AMLCD), 0000 (1 April 1994); doi: 10.1117/12.172133
Proc. SPIE 2174, Inspection and test of flat panel displays, 0000 (1 April 1994); doi: 10.1117/12.172134
Proc. SPIE 2174, LCD testing and repair, 0000 (1 April 1994); doi: 10.1117/12.172135
Proc. SPIE 2174, Reliability and life testing of color gas plasma display panels manufactured with in-process defect repair technology, 0000 (1 April 1994); doi: 10.1117/12.172136
Proc. SPIE 2174, Display panel electrode defect classification system, 0000 (1 April 1994); doi: 10.1117/12.172137
Proc. SPIE 2174, Advanced glass substrates for flat panel displays, 0000 (1 April 1994); doi: 10.1117/12.172138
Proc. SPIE 2174, Superior quality soda-lime float glass for large-area flat panel applications, 0000 (1 April 1994); doi: 10.1117/12.172139
Proc. SPIE 2174, Physics and modeling of an ac-plasma display picture element, 0000 (1 April 1994); doi: 10.1117/12.172140
Devices
Proc. SPIE 2174, High-resolution color plasma display panels (PDPs), 0000 (1 April 1994); doi: 10.1117/12.172142
Proc. SPIE 2174, Challenges of manufacturing LCDs from active matrices, 0000 (1 April 1994); doi: 10.1117/12.172143
Proc. SPIE 2174, Electrical characterization of blue electroluminescent devices, 0000 (1 April 1994); doi: 10.1117/12.172144
Proc. SPIE 2174, Organic electroluminescent devices with thiophene derivatives, 0000 (1 April 1994); doi: 10.1117/12.172145
Proc. SPIE 2174, Introduction of RGB colors into thin film electroluminescent displays by ion implantation, 0000 (1 April 1994); doi: 10.1117/12.172146
Proc. SPIE 2174, Characteristics of an optical filter with a linearly periodic refractive index pattern, 0000 (1 April 1994); doi: 10.1117/12.172147
Applications, Requirements, and Interfacing
Proc. SPIE 2174, Flat panel display workstation requirements, 0000 (1 April 1994); doi: 10.1117/12.172148
Proc. SPIE 2174, High-performance, cost-effective computer and video interfacing to megapixel flat panel displays (FPDs), 0000 (1 April 1994); doi: 10.1117/12.172149
Manufacturing
Proc. SPIE 2174, Very large precision mask manufacturing: an innovative approach, 0000 (1 April 1994); doi: 10.1117/12.172150
Proc. SPIE 2174, Automatic spacer evaluation system, 0000 (1 April 1994); doi: 10.1117/12.172152
Proc. SPIE 2174, Yield enhancement: photomask pellicles for use in flat panel display lithography, 0000 (1 April 1994); doi: 10.1117/12.172153
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