REFRACTOMETRY: INTERNATIONAL CONFERENCE
16-20 May 1994
Warsaw, Poland
Special Papers on Light Refraction and its Role in Applied Sciences and Optical Engineering
Proc. SPIE 2208, Spatial inhomogeneities and temporal fluctuations of the refractive index in gas laser media, 0000 (23 June 1995); doi: 10.1117/12.213170
Proc. SPIE 2208, Group velocity dispersion compensation in femtosecond Ti:sapphire laser, 0000 (23 June 1995); doi: 10.1117/12.213181
Proc. SPIE 2208, Secondary spectrum aberrations of refractive optical systems, 0000 (23 June 1995); doi: 10.1117/12.213192
Proc. SPIE 2208, Design of the narrow band nonpolarizing antireflection coating illustrated with admittance diagrams, 0000 (23 June 1995); doi: 10.1117/12.213203
Proc. SPIE 2208, Diagnostics of seawater refractive turbulence, 0000 (23 June 1995); doi: 10.1117/12.213204
Proc. SPIE 2208, Refractive index and light scattering models in the volume scattering function measurement, 0000 (23 June 1995); doi: 10.1117/12.213205
Interference Refractometry
Proc. SPIE 2208, High-precision interference refractometer for length measurements, 0000 (23 June 1995); doi: 10.1117/12.213206
Proc. SPIE 2208, Precise methods of refraction measurements in moveable object direction, 0000 (23 June 1995); doi: 10.1117/12.213207
Proc. SPIE 2208, Metrological guarantee of polarimetry and refractometry: state of the problem and outlook, 0000 (23 June 1995); doi: 10.1117/12.213208
Proc. SPIE 2208, Statistical algorithm to obtain refractive index and thickness from spectrophotometric interference patterns, 0000 (23 June 1995); doi: 10.1117/12.213171
Proc. SPIE 2208, Distributed feedback dye laser: a simple instrument for measurement of refractive index of laser media, 0000 (23 June 1995); doi: 10.1117/12.213172
Proc. SPIE 2208, Intelligent refractive index detector for capillary electrophoresis, 0000 (23 June 1995); doi: 10.1117/12.213173
Proc. SPIE 2208, Temperature dependence of refractive index as a basis for laser thermometry of semiconductor crystals, 0000 (23 June 1995); doi: 10.1117/12.213174
Proc. SPIE 2208, Measurement of temperature dependencies of real and imaginary parts of the complex index of refraction of monocrystalline of silicon in the range of absorption edge, 0000 (23 June 1995); doi: 10.1117/12.213175
Waveguide Refractometric Devices and Sensors
Proc. SPIE 2208, M-line spectroscopy for nonlinear waveguide characterization, 0000 (23 June 1995); doi: 10.1117/12.213176
Proc. SPIE 2208, Effects of absorption and coupling strength on accuracy of dark mode refractometry, 0000 (23 June 1995); doi: 10.1117/12.213177
Proc. SPIE 2208, Miniature integrated optical refractometer chip, 0000 (23 June 1995); doi: 10.1117/12.213178
Proc. SPIE 2208, Increasing of sensitivity of lightguide refractive index sensors, 0000 (23 June 1995); doi: 10.1117/12.213179
Proc. SPIE 2208, Refractive index dependence of attenuation in antiresonant reflecting optical waveguides, 0000 (23 June 1995); doi: 10.1117/12.213180
Proc. SPIE 2208, Modeling of light transmission in a fiber optic path of any shape for refractometric sensors with intensity modulation, 0000 (23 June 1995); doi: 10.1117/12.213182
Proc. SPIE 2208, Modeling and computer optimization of fiber optic refractometric sensors, 0000 (23 June 1995); doi: 10.1117/12.213183
Proc. SPIE 2208, Fourier analysis as a means of contemporary measurements of several quantities influencing the refractive index of intensity-based fiber sensors, 0000 (23 June 1995); doi: 10.1117/12.213184
Refractometry via Reflectometry
Proc. SPIE 2208, Refractometry of absorbing media: theory, devices, metrology, 0000 (23 June 1995); doi: 10.1117/12.213185
Proc. SPIE 2208, Refractometry of weakly absorbing multilayers via reflectometry, 0000 (23 June 1995); doi: 10.1117/12.213186
Proc. SPIE 2208, Measurement of refraction and absorption indices of thin polymer film on the transparent semiconductor substrate via FTIR spectrometry, 0000 (23 June 1995); doi: 10.1117/12.213187
Proc. SPIE 2208, Refractometry by means of surface plasmon resonance, 0000 (23 June 1995); doi: 10.1117/12.213188
Double Refraction
Proc. SPIE 2208, Photoinduced birefringence and its application, 0000 (23 June 1995); doi: 10.1117/12.213189
Proc. SPIE 2208, Birefringence measurement of optical fibers under various stress conditions, 0000 (23 June 1995); doi: 10.1117/12.213190
Proc. SPIE 2208, Multiple reflections in retardation plates with elliptical birefringence, 0000 (23 June 1995); doi: 10.1117/12.213191
Summaries of Conference Papers Not Available for Publication
Proc. SPIE 2208, Group velocity effects in ultrafast optical systems, 0000 (23 June 1995); doi: 10.1117/12.213193
Proc. SPIE 2208, Refractometry of cryogenic condensed medium, 0000 (23 June 1995); doi: 10.1117/12.213194
Proc. SPIE 2208, Interferometric method for the determination of absolute refractive index and optical thickness, 0000 (23 June 1995); doi: 10.1117/12.213195
Proc. SPIE 2208, Two-color time-resolved Z-scan to study the thermal changes of the refractive index in liquids, 0000 (23 June 1995); doi: 10.1117/12.213196
Proc. SPIE 2208, Measurement of refractive index and stress birefringence in optical fibers and preforms, 0000 (23 June 1995); doi: 10.1117/12.213197
Proc. SPIE 2208, Refractometry by phase measuring interferometry, 0000 (23 June 1995); doi: 10.1117/12.213198
Proc. SPIE 2208, Refractive profiles of chiral-nematic myelin filaments, 0000 (23 June 1995); doi: 10.1117/12.213199
Proc. SPIE 2208, Microscopic structures for planar and conventional optics: theory and technology, 0000 (23 June 1995); doi: 10.1117/12.213200
Proc. SPIE 2208, Peculiarities of registration of nonlinear photoanisotropy effects in noncollinear geometry of interacting waves, 0000 (23 June 1995); doi: 10.1117/12.213201
Proc. SPIE 2208, Refractometry of biological structures: needs of ergophthalmology, 0000 (23 June 1995); doi: 10.1117/12.213202
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