OPTICS FOR PRODUCTIVITY IN MANUFACTURING
19-24 June 1994
Frankfurt, Germany
Optical Diagnostics for Process Industry
Proc. SPIE 2248, High-precision optical measurement methods, 0000 (15 November 1994); doi: 10.1117/12.194305
Proc. SPIE 2248, High-precision gauging of metal rings, 0000 (15 November 1994); doi: 10.1117/12.194323
Proc. SPIE 2248, Identification and integrity verification of final disposal casks, 0000 (15 November 1994); doi: 10.1117/12.194334
Proc. SPIE 2248, Imaging spectrometer for process industry applications, 0000 (15 November 1994); doi: 10.1117/12.194344
Proc. SPIE 2248, Software tool for developing algorithms for surface inspection systems, 0000 (15 November 1994); doi: 10.1117/12.194352
Proc. SPIE 2248, Laser-induced breakdown spectroscopy: a versatile tool for process control, 0000 (15 November 1994); doi: 10.1117/12.194357
Optical Microtopographic Inspection and Nanomeasurements
Proc. SPIE 2248, Calibration of projected fringe surface topography measurement systems, 0000 (15 November 1994); doi: 10.1117/12.194359
Proc. SPIE 2248, Noncontact profiling of machined metal surfaces by fiber optic interferometry, 0000 (15 November 1994); doi: 10.1117/12.194306
Proc. SPIE 2248, Brightness measurement of rough surfaces by confocal microscopy and image analysis, 0000 (15 November 1994); doi: 10.1117/12.194307
Proc. SPIE 2248, Surface profiling by frequency-domain analysis of white light interferograms, 0000 (15 November 1994); doi: 10.1117/12.194308
Surface Quality Measurement and Optical Components Testing
Proc. SPIE 2248, Optical ultrasonic sensors for monitoring from industrial surfaces, 0000 (15 November 1994); doi: 10.1117/12.194309
Proc. SPIE 2248, Profiling of aspherical surfaces using moire deflectometry, 0000 (15 November 1994); doi: 10.1117/12.194310
Proc. SPIE 2248, Common-path holographic interferometer for flatness testing, 0000 (15 November 1994); doi: 10.1117/12.194311
Proc. SPIE 2248, Long-wavelength laser diode interferometer for surface flatness measurement, 0000 (15 November 1994); doi: 10.1117/12.194312
Proc. SPIE 2248, Checking the symmetry of stretchable plastic membrane concave mirrors using a lateral shearing interferometer, 0000 (15 November 1994); doi: 10.1117/12.194313
Proc. SPIE 2248, Surface inspection by optical triangulation, 0000 (15 November 1994); doi: 10.1117/12.194314
Poster Session
Proc. SPIE 2248, Absolute surface shape testing by means of an interferometric sensor, 0000 (15 November 1994); doi: 10.1117/12.194315
Shape Testing and Dimensional Measurements
Proc. SPIE 2248, High sensitivity fringe projection micro-shape measurement system, 0000 (15 November 1994); doi: 10.1117/12.194316
Proc. SPIE 2248, Phase stepping in projected-fringe fiber-based moire interferometry, 0000 (15 November 1994); doi: 10.1117/12.194317
Proc. SPIE 2248, Measurement of angular variations of 3D objects using holographic interferometry, 0000 (15 November 1994); doi: 10.1117/12.194318
Proc. SPIE 2248, Absolute distance and velocity measurements by a double integrated heterodyne interferometer, 0000 (15 November 1994); doi: 10.1117/12.194319
Proc. SPIE 2248, Automation of the phase-map extraction by a moire technique in a Fizeau interferometer, 0000 (15 November 1994); doi: 10.1117/12.194320
Deformation, Displacement, Vibration, and Fluid Flow
Proc. SPIE 2248, Optical methods for the characterization of mechanical properties of thin silicon films, 0000 (15 November 1994); doi: 10.1117/12.194321
Proc. SPIE 2248, Electronic shearography (ESPSI) for direct measurement of strains, 0000 (15 November 1994); doi: 10.1117/12.194322
Proc. SPIE 2248, Nondestructive inspection with shearography, 0000 (15 November 1994); doi: 10.1117/12.194324
Proc. SPIE 2248, Phase-stepped additive stroboscopic fiber optic TV holography for vibration analysis, 0000 (15 November 1994); doi: 10.1117/12.194325
Proc. SPIE 2248, Whole-field vibration phase measurement with electronic speckle pattern interferometry (ESPI), 0000 (15 November 1994); doi: 10.1117/12.194326
Proc. SPIE 2248, Visualizing cross sections of 3D turbulent flows using a modified white light Lau interferometer, 0000 (15 November 1994); doi: 10.1117/12.194327
Optical Diagnostics for Process Industry
Proc. SPIE 2248, Optical sensors for the process industries, 0000 (15 November 1994); doi: 10.1117/12.194328
Optical Nondestructive Evaluation
Proc. SPIE 2248, Real-time measurement of optical thickness by three-channel homodyne interferometry, 0000 (15 November 1994); doi: 10.1117/12.194329
Proc. SPIE 2248, Analysis of defects in ceramics through photothermal deflection method, 0000 (15 November 1994); doi: 10.1117/12.194330
Proc. SPIE 2248, Digital image processing of double pulse holograms: investigation of velocity and number density of droplets in sprays, 0000 (15 November 1994); doi: 10.1117/12.194331
Proc. SPIE 2248, Knowledge-based monitoring and control of plasma processes using chromaticity measurements, 0000 (15 November 1994); doi: 10.1117/12.194332
Proc. SPIE 2248, Simultaneous particle size, 3D position and velocity measurements from processing of defocused images recorded with two CCD cameras, 0000 (15 November 1994); doi: 10.1117/12.194333
Temperature and Magnetic Fields
Proc. SPIE 2248, Refractive index determination as a tool for temperature measurement and process control: a new approach, 0000 (15 November 1994); doi: 10.1117/12.194335
Proc. SPIE 2248, Temperature measurement with a tapered monomode fiber by coherence multiplexing, 0000 (15 November 1994); doi: 10.1117/12.194336
Proc. SPIE 2248, Mirror temperature of semiconductor diode lasers studied with a photothermal deflection method, 0000 (15 November 1994); doi: 10.1117/12.194337
Proc. SPIE 2248, Compensation for the vibration-induced linear birefringence modulation in Faraday effect magnetometers, 0000 (15 November 1994); doi: 10.1117/12.194338
Proc. SPIE 2248, Thermovisual system for nondestructive evaluation of objects for various designations, 0000 (15 November 1994); doi: 10.1117/12.194339
Specialized Techniques and Applications
Proc. SPIE 2248, True RGB line scan camera for color machine vision applications, 0000 (15 November 1994); doi: 10.1117/12.194340
Proc. SPIE 2248, Computer-controlled high accuracy optical measurement, 0000 (15 November 1994); doi: 10.1117/12.194341
Proc. SPIE 2248, Automated headspace analysis for quality assurance of pharmaceutical vials by laser Raman spectroscopy, 0000 (15 November 1994); doi: 10.1117/12.194342
Proc. SPIE 2248, Multiple-reflection beams for simplified heterodyne interferometers, 0000 (15 November 1994); doi: 10.1117/12.194343
Proc. SPIE 2248, Three dimensional reconstruction of objects with large depth variations, 0000 (15 November 1994); doi: 10.1117/12.194345
Proc. SPIE 2248, Monocular parameter estimation from intersections with planar surfaces, 0000 (15 November 1994); doi: 10.1117/12.194346
Proc. SPIE 2248, Measuring the motion parameters of objects by speckle optics methods, 0000 (15 November 1994); doi: 10.1117/12.194347
Temperature and Magnetic Fields
Proc. SPIE 2248, Application of optothermal hybrid microscopy in nondestructive and noncontact testing of coatings, 0000 (15 November 1994); doi: 10.1117/12.194348
Poster Session
Proc. SPIE 2248, Azo-dye-doped polymers as novel optical storage media in holographic interferometry, 0000 (15 November 1994); doi: 10.1117/12.194349
Proc. SPIE 2248, Holographic interferometry in high-temperature flows using the high entalphy shock tunnel in Gottingen (HEG), 0000 (15 November 1994); doi: 10.1117/12.194350
Proc. SPIE 2248, Close range dimensional measurement using grating techniques and natural edges, 0000 (15 November 1994); doi: 10.1117/12.194351
Proc. SPIE 2248, Monitoring the optical polishing process by computerized microscopy techniques, 0000 (15 November 1994); doi: 10.1117/12.194353
Optical Nondestructive Evaluation
Proc. SPIE 2248, White light interferometric fiber optic measurement systems, 0000 (15 November 1994); doi: 10.1117/12.194354
Poster Session
Proc. SPIE 2248, Comprehensive optical diagnostics of IR-sensitive film structures, 0000 (15 November 1994); doi: 10.1117/12.194355
Proc. SPIE 2248, Superimposed holographic interferometer, 0000 (15 November 1994); doi: 10.1117/12.194356
Temperature and Magnetic Fields
Proc. SPIE 2248, Computer-based three-dimensional imaging, 0000 (15 November 1994); doi: 10.1117/12.194358
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