PROCEEDINGS VOLUME 2253
1994 INTERNATIONAL SYMPOSIUM ON OPTICAL INTERFERENCE COATINGS | 5-10 JUNE 1994
Optical Interference Coatings
1994 INTERNATIONAL SYMPOSIUM ON OPTICAL INTERFERENCE COATINGS
5-10 June 1994
Grenoble, France
Advances in Design and Design Techniques
Proc. SPIE 2253, Design of optical multilayer coatings, 0000 (4 November 1994); doi: 10.1117/12.192046
Proc. SPIE 2253, Development of the needle optimization technique and new features of OptiLayer design software, 0000 (4 November 1994); doi: 10.1117/12.192109
Proc. SPIE 2253, Stack-by-stack synthesis of antireflection coatings with wide-angular incidence, 0000 (4 November 1994); doi: 10.1117/12.192120
Proc. SPIE 2253, Explicit design of equiripple edge filters, 0000 (4 November 1994); doi: 10.1117/12.192128
Proc. SPIE 2253, Synthesis of infrared filters for use in spaceflight systems, 0000 (4 November 1994); doi: 10.1117/12.192137
Proc. SPIE 2253, Overcoming low index limitations in antireflection coatings with additional thickness, 0000 (4 November 1994); doi: 10.1117/12.192154
Proc. SPIE 2253, Analytical approach of rugate filter properties using Mathieu functions, 0000 (4 November 1994); doi: 10.1117/12.192163
Proc. SPIE 2253, Synthesis of optical coatings using a simulated annealing algorithm, 0000 (4 November 1994); doi: 10.1117/12.192173
Proc. SPIE 2253, Thin film design program based on the flip-flop method with a random search, 0000 (4 November 1994); doi: 10.1117/12.192047
Proc. SPIE 2253, Polarization effects in optical thin films, 0000 (4 November 1994); doi: 10.1117/12.192057
Proc. SPIE 2253, Development of transparent conductive ZnO by Rf magnetron sputtering, 0000 (4 November 1994); doi: 10.1117/12.192077
Advances in Design and Design Techniques: Posters
Proc. SPIE 2253, Antireflection coatings for two widely separated wavelengths, 0000 (4 November 1994); doi: 10.1117/12.192088
Proc. SPIE 2253, Design of broadband dichroic mirrors using admittance matching, 0000 (4 November 1994); doi: 10.1117/12.192099
Proc. SPIE 2253, Design of graded-reflectivity-mirrors using rotating masks, 0000 (4 November 1994); doi: 10.1117/12.192105
Proc. SPIE 2253, Design of dielectric high-reflectors for dispersion control in femtosecond lasers, 0000 (4 November 1994); doi: 10.1117/12.192106
Proc. SPIE 2253, Robust filter design by stochastic optimization, 0000 (4 November 1994); doi: 10.1117/12.192107
Manufacturing Topics: Processes I
Proc. SPIE 2253, Energetic particles for vacuum deposition, 0000 (4 November 1994); doi: 10.1117/12.192108
Proc. SPIE 2253, Low-loss ion beam sputtered coatings in the nineties, 0000 (4 November 1994); doi: 10.1117/12.192110
Proc. SPIE 2253, Application of ion-assisted-deposition using a gridless end-Hall ion source for volume manufacturing of thin film optical filters, 0000 (4 November 1994); doi: 10.1117/12.192111
Proc. SPIE 2253, Plasma-ion-assisted-deposition: a novel technique for the production of optical coatings, 0000 (4 November 1994); doi: 10.1117/12.192112
Manufacturing Topics: Monitoring and Control
Proc. SPIE 2253, Control of silicon oxynitrides refractive index by reactive-assisted ion beam sputter deposition, 0000 (4 November 1994); doi: 10.1117/12.192113
Proc. SPIE 2253, Direct optical monitoring instrument with a double detection system for the control of multilayer systems from the visible to the near infrared, 0000 (4 November 1994); doi: 10.1117/12.192114
Proc. SPIE 2253, In situ optical multichannel spectrometer system, 0000 (4 November 1994); doi: 10.1117/12.192115
Proc. SPIE 2253, Computer-integrated manufacturing of advanced thin film coatings, 0000 (4 November 1994); doi: 10.1117/12.192116
Manufacturing Topics: Processes II
Proc. SPIE 2253, New source of energetic neutral particles, 0000 (4 November 1994); doi: 10.1117/12.192117
Proc. SPIE 2253, Reduction of absorption losses in ion beam sputter deposition of optical coatings for the visible and near infrared, 0000 (4 November 1994); doi: 10.1117/12.192118
Proc. SPIE 2253, Molecular beam deposition of fluorides, 0000 (4 November 1994); doi: 10.1117/12.192119
Proc. SPIE 2253, Electron cyclotron resonance plasma chemical vapor deposition for rugate film manufacturing, 0000 (4 November 1994); doi: 10.1117/12.192121
Proc. SPIE 2253, Rugate filters for image projection in head-mounted displays, 0000 (4 November 1994); doi: 10.1117/12.192122
Proc. SPIE 2253, Laser protection devices based on multilayer coatings on polycarbonate substrates, 0000 (4 November 1994); doi: 10.1117/12.192123
Proc. SPIE 2253, Optical coatings on plastic lenses by PICVD-technique, 0000 (4 November 1994); doi: 10.1117/12.192124
Proc. SPIE 2253, Structural and chemical properties of thin films (Al2O3, ZrO2, BN) and multicomponent films (ZrO2, Ti) deposited by pulsed laser deposition, 0000 (4 November 1994); doi: 10.1117/12.192125
Proc. SPIE 2253, Single and multilayer coatings deposited by laser-assisted electron beam evaporation, 0000 (4 November 1994); doi: 10.1117/12.192126
Manufacturing Topics: Materials and Properties
Proc. SPIE 2253, Amorphous fluoropolymer: next generation optical coating candidate, 0000 (4 November 1994); doi: 10.1117/12.192127
Proc. SPIE 2253, Investigation of the preparation and properties of organic dye/metal oxide composite thin films, 0000 (4 November 1994); doi: 10.1117/12.192129
Proc. SPIE 2253, Correlation between structural, mechanical, and optical properties of ZnSe-MgF2 mixture thin films, 0000 (4 November 1994); doi: 10.1117/12.192130
Proc. SPIE 2253, Deposition and characterization of a-SiC:H thin films, 0000 (4 November 1994); doi: 10.1117/12.192131
Manufacturing Topics: Posters
Proc. SPIE 2253, Ion-assisted deposition of yttrium fluoride as a substitute for thorium fluoride: application to infrared antireflection coating on germanium, 0000 (4 November 1994); doi: 10.1117/12.192132
Proc. SPIE 2253, Ion-beam-assisted deposition of thermally evaporated Cr thin films, 0000 (4 November 1994); doi: 10.1117/12.192133
Proc. SPIE 2253, Film thickness and growth rate measurement by modulation of the interference of light in a plate, 0000 (4 November 1994); doi: 10.1117/12.192134
Proc. SPIE 2253, Low loss mirrors @ 514 nm for large interferometer optics, 0000 (4 November 1994); doi: 10.1117/12.192135
Nonoptical Characterization: Basic Techniques
Proc. SPIE 2253, Thin film morphology in TEM as revealed by heat-shock fracturing and replication of film cross sections, 0000 (4 November 1994); doi: 10.1117/12.192136
Proc. SPIE 2253, Investigation of the microstructure of coatings for high-power lasers by nonoptical techniques, 0000 (4 November 1994); doi: 10.1117/12.192138
Proc. SPIE 2253, Secondary neutral mass spectrometry (SNMS) depth profile analysis of optical coatings, 0000 (4 November 1994); doi: 10.1117/12.192139
Nonoptical Characterization: Structural and Mechanical Properties
Proc. SPIE 2253, Overlapping of roughness spectra measured in macroscopic (optical) and microscopic (AFM) bandwIDths, 0000 (4 November 1994); doi: 10.1117/12.192140
Proc. SPIE 2253, Surface topography restitution for rough thin film deposits, 0000 (4 November 1994); doi: 10.1117/12.192141
Proc. SPIE 2253, Modified floatation method as an accurate tool for determining the macroscopic mass density of optical interference coatings, 0000 (4 November 1994); doi: 10.1117/12.192142
Proc. SPIE 2253, Application of the Fourier transform in a preliminary analysis of the reflectivity curve obtained by grazing x-ray reflectometry, 0000 (4 November 1994); doi: 10.1117/12.192143
Proc. SPIE 2253, X-ray investigation of supersmooth surfaces, 0000 (4 November 1994); doi: 10.1117/12.192144
Nonoptical Characterization: Posters
Proc. SPIE 2253, Effects of near-surface transition layer on x-ray reflection and scattering, 0000 (4 November 1994); doi: 10.1117/12.192145
Proc. SPIE 2253, Study on the hardness of composite films prepared by ion-assisted co-evaporation process, 0000 (4 November 1994); doi: 10.1117/12.192146
Nonoptical Characterization: Structural and Mechanical Properties
Proc. SPIE 2253, Characterization of statistically rough surfaces of thin deposits by an autoregressive process, 0000 (4 November 1994); doi: 10.1117/12.192147
Nonoptical Characterization: Posters
Proc. SPIE 2253, Measurement of thermal conductivity in dielectric films by the thermal pulse method, 0000 (4 November 1994); doi: 10.1117/12.192148
Coatings for High-Power Lasers I
Proc. SPIE 2253, Resistance of coated optics to UV laser irradiation, 0000 (4 November 1994); doi: 10.1117/12.192149
Proc. SPIE 2253, Damage testing and characterization of dielectric coatings for high-power excimer lasers, 0000 (4 November 1994); doi: 10.1117/12.192150
Proc. SPIE 2253, Influence of defect shape on laser-induced damage in multilayer coatings, 0000 (4 November 1994); doi: 10.1117/12.192151
Proc. SPIE 2253, Damage of mirrors under high-power continuous wave CO2 laser irradiation: threshold and aging, 0000 (4 November 1994); doi: 10.1117/12.192152
Coatings for High-Power Lasers II
Proc. SPIE 2253, Optical thin films from the sol-gel process, 0000 (4 November 1994); doi: 10.1117/12.192153