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Effects of resist strip processing damage on the electrical characteristics of 0.8-um a-Si antifuse circuit elements
Effects of P+-implanted poly-Si gate with and without TiSi2 on the injection degradation of thin film oxides
Characterization and modeling of base current in n-p-n polysilicon emitter bipolar transistors using low-frequency noise analysis
Reliability improvement of integrated circuits through alkali contamination reduction in dielectric films