PROCEEDINGS VOLUME 2340
INTERNATIONAL CONFERENCE ON INTERFEROMETRY '94 | 16-20 MAY 1994
Interferometry '94: New Techniques and Analysis in Optical Measurements
INTERNATIONAL CONFERENCE ON INTERFEROMETRY '94
16-20 May 1994
Warsaw, Poland
Challenging Problems and New Approaches
Proc. SPIE 2340, Matter-wave/atom interferometry, 0000 (12 December 1994); doi: 10.1117/12.195895
Proc. SPIE 2340, Spatio-temporal heterodyne interferometry and generation of virtual wavefronts by space-time degeneracy, 0000 (12 December 1994); doi: 10.1117/12.195906
Proc. SPIE 2340, Real-time fringe analyzer and its applications to active optics, 0000 (12 December 1994); doi: 10.1117/12.195917
Proc. SPIE 2340, Applying backpropagation neural networks to fringe analysis, 0000 (12 December 1994); doi: 10.1117/12.195928
Proc. SPIE 2340, Deformation studies with BaTiO3 Crystal as a recording medium, 0000 (12 December 1994); doi: 10.1117/12.195939
Proc. SPIE 2340, Interferometer with two-frequency phase modulation, 0000 (12 December 1994); doi: 10.1117/12.195950
Proc. SPIE 2340, Single electron characteristics of detectors with avalanche multiplication of electrons, 0000 (12 December 1994); doi: 10.1117/12.195957
Proc. SPIE 2340, Optically heterodyned polarization interferometry of initially isotropic media: generalizations and new effects, 0000 (12 December 1994); doi: 10.1117/12.195958
Proc. SPIE 2340, Simulation of interferometric fringe patterns by means of a flexible computer program, 0000 (12 December 1994); doi: 10.1117/12.195959
Proc. SPIE 2340, Measuring accuracy of phase-shifting phase-conjugate interferometers, 0000 (12 December 1994); doi: 10.1117/12.195896
Proc. SPIE 2340, Universal interferometer with synthesized reference wave, 0000 (12 December 1994); doi: 10.1117/12.195897
Proc. SPIE 2340, Diffraction stability of fragments of polarization and phase images, 0000 (12 December 1994); doi: 10.1117/12.195898
Proc. SPIE 2340, Software tools for optical radiation intensity analysis, 0000 (12 December 1994); doi: 10.1117/12.195899
Automatic Fringe Pattern Analysis
Proc. SPIE 2340, New methods for unwrapping noisy phase maps, 0000 (12 December 1994); doi: 10.1117/12.195900
Proc. SPIE 2340, Applications of recently improved electronic speckle pattern interferometry by addition of incremental images, 0000 (12 December 1994); doi: 10.1117/12.195901
Proc. SPIE 2340, 3D imaging using projected dynamic fringes, 0000 (12 December 1994); doi: 10.1117/12.195902
Proc. SPIE 2340, High-speed fringe analysis method using frequency demodulation technology, 0000 (12 December 1994); doi: 10.1117/12.195903
Proc. SPIE 2340, Iterative method for interferogram processing, 0000 (12 December 1994); doi: 10.1117/12.195904
Proc. SPIE 2340, Computer-aided generation of speckle pattern in digital images, 0000 (12 December 1994); doi: 10.1117/12.195905
Proc. SPIE 2340, Two-directional spatial-carrier phase-shifting method for analysis of complex interferograms, 0000 (12 December 1994); doi: 10.1117/12.195907
Proc. SPIE 2340, Errors in spatial phase-stepping techniques, 0000 (12 December 1994); doi: 10.1117/12.195908
Proc. SPIE 2340, Statistical properties of computer-generated speckle pattern, 0000 (12 December 1994); doi: 10.1117/12.195909
Proc. SPIE 2340, Computer-aided analysis of endoscopic fringe pattern images, 0000 (12 December 1994); doi: 10.1117/12.195910
Applications
Proc. SPIE 2340, Spatial carrier analysis of interferograms with aspheric wavefronts, 0000 (12 December 1994); doi: 10.1117/12.195911
Proc. SPIE 2340, Range measurements using moire contouring, 0000 (12 December 1994); doi: 10.1117/12.195912
Proc. SPIE 2340, Gradient operators for extracting the derivative of a function described by an interferometric fringe field, 0000 (12 December 1994); doi: 10.1117/12.195913
Proc. SPIE 2340, Measurement of absolute object deformations by means of two-wavelength electronic speckle pattern interferometry (ESPI), 0000 (12 December 1994); doi: 10.1117/12.195914
Proc. SPIE 2340, Optical measurement of solder bonds on printed circuit boards, 0000 (12 December 1994); doi: 10.1117/12.195915
Proc. SPIE 2340, Diagnostic controlled interferometer with laser diode, 0000 (12 December 1994); doi: 10.1117/12.195916
Interferometric Testing I: Nonconventional Optical Elements
Proc. SPIE 2340, Absolute interferometric testing of cylindraical surfaces, 0000 (12 December 1994); doi: 10.1117/12.195918
Proc. SPIE 2340, Mach Zehnder interferometer for measuring microlenses, 0000 (12 December 1994); doi: 10.1117/12.195919
Proc. SPIE 2340, Quality control of microlens array, 0000 (12 December 1994); doi: 10.1117/12.195920
Proc. SPIE 2340, Beam shaping in large spectral band for interferometric systems, 0000 (12 December 1994); doi: 10.1117/12.195921
Proc. SPIE 2340, New modification of Hindle scheme for interferometric testing of convex hyperbolical surfaces, 0000 (12 December 1994); doi: 10.1117/12.195922
Interferometric Testing II
Proc. SPIE 2340, Imaging problems in interferometric systems, 0000 (12 December 1994); doi: 10.1117/12.195923
Proc. SPIE 2340, Recent developments in absolute interferometric testing of flats, 0000 (12 December 1994); doi: 10.1117/12.195924
Proc. SPIE 2340, Interferometric testing of large optic surfaces and systems by holographic optical elements, 0000 (12 December 1994); doi: 10.1117/12.195925
Proc. SPIE 2340, Distortion testing of interferometer for flatness standard measurement, 0000 (12 December 1994); doi: 10.1117/12.195926
Proc. SPIE 2340, Method of oblique-incidence interferogram "sewing" by three base points, 0000 (12 December 1994); doi: 10.1117/12.195927
Proc. SPIE 2340, Improved collimation testing with a multiple beam wedge plate lateral shear interferometer, 0000 (12 December 1994); doi: 10.1117/12.195929
Optical Measurement: Laser Diode and Polychromatic Light Metrology
Proc. SPIE 2340, Recent progress in white-light interferometry, 0000 (12 December 1994); doi: 10.1117/12.195930
Proc. SPIE 2340, Laser diode for interferometric applications, 0000 (12 December 1994); doi: 10.1117/12.195931
Proc. SPIE 2340, Multifunction wavelength-shift interferometry: absolute distance and velocity measurements, 0000 (12 December 1994); doi: 10.1117/12.195932
Proc. SPIE 2340, Profilometry by spectral encoding of the optical axis, 0000 (12 December 1994); doi: 10.1117/12.195933
Proc. SPIE 2340, Dispersive white-light profilometer, 0000 (12 December 1994); doi: 10.1117/12.195934
Proc. SPIE 2340, Laser diode wavefronts and waveguide parameters: interferometric measurements, 0000 (12 December 1994); doi: 10.1117/12.195935
Optical Measurement: General
Proc. SPIE 2340, Laser profilometer-distance meter, 0000 (12 December 1994); doi: 10.1117/12.195936
Proc. SPIE 2340, Grating interferometer with reconstructed wave of comparison, 0000 (12 December 1994); doi: 10.1117/12.195937
Proc. SPIE 2340, Three-channel laser interferometric refractometer, 0000 (12 December 1994); doi: 10.1117/12.195938
Proc. SPIE 2340, Examination of influence of fringe field parameters on accuracy of velocity measurements of digital laser anemometer, 0000 (12 December 1994); doi: 10.1117/12.195940
Proc. SPIE 2340, Method of measuring small periodical movements involving laser interferometry, 0000 (12 December 1994); doi: 10.1117/12.195941
Proc. SPIE 2340, Simple CCD-based wavemeter, 0000 (12 December 1994); doi: 10.1117/12.195942
Proc. SPIE 2340, Visualization of topography of the crater appearing during laser treatment of the metal sample, 0000 (12 December 1994); doi: 10.1117/12.195943
Proc. SPIE 2340, Furniture ergonomics studies by the projection moire method, 0000 (12 December 1994); doi: 10.1117/12.195944
Proc. SPIE 2340, Computer-aided postural deformity studies using moire and grid projection methods, 0000 (12 December 1994); doi: 10.1117/12.195945
Proc. SPIE 2340, Optical testing of commutator, 0000 (12 December 1994); doi: 10.1117/12.195946
Holographic and Speckle Metrology
Proc. SPIE 2340, Holographic investigation of the dynamics of crater growth during laser treatment transparent dielectric, 0000 (12 December 1994); doi: 10.1117/12.195947
Proc. SPIE 2340, Holographic reference glass for surface planeness testing, 0000 (12 December 1994); doi: 10.1117/12.195948
Proc. SPIE 2340, Holographic interference microscope technique in liquid transport and surface phenomena, 0000 (12 December 1994); doi: 10.1117/12.195949