PROCEEDINGS VOLUME 2349
PHOTONICS FOR INDUSTRIAL APPLICATIONS | OCT 31 - NOV 4 1994
Industrial Optical Sensors for Metrology and Inspection
IN THIS VOLUME

0 Sessions, 31 Papers, 0 Presentations
PHOTONICS FOR INDUSTRIAL APPLICATIONS
Oct 31 - Nov 4 1994
Boston, MA, United States
Sensors and Measurement Technology
Proc. SPIE 2349, Recent advances in laser triangulation-based measurement of airfoil surfaces, 0000 (4 January 1995); doi: 10.1117/12.198670
Proc. SPIE 2349, Role of diode lasers in metrology, 0000 (4 January 1995); doi: 10.1117/12.198681
Proc. SPIE 2349, Extrinsic calibration of single-scanline range sensor, 0000 (4 January 1995); doi: 10.1117/12.198696
Proc. SPIE 2349, Precision laser triangulation range sensor with double detectors for measurement on CMMs, 0000 (4 January 1995); doi: 10.1117/12.198697
Proc. SPIE 2349, Detecting rolling element bearing defects with the optical incremental motion encoder, 0000 (4 January 1995); doi: 10.1117/12.198698
Proc. SPIE 2349, Multi-electrode circular position-sensitive device (PSD) and its application to angular measurement, 0000 (4 January 1995); doi: 10.1117/12.198699
Proc. SPIE 2349, Development of fiber optic gyroscopes for industrial and consumer applications, 0000 (4 January 1995); doi: 10.1117/12.198700
Interferometry Methods and Applications
Proc. SPIE 2349, Simultaneous materials evaluation with both electronic shearography and infrared nondestructive evaluation, 0000 (4 January 1995); doi: 10.1117/12.198671
Proc. SPIE 2349, Evaluating laser shearography for nondestructive testing at the Kennedy Space Center, 0000 (4 January 1995); doi: 10.1117/12.198672
Proc. SPIE 2349, Nonholographic uses of a holographic image processing computer, 0000 (4 January 1995); doi: 10.1117/12.198673
Proc. SPIE 2349, Single-beam adaptive holographic interferometry (AHI) and small-size devices for industrial inspection, 0000 (4 January 1995); doi: 10.1117/12.198674
Proc. SPIE 2349, Optical methods for spatial noise removal in interferometry, 0000 (4 January 1995); doi: 10.1117/12.198675
Proc. SPIE 2349, Considerations in design of a multimode fiber-linked white light interferometer, 0000 (4 January 1995); doi: 10.1117/12.198676
Proc. SPIE 2349, Tunable laser sources for absolute optical interferometry, 0000 (4 January 1995); doi: 10.1117/12.198677
Proc. SPIE 2349, Calibration of optical probe instruments for the measurement of surface microtopography, 0000 (4 January 1995); doi: 10.1117/12.198678
Proc. SPIE 2349, New optical stylus sensor, 0000 (4 January 1995); doi: 10.1117/12.198679
Proc. SPIE 2349, Novel technique of interferometric optical fiber sensing, 0000 (4 January 1995); doi: 10.1117/12.198680
Process Control Applications
Proc. SPIE 2349, Laser-induced fluorescence lifetime measurement, 0000 (4 January 1995); doi: 10.1117/12.198682
Proc. SPIE 2349, LED-based digital diameter measurement, 0000 (4 January 1995); doi: 10.1117/12.198683
Proc. SPIE 2349, Optical real-time fractal sensor for industrial texture analysis, 0000 (4 January 1995); doi: 10.1117/12.198684
Proc. SPIE 2349, Concurrent particle counter based on laser scattering techniques, 0000 (4 January 1995); doi: 10.1117/12.198685
Proc. SPIE 2349, Design of a commercial optical instrument for surface roughness measurement, 0000 (4 January 1995); doi: 10.1117/12.198686
Poster Session
Proc. SPIE 2349, Surface quality inspection by using the contact and light procedures, 0000 (4 January 1995); doi: 10.1117/12.198687
Proc. SPIE 2349, Gas detection using polymeric light-guiding films, 0000 (4 January 1995); doi: 10.1117/12.198688
Proc. SPIE 2349, Latest photoelectric conversion-type angle-measuring instrument with high precision, 0000 (4 January 1995); doi: 10.1117/12.198689
Proc. SPIE 2349, Infrared vision techniques in quality control of surface-mount circuit board solder paste printing, 0000 (4 January 1995); doi: 10.1117/12.198690
Proc. SPIE 2349, Real-time vision-based detection of wire gapping on a rotating transformer core, 0000 (4 January 1995); doi: 10.1117/12.198691
Proc. SPIE 2349, Research on enhancing in-process measuring system precision of ultraprecision turning machine, 0000 (4 January 1995); doi: 10.1117/12.198692
Proc. SPIE 2349, Image processing photosensor for robots, 0000 (4 January 1995); doi: 10.1117/12.198693
Proc. SPIE 2349, Computer-aided measurement of thread accuracy with a toolmaker's microscope, 0000 (4 January 1995); doi: 10.1117/12.198694
Interferometry Methods and Applications
Proc. SPIE 2349, Phase measurement using a liquid crystal point diffraction interferometer, 0000 (4 January 1995); doi: 10.1117/12.198695
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