PROCEEDINGS VOLUME 2428
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1994 | 24-26 OCTOBER 1994
Laser-Induced Damage in Optical Materials: 1994
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1994
24-26 October 1994
Boulder, CO, United States
Materials and Measurements
Proc. SPIE 2428, Investigation of Fullerenes for optoelectronic and photonic applications, 0000 (14 July 1995); doi: 10.1117/12.213699
Proc. SPIE 2428, Materials characterization, optical spectroscopy, and laser damage studies of electrochromically and photochromically damaged KTiOPO4 (KTP), 0000 (14 July 1995); doi: 10.1117/12.213710
Proc. SPIE 2428, Damage thresholds of nonlinear crystals used for optical parametric oscillators, 0000 (14 July 1995); doi: 10.1117/12.213721
Surfaces and Mirrors
Proc. SPIE 2428, Removal of dust particles from metal-mirror surfaces by excimer-laser radiation, 0000 (14 July 1995); doi: 10.1117/12.213732
Materials and Measurements
Proc. SPIE 2428, Diagnostics for the detection and evaluation of laser-induced damage, 0000 (14 July 1995); doi: 10.1117/12.213743
Proc. SPIE 2428, Scanning probe microscope analysis of optical thin films, 0000 (14 July 1995); doi: 10.1117/12.213754
Fundamental Mechanisms
Proc. SPIE 2428, Calculation of uncertainty in laser-damage thresholds determined by use of the damage-frequency method, 0000 (14 July 1995); doi: 10.1117/12.213765
Materials and Measurements
Proc. SPIE 2428, Photo-induced changes in optical parameters of silicate glasses multiphoton laser radiation absorption, 0000 (14 July 1995); doi: 10.1117/12.213775
Surfaces and Mirrors
Proc. SPIE 2428, Progress in ion figuring large optics, 0000 (14 July 1995); doi: 10.1117/12.213776
Proc. SPIE 2428, Degradation of optical components in laser machines for manufacturing, 0000 (14 July 1995); doi: 10.1117/12.213700
Proc. SPIE 2428, Role of transfer phenomena in laser formation of periodic structures, 0000 (14 July 1995); doi: 10.1117/12.213701
Proc. SPIE 2428, Preparation of random-phase plates for laser-beam smoothing, 0000 (14 July 1995); doi: 10.1117/12.213702
Minisymposium: Diamond for Optics Applications in Adverse Environments
Proc. SPIE 2428, Promise of diamond optics, 0000 (14 July 1995); doi: 10.1117/12.213703
Proc. SPIE 2428, Diamond windows in a thermal-shock environment, 0000 (14 July 1995); doi: 10.1117/12.213704
Proc. SPIE 2428, Summary of laser damage data for diamond, 0000 (14 July 1995); doi: 10.1117/12.213705
Proc. SPIE 2428, Optical nonlinearities in diamond, 0000 (14 July 1995); doi: 10.1117/12.213706
Proc. SPIE 2428, High-temperature thermal and electrical conductivities of diamond and diamond films, 0000 (14 July 1995); doi: 10.1117/12.213707
Proc. SPIE 2428, Nanocrystalline diamond films: new material for IR optics, 0000 (14 July 1995); doi: 10.1117/12.213708
Proc. SPIE 2428, Issues associated with the use of diamond as a high-power optical material, 0000 (14 July 1995); doi: 10.1117/12.213709
Proc. SPIE 2428, Diamond for high-heat-load synchrotron x-ray applications, 0000 (14 July 1995); doi: 10.1117/12.213711
Thin Films
Proc. SPIE 2428, High-reflectance coatings and materials for the extreme ultraviolet, 0000 (14 July 1995); doi: 10.1117/12.213712
Proc. SPIE 2428, New insight into defect-induced laser damage in UV multilayer coatings, 0000 (14 July 1995); doi: 10.1117/12.213713
Proc. SPIE 2428, Very high laser damage resistant HR-coatings prepared by an advanced sputtering technique, 0000 (14 July 1995); doi: 10.1117/12.213714
Proc. SPIE 2428, Damage fluence at 1054 nm and 351 nm of coatings made with hafnium oxide evaporated from metallic hafnium, 0000 (14 July 1995); doi: 10.1117/12.213715
Proc. SPIE 2428, Growth and characterization of laser-ablated boron nitride thin films, 0000 (14 July 1995); doi: 10.1117/12.213716
Proc. SPIE 2428, Development of plasma-enhanced CVD for multilayer mirror coatings, 0000 (14 July 1995); doi: 10.1117/12.213717
Proc. SPIE 2428, Failure characterization of nodular defects in multilayer dielectric coatings, 0000 (14 July 1995); doi: 10.1117/12.213718
Proc. SPIE 2428, Measurements of the temporal response of vanadium oxide thin films in the infrared, 0000 (14 July 1995); doi: 10.1117/12.213719
Proc. SPIE 2428, Study of crystalline and stress behavior in oxide films prepared by ion-assisted deposition, 0000 (14 July 1995); doi: 10.1117/12.213720
By Title Only
Proc. SPIE 2428, Measurement of optical coating LIDT vs. their ion milling deposition parameters, 0000 (14 July 1995); doi: 10.1117/12.213722
Fundamental Mechanisms
Proc. SPIE 2428, Laser-induced breakdown as a function of pulse duration: from 7 ns to 150 fs, 0000 (14 July 1995); doi: 10.1117/12.213723
Proc. SPIE 2428, Enhancement factors for local electric fields in inhomogeneous media, 0000 (14 July 1995); doi: 10.1117/12.213724
Proc. SPIE 2428, Polarization state of sharply-focused light beam, 0000 (14 July 1995); doi: 10.1117/12.213725
Proc. SPIE 2428, Ultraviolet damage properties of various fused silica materials, 0000 (14 July 1995); doi: 10.1117/12.213726
Proc. SPIE 2428, Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses II: theory, 0000 (14 July 1995); doi: 10.1117/12.213727
Proc. SPIE 2428, Role of laser radiation statistics in the measurement of basic regularities of optical breakdown of glasses, 0000 (14 July 1995); doi: 10.1117/12.213728
Proc. SPIE 2428, Limiting laser-induced damage in a high-repetition rate CO2 laser chain, 0000 (14 July 1995); doi: 10.1117/12.213729
Materials and Measurements
Proc. SPIE 2428, Development of an optical parametric oscillator damage test facility, 0000 (14 July 1995); doi: 10.1117/12.213730
Fundamental Mechanisms
Proc. SPIE 2428, Determination of minimal test sample size for high-accuracy laser damage testing, 0000 (14 July 1995); doi: 10.1117/12.213731
Materials and Measurements
Proc. SPIE 2428, Total internal reflection microscopy (TIRM) as a nondestructive subsurface damage assessment tool, 0000 (14 July 1995); doi: 10.1117/12.213733
Proc. SPIE 2428, Reduction in fiber damage thresholds due to static fatigue, 0000 (14 July 1995); doi: 10.1117/12.213734
Proc. SPIE 2428, Accelerated GLAS exposure station, 0000 (14 July 1995); doi: 10.1117/12.213735
Proc. SPIE 2428, Mechanisms of contamination-induced optical damage in lasers, 0000 (14 July 1995); doi: 10.1117/12.213736
Proc. SPIE 2428, Increase of the laser damage threshold of KDP single crystals by their heat treatment, 0000 (14 July 1995); doi: 10.1117/12.213737
Proc. SPIE 2428, Effect of polyvalent elements impurities on the value of bulk laser damage threshold and UV absorption of KDP single crystals, 0000 (14 July 1995); doi: 10.1117/12.213738
Surfaces and Mirrors
Proc. SPIE 2428, Behavior of laser-induced emission intensity versus laser power density during breakdown of optical materials, 0000 (14 July 1995); doi: 10.1117/12.213739
Materials and Measurements
Proc. SPIE 2428, Photoacoustic characterization of optical laser components for 10.6 um, 0000 (14 July 1995); doi: 10.1117/12.213740
Proc. SPIE 2428, Photothermal characterization of optical laser components at 10.6 um, 0000 (14 July 1995); doi: 10.1117/12.213741
Proc. SPIE 2428, Absorption measurement of thin films by using photothermal techniques: the influence of thermal properties, 0000 (14 July 1995); doi: 10.1117/12.213742
Surfaces and Mirrors
Proc. SPIE 2428, Optical characteristics and damage thresholds of low loss mirrors, 0000 (14 July 1995); doi: 10.1117/12.213744
Materials and Measurements
Proc. SPIE 2428, Absorption of ArF-, KrF-, and Xef-laser radiation in optical materials at the moment of E-beam influence, 0000 (14 July 1995); doi: 10.1117/12.213745
Proc. SPIE 2428, Highly damage resistant cavity optics for excimer lasers, 0000 (14 July 1995); doi: 10.1117/12.213746
Proc. SPIE 2428, Picosecond photoconductivity of natural and CVD diamonds, 0000 (14 July 1995); doi: 10.1117/12.213747
Proc. SPIE 2428, Electron-beam-induced current study of gallium nitride and diamond materials, 0000 (14 July 1995); doi: 10.1117/12.213748
Fundamental Mechanisms
Proc. SPIE 2428, Laser-induced damage to diamond: dielectric breakdown and BHG scaling, 0000 (14 July 1995); doi: 10.1117/12.213749
Thin Films
Proc. SPIE 2428, Characterization of aluminum nitride thin films grown by plasma source molecular-beam epitaxy, 0000 (14 July 1995); doi: 10.1117/12.213750
Materials and Measurements
Proc. SPIE 2428, Laser-induced damage in optical materials under UV excimer laser radiation, 0000 (14 July 1995); doi: 10.1117/12.213751
Proc. SPIE 2428, Silica with high resistance to excimer laser, 0000 (14 July 1995); doi: 10.1117/12.213752