PROCEEDINGS VOLUME 2576
INTERNATIONAL CONFERENCES ON OPTICAL FABRICATION AND TESTING AND APPLICATIONS OF OPTICAL HOLOGRAPHY | 5-7 JUNE 1995
International Conference on Optical Fabrication and Testing
IN THIS VOLUME

0 Sessions, 49 Papers, 0 Presentations
Cutting I  (2)
Grinding  (7)
Devices  (3)
Cutting II  (5)
INTERNATIONAL CONFERENCES ON OPTICAL FABRICATION AND TESTING AND APPLICATIONS OF OPTICAL HOLOGRAPHY
5-7 June 1995
Tokyo, Japan
Cutting I
Proc. SPIE 2576, Recent achievements in closing the loop in interferometric tool setting on a pneumo-precision MSG325 diamond-turning lathe, 0000 (2 August 1995); doi: 10.1117/12.215585
Proc. SPIE 2576, Influence of material removal models on the dynamics of cutting and grinding machines, 0000 (2 August 1995); doi: 10.1117/12.215592
Grinding
Proc. SPIE 2576, Ultraprecision grinding of optical materials and components applying ELID (electrolytic in-process dressing), 0000 (2 August 1995); doi: 10.1117/12.215603
Proc. SPIE 2576, Characterization of fine abrasive particles for optical fabrication, 0000 (2 August 1995); doi: 10.1117/12.215607
Proc. SPIE 2576, Observation and analysis of grinding scratch generation around the central part of a component, 0000 (2 August 1995); doi: 10.1117/12.215616
Proc. SPIE 2576, Dynamic model for microgrinding spherical optical surfaces, 0000 (2 August 1995); doi: 10.1117/12.215623
Proc. SPIE 2576, Shear-mode grinding force criteria of Zerodur and Pyrex, 0000 (2 August 1995); doi: 10.1117/12.215627
Proc. SPIE 2576, Optics manufacturing: mechanics and materials issues, 0000 (2 August 1995); doi: 10.1117/12.215579
Proc. SPIE 2576, New mirror-finish surface-grinding technology for the fabrication of optical device endfaces, 0000 (2 August 1995); doi: 10.1117/12.215580
Devices
Proc. SPIE 2576, Soft x-ray optics for synchrotron radiation, 0000 (2 August 1995); doi: 10.1117/12.215581
Proc. SPIE 2576, Optical approach for LCD inspection, 0000 (2 August 1995); doi: 10.1117/12.215582
Proc. SPIE 2576, High-speed glass-molding method to mass produce precise optics, 0000 (2 August 1995); doi: 10.1117/12.215583
Surface Testing II
Proc. SPIE 2576, Precise measurements of refractive index distribution and optical surfaces, 0000 (2 August 1995); doi: 10.1117/12.215584
Surface Testing I
Proc. SPIE 2576, Computerized interferometric measurement of surface microstructure, 0000 (2 August 1995); doi: 10.1117/12.215586
Proc. SPIE 2576, Influence of surface skewness on the zero-order light scatter for a given roughness, 0000 (2 August 1995); doi: 10.1117/12.215587
Surface Testing II
Proc. SPIE 2576, Scattering effects from residual optical fabrication errors, 0000 (2 August 1995); doi: 10.1117/12.215588
Surface Testing I
Proc. SPIE 2576, Quantitative surface evaluation using a synchronous Nomarski microscope, 0000 (2 August 1995); doi: 10.1117/12.215589
Surface Testing II
Proc. SPIE 2576, Lateral and vertical dimension measurements by using laser scanning microscopy including an optical heterodyne function, 0000 (2 August 1995); doi: 10.1117/12.215590
Measurement for Fabrication II
Proc. SPIE 2576, Indicatrix measurement based on birefringence retardation using phase modulation technology, 0000 (2 August 1995); doi: 10.1117/12.215591
Figure Testing I
Proc. SPIE 2576, Aspherical wavefront testing with several defocusing steps, 0000 (2 August 1995); doi: 10.1117/12.215593
Measurement for Fabrication II
Proc. SPIE 2576, Technique of recording and judging the sign of tilt in one interferogram, 0000 (2 August 1995); doi: 10.1117/12.215594
Figure Testing I
Proc. SPIE 2576, Absolute measurement of spherical surfaces using phase-conjugate waves, 0000 (2 August 1995); doi: 10.1117/12.215595
Figure Testing II
Proc. SPIE 2576, Considerations on the interferometric testing of convex hyperboloidal surfaces, 0000 (2 August 1995); doi: 10.1117/12.215596
Proc. SPIE 2576, Testing the 8.3-meter telescope optics, 0000 (2 August 1995); doi: 10.1117/12.215597
Measurement for Fabrication I
Proc. SPIE 2576, Light source with orthogonally linear polarized two-frequency beam from laser diode and its application, 0000 (2 August 1995); doi: 10.1117/12.215598
Measurement for Fabrication II
Proc. SPIE 2576, Interferometers without fringe patterns, 0000 (2 August 1995); doi: 10.1117/12.215599
Measurement for Fabrication I
Proc. SPIE 2576, Sinusoidal phase-modulating laser diode interferometer using a self-pumped phase-conjugate mirror, 0000 (2 August 1995); doi: 10.1117/12.215600
Figure Testing II
Proc. SPIE 2576, Testing of progressive spectacle lenses by coded optical correlation, 0000 (2 August 1995); doi: 10.1117/12.215601
Measurement for Fabrication II
Proc. SPIE 2576, Straightness measurement using laser beam straight datum, 0000 (2 August 1995); doi: 10.1117/12.215602
Measurement for Fabrication I
Proc. SPIE 2576, Use of power spectral density (PSD) functions in specifying optics for the National Ignition Facility, 0000 (2 August 1995); doi: 10.1117/12.215604
Figure Testing II
Proc. SPIE 2576, Parabolic liquid mirrors: reference surfaces in interferometry, 0000 (2 August 1995); doi: 10.1117/12.215605
Measurement for Fabrication I
Proc. SPIE 2576, Fabrication of a highly variable curvature mirror: testing and results, 0000 (2 August 1995); doi: 10.1117/12.215606
Figure Testing II
Proc. SPIE 2576, Interferometry for measuring large aspherical surfaces with holographic optical elements made by two steps, 0000 (2 August 1995); doi: 10.1117/12.215608
Measurement for Fabrication I
Proc. SPIE 2576, Applications of computer-generated holograms for interferometric measurement of large aspheric optics, 0000 (2 August 1995); doi: 10.1117/12.215609
Figure Testing I
Proc. SPIE 2576, Common path interferometer for flat surface measurement, 0000 (2 August 1995); doi: 10.1117/12.215610
Figure Testing II
Proc. SPIE 2576, Toroidal surfaces compared with spherocylindrical surfaces, 0000 (2 August 1995); doi: 10.1117/12.215611
Polishing and Processing
Proc. SPIE 2576, Super-smooth polishing on aspherical surfaces (I): high-precision coordinate measuring and polishing systems, 0000 (2 August 1995); doi: 10.1117/12.215612
Proc. SPIE 2576, Super-smooth polishing on aspherical surfaces (II): achievement of a super-smooth polishing, 0000 (2 August 1995); doi: 10.1117/12.215613
Proc. SPIE 2576, Fabrication and characterization of optical super-smooth surfaces, 0000 (2 August 1995); doi: 10.1117/12.215614
Proc. SPIE 2576, Influence of polishing fluid on ultrasmoothness polishing of Al-Mg alloy plate, 0000 (2 August 1995); doi: 10.1117/12.215615
Proc. SPIE 2576, Magnetorheological finishing: a deterministic process for optics manufacturing, 0000 (2 August 1995); doi: 10.1117/12.215617
Proc. SPIE 2576, Optomechanical switches for fiber optic communication systems, 0000 (2 August 1995); doi: 10.1117/12.215618
Cutting II
Proc. SPIE 2576, Molecular dynamics analysis on microstructure of diamond-turned surfaces, 0000 (2 August 1995); doi: 10.1117/12.215619
Proc. SPIE 2576, Flatness and surface roughness of diamond-turned surface, 0000 (2 August 1995); doi: 10.1117/12.215620
Proc. SPIE 2576, Ultrasonic vibration turning of optical plastics, 0000 (2 August 1995); doi: 10.1117/12.215621
Proc. SPIE 2576, Assessment of the precision and cost effectiveness of direct machining hybrid type optical surfaces for IR applications, 0000 (2 August 1995); doi: 10.1117/12.215622
Proc. SPIE 2576, Behavior of various cracks in the machining of glass, 0000 (2 August 1995); doi: 10.1117/12.215624
Surface Testing II
Proc. SPIE 2576, Optical metrology for small zone measurement, 0000 (2 August 1995); doi: 10.1117/12.215625
Figure Testing I
Proc. SPIE 2576, Analysis of the measurement range in Fizeau phase-stepping interferometry using the moire effect, 0000 (2 August 1995); doi: 10.1117/12.215626
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