PROCEEDINGS VOLUME 2599
PHOTONICS EAST '95 | 22-26 OCTOBER 1995
Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology
PHOTONICS EAST '95
22-26 October 1995
Philadelphia, PA, United States
3D Methods I
Proc. SPIE 2599, New highly efficient binary codes for structured light methods, 0000 (19 January 1996); doi: 10.1117/12.230368
Proc. SPIE 2599, Real-time computation of depth from defocus, 0000 (19 January 1996); doi: 10.1117/12.230388
Proc. SPIE 2599, Applications of noncontacting surface measurement in micromechanics, 0000 (19 January 1996); doi: 10.1117/12.230396
Proc. SPIE 2599, Measuring corrosion using field-shifting moire interferometry, 0000 (19 January 1996); doi: 10.1117/12.230403
3D Methods II
Proc. SPIE 2599, Absolute and relative range measurement with a single optical system, 0000 (19 January 1996); doi: 10.1117/12.230404
Proc. SPIE 2599, Polarization phase-based method for material classification and object recognition in computer vision, 0000 (19 January 1996); doi: 10.1117/12.230405
Proc. SPIE 2599, Novel passive-ranging method using pixel dither, 0000 (19 January 1996); doi: 10.1117/12.230406
Proc. SPIE 2599, Real-time polarization laser radar, 0000 (19 January 1996); doi: 10.1117/12.230407
3D Models and Errors
Proc. SPIE 2599, Automatically planning the inspection of three-dimensional objects using stereo computer vision, 0000 (19 January 1996); doi: 10.1117/12.230369
Proc. SPIE 2599, Imaging geometry and error sensitivity in triangulation-based optical receivers, 0000 (19 January 1996); doi: 10.1117/12.230370
Active 3D Imaging Systems
Proc. SPIE 2599, Online 3D sensor for accurate measurement of complex surface areas and volume, 0000 (19 January 1996); doi: 10.1117/12.230371
Proc. SPIE 2599, Three-dimensional line-scan imaging system for robotic measurement, 0000 (19 January 1996); doi: 10.1117/12.230372
Proc. SPIE 2599, Three-dimensional imaging of engineering surfaces, 0000 (19 January 1996); doi: 10.1117/12.230373
Proc. SPIE 2599, Inspection machine using laser scanning for chip-mounted circuit boards, 0000 (19 January 1996); doi: 10.1117/12.230374
Proc. SPIE 2599, Optical system of an industrial 3D laser scanner for solder paste inspection, 0000 (19 January 1996); doi: 10.1117/12.230375
Proc. SPIE 2599, Sensor and control electronics for an industrial 3D laser scanner, 0000 (19 January 1996); doi: 10.1117/12.230376
Proc. SPIE 2599, 3D line-scan imaging with orthogonal symmetry, 0000 (19 January 1996); doi: 10.1117/12.230377
Micro-Measurements
Proc. SPIE 2599, Measurement of surface scratches on aircraft structures, 0000 (19 January 1996); doi: 10.1117/12.230378
Proc. SPIE 2599, Determination of the roughness-profile amplitude and wavelength: a facet model approach, 0000 (19 January 1996); doi: 10.1117/12.230379
Proc. SPIE 2599, 3D laser measurements on scattering and translucent surfaces, 0000 (19 January 1996); doi: 10.1117/12.230380
Proc. SPIE 2599, 3D microscope using diffraction grating, 0000 (19 January 1996); doi: 10.1117/12.230381
Proc. SPIE 2599, Intelligent acquisition routines (IAR) in surface microtopography, 0000 (19 January 1996); doi: 10.1117/12.230382
Proc. SPIE 2599, Holographic microinterferometric technique for measurements of laser diode cavity deformations, 0000 (19 January 1996); doi: 10.1117/12.230383
Active 3D Imaging Systems
Proc. SPIE 2599, Range finder based on laser space encoding, 0000 (19 January 1996); doi: 10.1117/12.230384
Multispectral and Hyperspectral Techniques
Proc. SPIE 2599, Application of hyperspectral-imaging spectrometer systems to industrial inspection, 0000 (19 January 1996); doi: 10.1117/12.230385
Proc. SPIE 2599, Intensified multispectral imaging using tunable filtering, 0000 (19 January 1996); doi: 10.1117/12.230386
Proc. SPIE 2599, Adaptive filtering and Hadamard transform imaging spectroscopy with an acousto-optic tunable filter (AOTF), 0000 (19 January 1996); doi: 10.1117/12.230387
Proc. SPIE 2599, Four-color pyrometry for metal emissivity characterization, 0000 (19 January 1996); doi: 10.1117/12.230389
Proc. SPIE 2599, Potential for the application of airborne hyperspectral remote-sensing techniques to industrial inspection, 0000 (19 January 1996); doi: 10.1117/12.230390
Industrial Imaging I
Proc. SPIE 2599, Object-oriented visual-inspection tool for ultrafine-pitch SMD components, 0000 (19 January 1996); doi: 10.1117/12.230391
Proc. SPIE 2599, Automatic measurement of cusps in 2.5D dental images, 0000 (19 January 1996); doi: 10.1117/12.230392
Proc. SPIE 2599, Massively parallel implementation of simulated annealing algorithms for image processing, 0000 (19 January 1996); doi: 10.1117/12.230393
Industrial Imaging II
Proc. SPIE 2599, Thermal-wave methods for nondestructive inspection and process control, 0000 (19 January 1996); doi: 10.1117/12.230394
Proc. SPIE 2599, Intensity measurement of automotive headlamps using a photometric vision system, 0000 (19 January 1996); doi: 10.1117/12.230395
Proc. SPIE 2599, Optical sensors and controls for improved basic oxygen furnace operations, 0000 (19 January 1996); doi: 10.1117/12.230397
Data Processing and Evaluation
Proc. SPIE 2599, Surface BRDF and texture of bricks, 0000 (19 January 1996); doi: 10.1117/12.230398
Proc. SPIE 2599, MTF as a figure of merit in visual surface inspection, 0000 (19 January 1996); doi: 10.1117/12.230399
Proc. SPIE 2599, Soil characteristics estimation from multispectral and multipolarization radar remote-sensing data, 0000 (19 January 1996); doi: 10.1117/12.230400
Proc. SPIE 2599, Optical integrated testing instrument for pipe interior-parameter measurement and inspection, 0000 (19 January 1996); doi: 10.1117/12.230401
3D Methods II
Proc. SPIE 2599, Polarization-based peak detection in laser triangulation-range sensors, 0000 (19 January 1996); doi: 10.1117/12.230402
Back to Top