PROCEEDINGS VOLUME 2648
INTERNATIONAL CONFERENCE ON OPTICAL DIAGNOSTICS OF MATERIALS AND DEVICES FOR OPTO-, MICRO-, AND QUANTUM ELECTRONICS | 11-13 MAY 1995
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
INTERNATIONAL CONFERENCE ON OPTICAL DIAGNOSTICS OF MATERIALS AND DEVICES FOR OPTO-, MICRO-, AND QUANTUM ELECTRONICS
11-13 May 1995
Kiev, Ukraine
Absorption and Reflection Spectroscopy
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, pg 2 (3 November 1995); doi: 10.1117/12.226126
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Interferometry and Nonlinear Optics Methods
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Luminescent Methods
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Optical Modulation Spectroscopy
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, pg 410 (3 November 1995); doi: 10.1117/12.226203
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Raman Scattering
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, pg 454 (3 November 1995); doi: 10.1117/12.226210
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Recording Materials and Equipment for Optical Nondestructive Testing
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