PROCEEDINGS VOLUME 2683
PHOTONICS WEST '96 | 27 JANUARY - 2 FEBRUARY 1996
Fabrication, Testing, and Reliability of Semiconductor Lasers
IN THIS VOLUME

0 Sessions, 17 Papers, 0 Presentations
PHOTONICS WEST '96
27 January - 2 February 1996
San Jose, CA, United States
Novel Devices and Fabrication Processes
Proc. SPIE 2683, Dual-wavelength laser by selective intermixing of GaAs/AlGaAs quantum wells, 0000 (10 April 1996); doi: 10.1117/12.237674
Proc. SPIE 2683, Effect of p-dopant positioning in low-threshold, InGaAs/GaAs/AlGaAs, MQW GRINSCH lasers with GaAs etch-stop layer for multiwavelength applications, 0000 (10 April 1996); doi: 10.1117/12.237687
Proc. SPIE 2683, Vertical-cavity surface-emitting lasers come of age, 0000 (10 April 1996); doi: 10.1117/12.237688
Proc. SPIE 2683, Advanced epitaxial growth and device processing techniques for ultrahigh-speed (>40 GHz) directly modulated semiconductor lasers, 0000 (10 April 1996); doi: 10.1117/12.237689
Proc. SPIE 2683, Plastic-molded package of AlGaInP laser apparatus, 0000 (10 April 1996); doi: 10.1117/12.237690
Device Testing and Reliability I
Proc. SPIE 2683, Physics and materials issues behind the lifetime problem in semiconductor lasers and light-emitting diodes, 0000 (10 April 1996); doi: 10.1117/12.237675
Proc. SPIE 2683, InGaAs/Ga(Al)As and Al-free 980-nm pump laser diodes: electro-optical properties and reliability issues, 0000 (10 April 1996); doi: 10.1117/12.237676
Proc. SPIE 2683, Power penalty due to timing jitter for lasers modulated without prebias, 0000 (10 April 1996); doi: 10.1117/12.237677
Device Testing and Reliability II
Proc. SPIE 2683, Life tests of Nichia AlGaN/InGaN/GaN blue-light-emitting diodes, 0000 (10 April 1996); doi: 10.1117/12.237678
Proc. SPIE 2683, Use of VCSEL arrays for parallel optical interconnects, 0000 (10 April 1996); doi: 10.1117/12.237679
Proc. SPIE 2683, VCSEL optical subassembly for avionics fiber optic modules, 0000 (10 April 1996); doi: 10.1117/12.237680
Proc. SPIE 2683, Reliability of proton-implanted VCSELs for data communications, 0000 (10 April 1996); doi: 10.1117/12.237681
Proc. SPIE 2683, Life-testing oxide-confined VCSELs: too good to last?, 0000 (10 April 1996); doi: 10.1117/12.237682
Proc. SPIE 2683, Analysis of VCSEL degradation modes, 0000 (10 April 1996); doi: 10.1117/12.237683
Poster Session
Proc. SPIE 2683, High-power diode lasers based on InGaAsP spacer and waveguide layers with AlGaAs cladding layers, 0000 (10 April 1996); doi: 10.1117/12.237684
Proc. SPIE 2683, High-power laser diodes at wavelength 1.06 um grown by MOCVD, 0000 (10 April 1996); doi: 10.1117/12.237685
Proc. SPIE 2683, Optical mirror facet strength of cw-operated separate confinement heterostructure laser diodes, 0000 (10 April 1996); doi: 10.1117/12.237686
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