PROCEEDINGS VOLUME 2703
PHOTONICS WEST '96 | JAN 27 - FEB 2 1996
Lasers as Tools for Manufacturing of Durable Goods and Microelectronics
PHOTONICS WEST '96
Jan 27 - Feb 2 1996
San Jose, CA, United States
UV Laser Source
Proc. SPIE 2703, UV FEL light source for industrial processing, 0000 (8 April 1996); doi: 10.1117/12.237725
UV Laser Optics I
Proc. SPIE 2703, Automated beam manipulation in UV laser systems, 0000 (8 April 1996); doi: 10.1117/12.237748
Proc. SPIE 2703, Practical consequences of matching real laser sources to target illumination requirements, 0000 (8 April 1996); doi: 10.1117/12.237757
Proc. SPIE 2703, Development of a stable external resonant ring-doubler for single-mode cw laser systems: optical design and product application, 0000 (8 April 1996); doi: 10.1117/12.237767
UV Laser Optics II
Proc. SPIE 2703, UV laser beam shaping by multifaceted beam integrators: fundamental principles and advanced design concepts, 0000 (8 April 1996); doi: 10.1117/12.237772
Poster Session
Proc. SPIE 2703, Durable optical coatings for energetic UV laser sources, 0000 (8 April 1996); doi: 10.1117/12.237715
UV Laser Optics II
Proc. SPIE 2703, Designing and fabricating of UV laser splitter, 0000 (8 April 1996); doi: 10.1117/12.237716
Process Monitoring I
Proc. SPIE 2703, Acoustic monitoring of modulated laser beam processing of metals, 0000 (8 April 1996); doi: 10.1117/12.237717
Welding I
Proc. SPIE 2703, Development of the plasma detecting system in CO2 laser welding, 0000 (8 April 1996); doi: 10.1117/12.237718
Process Monitoring I
Proc. SPIE 2703, Auto-oscillating ODMV plasma upon 500-W cw CO2 laser radiation exposure and influence on metal surface treatment, 0000 (8 April 1996); doi: 10.1117/12.237719
Process Monitoring II
Proc. SPIE 2703, Holographic imaging of laser penetration processing in transparent media: visualizing the temperature field in real time, 0000 (8 April 1996); doi: 10.1117/12.237720
Proc. SPIE 2703, Excimer laser: innovation in industrial material processing, 0000 (8 April 1996); doi: 10.1117/12.237721
Proc. SPIE 2703, Field testing industrial and medical excimer laser systems, 0000 (8 April 1996); doi: 10.1117/12.237722
Proc. SPIE 2703, Laser processing quality control by laser-excited SAW with IR detection (LSAW-IRD), 0000 (8 April 1996); doi: 10.1117/12.237723
Welding I
Proc. SPIE 2703, Laser welding melt efficiency comparison: cw and Q-switched Nd:YAG, 0000 (8 April 1996); doi: 10.1117/12.237724
Proc. SPIE 2703, Laser welding of Zn-coated sheet steels, 0000 (8 April 1996); doi: 10.1117/12.237726
Welding II
Proc. SPIE 2703, Lasers in the automobile industry, 0000 (8 April 1996); doi: 10.1117/12.237727
Proc. SPIE 2703, High-speed high-efficiency 500-W cw CO2 laser hermetization of metal frames of microelectronics devices, 0000 (8 April 1996); doi: 10.1117/12.237728
Metrics
Proc. SPIE 2703, Combustion control using a multiplexed diode-laser sensor system, 0000 (8 April 1996); doi: 10.1117/12.237729
Proc. SPIE 2703, Novel photorefractive sensing device for laser surface inspection, 0000 (8 April 1996); doi: 10.1117/12.237730
Proc. SPIE 2703, Laser multisensor system for 3D free-form surface noncontact measurement, 0000 (8 April 1996); doi: 10.1117/12.237731
Poster Session
Proc. SPIE 2703, Laser crystallization of a-Si:H/a-SiNx:H multilayers, 0000 (8 April 1996); doi: 10.1117/12.237732
Silicon Crystals
Proc. SPIE 2703, Excimer laser-induced heating, melting, and mass diffusion in crystal silicon in nanosecond and nanometer scale, 0000 (8 April 1996); doi: 10.1117/12.237733
Surface Treating I
Proc. SPIE 2703, Beam optimization for dry cleaning processes, 0000 (8 April 1996); doi: 10.1117/12.237734
Proc. SPIE 2703, Oxide-assisted laser surfacing of aluminum, 0000 (8 April 1996); doi: 10.1117/12.237735
Proc. SPIE 2703, Laser planarization of chemical vapor deposited diamond film, 0000 (8 April 1996); doi: 10.1117/12.237736
Proc. SPIE 2703, Chemical-free cleaning using excimer lasers, 0000 (8 April 1996); doi: 10.1117/12.237737
Laser Prototyping and Film Processing
Proc. SPIE 2703, Kinetics and microstructure of laser chemical vapor deposition of titanium nitride, 0000 (8 April 1996); doi: 10.1117/12.237738
Surface Treating I
Proc. SPIE 2703, Excimer surface treatment to enhance bonding in coated steels, 0000 (8 April 1996); doi: 10.1117/12.237739
Brazing and Soldering
Proc. SPIE 2703, Laser beam active brazing of metal ceramic joints, 0000 (8 April 1996); doi: 10.1117/12.237740
Proc. SPIE 2703, Laser beam soldering of fine-pitch technology packages with solid solder deposits, 0000 (8 April 1996); doi: 10.1117/12.237741
Microelectronic Manufacturing II
Proc. SPIE 2703, Laser-induced surface doping of semiconductors, 0000 (8 April 1996); doi: 10.1117/12.237742
Poster Session
Proc. SPIE 2703, New mass transfer mechanism under cw CO2 laser effect and perspectives for applications, 0000 (8 April 1996); doi: 10.1117/12.237743
Proc. SPIE 2703, Research on laser melting/alloying combined strengthening of the camshaft of air-cooled diesel engine, 0000 (8 April 1996); doi: 10.1117/12.237744
Proc. SPIE 2703, Measurement of diameters of electrical wires using laser with microprocessor, 0000 (8 April 1996); doi: 10.1117/12.237745
Proc. SPIE 2703, Effects of processing parameters on mode and stability of laser welding, 0000 (8 April 1996); doi: 10.1117/12.237746
Proc. SPIE 2703, Laser-assisted 3D-LOM systems: analysis and synthesis, 0000 (8 April 1996); doi: 10.1117/12.237747
Proc. SPIE 2703, Outdoor laser-tracking system, 0000 (8 April 1996); doi: 10.1117/12.237749
Microelectronic Manufacturing I
Proc. SPIE 2703, Pulsed laser deposition of thick films of electronic ceramics (Review Paper), 0000 (8 April 1996); doi: 10.1117/12.237750
Proc. SPIE 2703, 193-nm lithography (Review Paper), 0000 (8 April 1996); doi: 10.1117/12.237751
Proc. SPIE 2703, Photoresist-free microstructuring of III-V semiconductors with laser-assisted dry-etching ablation, 0000 (8 April 1996); doi: 10.1117/12.237752
Proc. SPIE 2703, Improvement of the reliability of laser beam microwelding as interconnection technique, 0000 (8 April 1996); doi: 10.1117/12.237753
Micromachining
Proc. SPIE 2703, High-speed micromachining with UV-copper vapor lasers, 0000 (8 April 1996); doi: 10.1117/12.237754
Proc. SPIE 2703, Laser processing of ceramics and metals by high-intensity picosecond and nanosecond laser pulses in UV, visible, and IR range of spectrum, 0000 (8 April 1996); doi: 10.1117/12.237755
Nano- and Microstructuring of Surfaces
Proc. SPIE 2703, Nanostructuring of laser-deposited thin films, 0000 (8 April 1996); doi: 10.1117/12.237756
Microelectronic Manufacturing II
Proc. SPIE 2703, Potential role of high-power laser diode in manufacturing, 0000 (8 April 1996); doi: 10.1117/12.237758
Proc. SPIE 2703, Lasers and optics in stereolithography, 0000 (8 April 1996); doi: 10.1117/12.237759
Laser Ablation Deposition
Proc. SPIE 2703, Effect of oxygen deposition pressure and temperature on the structure and properties of pulsed laser-deposited La0.67Ca0.33MnOd films, 0000 (8 April 1996); doi: 10.1117/12.237760
Proc. SPIE 2703, Increase of electrical conductivity of solid C60 films by excimer laser radiation, 0000 (8 April 1996); doi: 10.1117/12.237761
Proc. SPIE 2703, Local laser-induced film transfer: theory and applications, 0000 (8 April 1996); doi: 10.1117/12.237762
Laser Prototyping and Film Processing
Proc. SPIE 2703, Recoil momentum at a solid surface and screening properties of pulsed erosion torch, 0000 (8 April 1996); doi: 10.1117/12.237763
Laser Ablation Etching
Proc. SPIE 2703, Maskless fabrication of submicrometer nonharmonic relief gratings for single-frequency DFB semiconductor lasers by three-beam holographic method, 0000 (8 April 1996); doi: 10.1117/12.237764
Proc. SPIE 2703, Laser maskless formation of submicrometer periodic relief gratings on AIIIBV semiconductor wafers by combination of holographic and surface electromagnetic wave generation methods, 0000 (8 April 1996); doi: 10.1117/12.237765
UV Laser Optics I
Proc. SPIE 2703, Monolithic flexible hollow silver waveguide for high-power industrial CO2 laser applications, 0000 (8 April 1996); doi: 10.1117/12.237766
Process Monitoring I
Proc. SPIE 2703, Materials inspection and process control using compensated laser ultrasound evaluation (CLUE): demonstration of a low-cost laser ultrasonic sensor, 0000 (8 April 1996); doi: 10.1117/12.237768
Nano- and Microstructuring of Surfaces
Proc. SPIE 2703, UV photosensitivity in PECVD-grown germanosilicate waveguides, 0000 (8 April 1996); doi: 10.1117/12.237769
Microelectronic Manufacturing I