PROCEEDINGS VOLUME 2714
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1995 | OCT 30 - NOV 1 1995
27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995
IN THIS VOLUME

0 Sessions, 84 Papers, 0 Presentations
Thin Films  (26)
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1995
Oct 30 - Nov 1 1995
Boulder, CO, United States
Materials and Measurements
Proc. SPIE 2714, Characterization of absorption and degradation on optical components for high-power excimer lasers, 0000 (27 May 1996); doi: 10.1117/12.240344
Surface and Mirrors
Proc. SPIE 2714, Segmented adaptive optic mirrors for laser power beaming and other space applications, 0000 (27 May 1996); doi: 10.1117/12.240355
Thin Films
Proc. SPIE 2714, Review of the state-of-the-art measurements for and the phenomenon of anomalously low thermal conductivities of dielectric thin films, 0000 (27 May 1996); doi: 10.1117/12.240366
Proc. SPIE 2714, Review of structural influences on the laser damage thresholds of oxide coatings, 0000 (27 May 1996); doi: 10.1117/12.240376
Fundamental Mechanisms
Proc. SPIE 2714, Ultrafast laser semiconductor interactions, 0000 (27 May 1996); doi: 10.1117/12.240387
Mini-symposium: Contamination and The Laser Damage Process
Proc. SPIE 2714, Packaging-induced failure of semiconductor lasers and optical telecommunications components, 0000 (27 May 1996); doi: 10.1117/12.240398
Proc. SPIE 2714, Manufacturing experience in reducing environmentally induced failure of laser diodes, 0000 (27 May 1996); doi: 10.1117/12.240408
Proc. SPIE 2714, Comprehensive characterization of micro-arcing related particles, 0000 (27 May 1996); doi: 10.1117/12.240417
Proc. SPIE 2714, Contamination control in semiconductor manufacturing and particle deposition on wafer surfaces, 0000 (27 May 1996); doi: 10.1117/12.240427
Proc. SPIE 2714, Photochemically induced surface contamination: mechanisms and effects, 0000 (27 May 1996); doi: 10.1117/12.240345
Proc. SPIE 2714, Clean-cavity contamination in gas lasers, 0000 (27 May 1996); doi: 10.1117/12.240346
Proc. SPIE 2714, Cleanliness and damage measurements of optics in atmospheric-sensing high-energy lasers, 0000 (27 May 1996); doi: 10.1117/12.240347
Proc. SPIE 2714, Contamination damage in pulsed 1-um lasers, 0000 (27 May 1996); doi: 10.1117/12.240348
Thin Films
Proc. SPIE 2714, Comparison between 355 and 1064-nm damage of high-grade dielectric mirror coatings, 0000 (27 May 1996); doi: 10.1117/12.240349
Proc. SPIE 2714, Thin film laser damage mechanisms at the YAG third harmonic, 0000 (27 May 1996); doi: 10.1117/12.240350
Fundamental Mechanisms
Proc. SPIE 2714, Electrodynamic instability as a reason for bulk and surface optical damage of transparent media and thin films, 0000 (27 May 1996); doi: 10.1117/12.240351
Materials and Measurements
Proc. SPIE 2714, R-on-1 automatic mapping: a new tool for laser damage testing, 0000 (27 May 1996); doi: 10.1117/12.240352
Proc. SPIE 2714, ArF excimer laser-induced absorption in soot-remelted silicas, 0000 (27 May 1996); doi: 10.1117/12.240353
Surface and Mirrors
Proc. SPIE 2714, Peculiarities of photoexcitation and heating of surface in nano-optics, 0000 (27 May 1996); doi: 10.1117/12.240354
Proc. SPIE 2714, Laser damage processes in cleaved and polished CaF2 at 248 nm, 0000 (27 May 1996); doi: 10.1117/12.240356
Proc. SPIE 2714, Laser-induced surface thermal lensing for thin film characterizations, 0000 (27 May 1996); doi: 10.1117/12.240357
Materials and Measurements
Proc. SPIE 2714, Accuracy and precision of laser damage measurements made via binary search techniques, 0000 (27 May 1996); doi: 10.1117/12.240358
Proc. SPIE 2714, Uncertainty in damage-frequency threshold measurements, 0000 (27 May 1996); doi: 10.1117/12.240359
Proc. SPIE 2714, Design of a certification test for laser damage resistance, 0000 (27 May 1996); doi: 10.1117/12.240360
Thin Films
Proc. SPIE 2714, 248-nm laser interaction studies on MgF2/LaF3 optical coatings by mass spectroscopy and x-ray photoelectron spectroscopy, 0000 (27 May 1996); doi: 10.1117/12.240361
Fundamental Mechanisms
Proc. SPIE 2714, Theoretical model for laser energy deposition in intrinsic optical materials and thermomechanical effects, 0000 (27 May 1996); doi: 10.1117/12.240362
Materials and Measurements
Proc. SPIE 2714, Survivability demonstration and characterization of a multibillion-shot Q-switched Nd:YAG laser, 0000 (27 May 1996); doi: 10.1117/12.240363
Proc. SPIE 2714, Laser-induced absorption at 355 nm in silica studied by calorimetry and photothermal deflection, 0000 (27 May 1996); doi: 10.1117/12.240364
Thin Films
Proc. SPIE 2714, Influence of the number of double layers on the damage threshold of Al2O3/SiO2 and LaF3/MgF2 mirrors at 248 nm, 0000 (27 May 1996); doi: 10.1117/12.240365
Proc. SPIE 2714, Sol gel optical thin films for an advanced megajoule-class Nd:glass-laser ICF driver, 0000 (27 May 1996); doi: 10.1117/12.240367
Proc. SPIE 2714, Ultrasensitive detection of photothermal signal of thin films by using an optical amplification system, 0000 (27 May 1996); doi: 10.1117/12.240368
Materials and Measurements
Proc. SPIE 2714, CMO YAG laser damage test facility, 0000 (27 May 1996); doi: 10.1117/12.240369
Proc. SPIE 2714, Environmental stability of CO2 laser optics, 0000 (27 May 1996); doi: 10.1117/12.240370
Proc. SPIE 2714, Photothermal study of optical components at 10.6 um: finite element calculations and experiments, 0000 (27 May 1996); doi: 10.1117/12.240371
Proc. SPIE 2714, OH content dependence of ArF excimer-laser-induced absorption in type III fused silica, 0000 (27 May 1996); doi: 10.1117/12.240372
Thin Films
Proc. SPIE 2714, UV damage threshold of molecular-beam-deposited fluoride coatings, 0000 (27 May 1996); doi: 10.1117/12.240373
Materials and Measurements
Proc. SPIE 2714, Thermoelastic wave model of the photothermal and photoacoustic signal, 0000 (27 May 1996); doi: 10.1117/12.240374
Thin Films
Proc. SPIE 2714, Absorption and laser damage threshold studies of ion-assisted pulsed-laser-deposited oxide films, 0000 (27 May 1996); doi: 10.1117/12.240375
Materials and Measurements
Proc. SPIE 2714, Round-robin test on optical absorption at 10.6 um, 0000 (27 May 1996); doi: 10.1117/12.240377
Fundamental Mechanisms
Proc. SPIE 2714, Can scaling be extended to gigahertz repetition rates?, 0000 (27 May 1996); doi: 10.1117/12.240378
Proc. SPIE 2714, Theoretical model of multiple-shot bulk damage in silicate glasses under conditions of multiphoton generation of color centers, 0000 (27 May 1996); doi: 10.1117/12.240379
Thin Films
Proc. SPIE 2714, High-efficiency dielectric multilayer gratings optimized for manufacturability and laser damage threshold, 0000 (27 May 1996); doi: 10.1117/12.240380
Materials and Measurements
Proc. SPIE 2714, Midinfrared power delivery through chalcogenide glass-clad optical fibers, 0000 (27 May 1996); doi: 10.1117/12.240381
Proc. SPIE 2714, Experimental data on the fiber fuse, 0000 (27 May 1996); doi: 10.1117/12.240382
Proc. SPIE 2714, Laser damage threshold of gelatin and copper phthalocyanine-doped gelatin optical limiter, 0000 (27 May 1996); doi: 10.1117/12.240383
Proc. SPIE 2714, Influence of impurity ions on nonlinear coloration of alkali silicate glasses, 0000 (27 May 1996); doi: 10.1117/12.240384
Fundamental Mechanisms
Proc. SPIE 2714, Inclusion and overlayer effects on the electric fields in dielectric films, 0000 (27 May 1996); doi: 10.1117/12.240385
Thin Films
Proc. SPIE 2714, Laser conditioning of optical coatings: a statistical study of defects by atomic force microscopy, 0000 (27 May 1996); doi: 10.1117/12.240386
Surface and Mirrors
Proc. SPIE 2714, Laser damage thresholds in fused silica structured light gratings, 0000 (27 May 1996); doi: 10.1117/12.240388
Materials and Measurements
Proc. SPIE 2714, Liquid disinfection using power impulse laser, 0000 (27 May 1996); doi: 10.1117/12.240389
Fundamental Mechanisms
Proc. SPIE 2714, Mechanism of impulse-light self-focusing on shock lenses in transparent media, 0000 (27 May 1996); doi: 10.1117/12.240390
By Title Only
Proc. SPIE 2714, Theory of laser-induced damage to optical coatings: dependence of damage threshold on physical parameters of coating and substrate materials, 0000 (27 May 1996); doi: 10.1117/12.240391
Proc. SPIE 2714, Pulse-width and pulse-shape dependencies of laser-induced damage threshold to transparent optical materials, 0000 (27 May 1996); doi: 10.1117/12.240392
Materials and Measurements
Proc. SPIE 2714, CVD-grown diamond: a new material for high-power CO2 lasers, 0000 (27 May 1996); doi: 10.1117/12.240393
By Title Only
Proc. SPIE 2714, Laser-induced damage to glass surfaces, 0000 (27 May 1996); doi: 10.1117/12.240394
Thin Films
Proc. SPIE 2714, AFM-mapped nanoscale absorber-driven laser damage in UV high-reflector multilayers, 0000 (27 May 1996); doi: 10.1117/12.240395
Surface and Mirrors
Proc. SPIE 2714, Nd:YAG laser-induced damage on ultrathin silicon samples, 0000 (27 May 1996); doi: 10.1117/12.240396
Materials and Measurements
Proc. SPIE 2714, Analysis of high-resolution scatter images from laser damage experiments performed on KDP, 0000 (27 May 1996); doi: 10.1117/12.240397