PROCEEDINGS VOLUME 2775
OPTICAL INSTRUMENTATION AND SYSTEMS DESIGN | 12-15 MAY 1996
Specification, Production, and Testing of Optical Components and Systems
OPTICAL INSTRUMENTATION AND SYSTEMS DESIGN
12-15 May 1996
Glasgow, United Kingdom
Image Quality and Standards
Proc. SPIE 2775, Infrared standards for system calibration, 0000 (19 August 1996); doi: 10.1117/12.246735
Proc. SPIE 2775, Statistical tolerancing for optics, 0000 (19 August 1996); doi: 10.1117/12.246746
Proc. SPIE 2775, Construction of tolerance budgets for lens systems on microsatellites, 0000 (19 August 1996); doi: 10.1117/12.246756
Proc. SPIE 2775, Manufacturing error measurement for minute aspherical lens using Mach-Zehnder interferometer, 0000 (19 August 1996); doi: 10.1117/12.246765
Proc. SPIE 2775, Point-spread autocorrelation function (PSAF): a new technique for lens apodization characterization and imaging, 0000 (19 August 1996); doi: 10.1117/12.246773
Proc. SPIE 2775, Assessing the performance of binoculars and other visual afocal sights using a Strehl ratio criterion, 0000 (19 August 1996); doi: 10.1117/12.246781
Proc. SPIE 2775, Stitching of equatorial profiles for extended spatial range assessment, 0000 (19 August 1996); doi: 10.1117/12.246795
Proc. SPIE 2775, Global optimization of the modulation transfer function (MTF) of a multielement optical system, 0000 (19 August 1996); doi: 10.1117/12.246736
Interferometry and Optical Materials
Proc. SPIE 2775, Advances in homogeneity measurement of optical glasses at the Schott 20-in. Fizeau interferometer, 0000 (19 August 1996); doi: 10.1117/12.246738
Proc. SPIE 2775, Interferometric measurements of thermo-optic coefficients of ZnS, CaF2, and Ge in the infrared, 0000 (19 August 1996); doi: 10.1117/12.246739
Proc. SPIE 2775, White-light interferometry: new developments applied to high-accuracy optical measurements, 0000 (19 August 1996); doi: 10.1117/12.246740
Proc. SPIE 2775, Nanometric precision bidimensional optical flat testing, 0000 (19 August 1996); doi: 10.1117/12.246741
Proc. SPIE 2775, Engineering of Z-Scan experimental configuration for fast characterization of nonlinear materials, 0000 (19 August 1996); doi: 10.1117/12.246742
Proc. SPIE 2775, Surface finish assessment of synthetic quartz glass, 0000 (19 August 1996); doi: 10.1117/12.246743
Proc. SPIE 2775, Calorimetric measurement of optical absorption and transmissivity with sub-ppm sensitivity, 0000 (19 August 1996); doi: 10.1117/12.246744
Proc. SPIE 2775, Accurate measurement of weak absorption in pyroelectric optical materials, 0000 (19 August 1996); doi: 10.1117/12.246745
Proc. SPIE 2775, Interferometric devices for angular measurements, 0000 (19 August 1996); doi: 10.1117/12.246747
Proc. SPIE 2775, Optical characterization technique for n-type semiconductors including infrared detector and other optical materials, 0000 (19 August 1996); doi: 10.1117/12.246748
Proc. SPIE 2775, Nondestructive characterization of crosslinking gradients in photopolymer optical elements, 0000 (19 August 1996); doi: 10.1117/12.246749
Proc. SPIE 2775, Progress in multiple-beam reflection interferometry, 0000 (19 August 1996); doi: 10.1117/12.246750
Scattering and Roughness
Proc. SPIE 2775, Use of power spectral density (PSD) to specify optical surfaces, 0000 (19 August 1996); doi: 10.1117/12.246751
Proc. SPIE 2775, Light-scattering-based micrometrology, 0000 (19 August 1996); doi: 10.1117/12.246752
Proc. SPIE 2775, Comparison of a simulation model investigating the scanning of surfaces by mechanical profiling systems with current measurements, 0000 (19 August 1996); doi: 10.1117/12.246753
Proc. SPIE 2775, Visualizing stray light, 0000 (19 August 1996); doi: 10.1117/12.246754
Proc. SPIE 2775, Stray light characterization of optical systems, 0000 (19 August 1996); doi: 10.1117/12.246755
Proc. SPIE 2775, Analysis of interface and volume inhomogeneities in a multilayer system by light scattering methods, 0000 (19 August 1996); doi: 10.1117/12.246757
Proc. SPIE 2775, Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths, 0000 (19 August 1996); doi: 10.1117/12.246758
Proc. SPIE 2775, Characterization of surface roughness by heterodyne interferometry theory and experiment, 0000 (19 August 1996); doi: 10.1117/12.246759
Laser and Coatings
Proc. SPIE 2775, Using first principles in the specifying of optics for large high-power lasers (I): application to the Megajoule Laser (LMJ), 0000 (19 August 1996); doi: 10.1117/12.246760
Proc. SPIE 2775, Power spectral density specifications for high-power laser systems, 0000 (19 August 1996); doi: 10.1117/12.246761
Proc. SPIE 2775, Large-area damage testing of optics, 0000 (19 August 1996); doi: 10.1117/12.246762
Proc. SPIE 2775, Analysis of defects in multilayers through photothermal deflection technique, 0000 (19 August 1996); doi: 10.1117/12.246763
Proc. SPIE 2775, Near-surface and interface absorption in coated substrates, 0000 (19 August 1996); doi: 10.1117/12.246764
Proc. SPIE 2775, Thermal conductivity of e-beam and IBS coatings, 0000 (19 August 1996); doi: 10.1117/12.246766
Proc. SPIE 2775, Beam quality, thermal lensing, and thermal aberration measurements in diode-pumped lasers, 0000 (19 August 1996); doi: 10.1117/12.246767
Proc. SPIE 2775, Guided modes measurements on optical thin films with high structurally induced anisotropy, 0000 (19 August 1996); doi: 10.1117/12.246768
Proc. SPIE 2775, Aspheric form testing using multiple-wavelength approaches in combination with subNyquist techniques, 0000 (19 August 1996); doi: 10.1117/12.246769
Proc. SPIE 2775, Laguerre-Gauss approximation for the transverse field of single-mode optical fibers, 0000 (19 August 1996); doi: 10.1117/12.246770
Proc. SPIE 2775, Method of shearing interferometry for characterizing non-Gaussian randomly rough surfaces, 0000 (19 August 1996); doi: 10.1117/12.246771
Proc. SPIE 2775, Phase-shifting interferometry with precise phase steps, 0000 (19 August 1996); doi: 10.1117/12.246772
Proc. SPIE 2775, Measurement of diffraction efficiency in hybrid lenses, 0000 (19 August 1996); doi: 10.1117/12.246774
Scattering and Roughness
Proc. SPIE 2775, Impact of decentered optical components on the MTF change of space instrumentation, 0000 (19 August 1996); doi: 10.1117/12.246775
Image Quality and Standards
Proc. SPIE 2775, TOW optical and infrared test and alignment calibration capability, 0000 (19 August 1996); doi: 10.1117/12.246776
Large Apertures and Power Handling
Proc. SPIE 2775, Optical polishing of the VLT 8.2-m primary mirrors: a report, 0000 (19 August 1996); doi: 10.1117/12.246777
Proc. SPIE 2775, New fabrication processes for dimensionally stable beryllium mirrors, 0000 (19 August 1996); doi: 10.1117/12.246778
Proc. SPIE 2775, OGLP-400: an innovative computer-controlled polishing machine, 0000 (19 August 1996); doi: 10.1117/12.246779
Proc. SPIE 2775, Room temperature processing of large-area sol gel mirrored coatings, 0000 (19 August 1996); doi: 10.1117/12.246780
Interferometry and Optical Materials
Proc. SPIE 2775, Effect of electron irradiation on the radius of curvature of a Zerodur mirror, 0000 (19 August 1996); doi: 10.1117/12.246782
Large Apertures and Power Handling
Proc. SPIE 2775, Development of large-scale production of Nd-doped phosphate glasses for megajoule-scale laser systems, 0000 (19 August 1996); doi: 10.1117/12.246783
Poster Session
Proc. SPIE 2775, High-rate and low-cost production of very large flat optical debris shields for the French high-power UV-laser project, 0000 (19 August 1996); doi: 10.1117/12.246784
Large Apertures and Power Handling
Proc. SPIE 2775, Low-cost mirror substrates: manufacturing process evolution, 0000 (19 August 1996); doi: 10.1117/12.246785
Fine Assembly and Feature Generation
Proc. SPIE 2775, Fiber-handling system for the manufacture of photonic components, 0000 (19 August 1996); doi: 10.1117/12.246786
Proc. SPIE 2775, Handling and mounting of micro-optical components, 0000 (19 August 1996); doi: 10.1117/12.246787
Proc. SPIE 2775, New assembly technique for deeply buried optical waveguides, 0000 (19 August 1996); doi: 10.1117/12.246788
Proc. SPIE 2775, Design and fabrication of high-efficiency inclined binary high-frequency gratings, 0000 (19 August 1996); doi: 10.1117/12.246789
Proc. SPIE 2775, Test procedures for severely aspheric optics, 0000 (19 August 1996); doi: 10.1117/12.246790
Proc. SPIE 2775, Binary diffractive elements for CO2 laser beam diagnostics, 0000 (19 August 1996); doi: 10.1117/12.246791
Processing and Materials
Proc. SPIE 2775, Proposal of a new mode of NC command for implementation of profile accuracy and productivity in grinding, 0000 (19 August 1996); doi: 10.1117/12.246792
Proc. SPIE 2775, Diamond turning of silicon optics, 0000 (19 August 1996); doi: 10.1117/12.246793