PROCEEDINGS VOLUME 2776
OPTICAL INSTRUMENTATION AND SYSTEMS DESIGN | 12-15 MAY 1996
Developments in Optical Component Coatings
IN THIS VOLUME

0 Sessions, 42 Papers, 0 Presentations
Design  (7)
Measurements  (16)
OPTICAL INSTRUMENTATION AND SYSTEMS DESIGN
12-15 May 1996
Glasgow, United Kingdom
Design
Proc. SPIE 2776, Optical thin film coating design, 0000 (19 August 1996); doi: 10.1117/12.246804
Proc. SPIE 2776, Global design of antireflection coatings, 0000 (19 August 1996); doi: 10.1117/12.246812
Proc. SPIE 2776, Transmission properties of a multilayer filter realized with Cantor-like code, 0000 (19 August 1996); doi: 10.1117/12.246829
Proc. SPIE 2776, Thin film design using simulated annealing and study of the filter robustness, 0000 (19 August 1996); doi: 10.1117/12.246838
Proc. SPIE 2776, Laser optical coatings with different reflectance profiles, 0000 (19 August 1996); doi: 10.1117/12.246842
Proc. SPIE 2776, Design of multilayers featuring inhomogenous coating properties, 0000 (19 August 1996); doi: 10.1117/12.246843
Deposition Processes
Proc. SPIE 2776, Nonradioactive infrared coatings for single- and multispectral applications, 0000 (19 August 1996); doi: 10.1117/12.246844
Design
Proc. SPIE 2776, Developments in the design and production of error-sensitive smart coatings, 0000 (19 August 1996); doi: 10.1117/12.246845
Deposition Processes
Proc. SPIE 2776, Real-time monitoring by multiwavelength ellipsometry of the growth of silicon alloy multilayers and gradient index structures, 0000 (19 August 1996); doi: 10.1117/12.246805
Proc. SPIE 2776, "Black art" of thin film coating: why this term is used and how to change this mind-set, 0000 (19 August 1996); doi: 10.1117/12.246806
Proc. SPIE 2776, Application of oxygen IAD using a new high-power gridless plasma source, 0000 (19 August 1996); doi: 10.1117/12.246807
Proc. SPIE 2776, Approaches explored for producing a variety of ion-assisted deposited thin film coatings using an end-Hall ion source, 0000 (19 August 1996); doi: 10.1117/12.246808
Proc. SPIE 2776, Advanced broadband AR coatings in the visible: a comparative study of different deposition technologies, 0000 (19 August 1996); doi: 10.1117/12.246809
Proc. SPIE 2776, SiO2 protective coatings on plastic optics deposited with plasma IAD, 0000 (19 August 1996); doi: 10.1117/12.246810
Proc. SPIE 2776, Infrared optical coatings by simultaneous evaporation, 0000 (19 August 1996); doi: 10.1117/12.246811
Measurements
Proc. SPIE 2776, Infrared regular reflectance standards from NPL, 0000 (19 August 1996); doi: 10.1117/12.246813
Proc. SPIE 2776, Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process, 0000 (19 August 1996); doi: 10.1117/12.246814
Proc. SPIE 2776, Polarizers at 1.053 um deposited on silica substrate for high laser flux applications in a vacuum, 0000 (19 August 1996); doi: 10.1117/12.246815
Proc. SPIE 2776, Plasma-ion-assisted deposition: investigation of film stress, 0000 (19 August 1996); doi: 10.1117/12.246816
Proc. SPIE 2776, Study of thin film inhomogeneity with a fast-scanning acousto-optic spectrophotometer, 0000 (19 August 1996); doi: 10.1117/12.246817
Proc. SPIE 2776, Rutherford backscattering measurements of structured surfaces of optical systems, 0000 (19 August 1996); doi: 10.1117/12.246818
Components and Materials
Proc. SPIE 2776, Microstructured multilayer dielectric coatings with binary optical functions, 0000 (19 August 1996); doi: 10.1117/12.246819
Proc. SPIE 2776, Thin-film plate polarizer with Fabry-Perot filter design, 0000 (19 August 1996); doi: 10.1117/12.246820
Proc. SPIE 2776, Shift-free narrowband filters for the UV-B region, 0000 (19 August 1996); doi: 10.1117/12.246821
Deposition Processes
Proc. SPIE 2776, Graded-index films using aluminum oxynitrides, 0000 (19 August 1996); doi: 10.1117/12.246822
Components and Materials
Proc. SPIE 2776, Optical coatings for UV photolithography systems, 0000 (19 August 1996); doi: 10.1117/12.246823
Proc. SPIE 2776, Near-UV to IR optical characterization of YF3 thin films deposited by evaporation and ion beam processes, 0000 (19 August 1996); doi: 10.1117/12.246824
Proc. SPIE 2776, Dual ion beam sputtering deposition of silicon oxynitride thin films, 0000 (19 August 1996); doi: 10.1117/12.246825
Proc. SPIE 2776, Residual stress, composition, and optical properties of SiOxNy thin films deposited by dual ion beam sputtering, 0000 (19 August 1996); doi: 10.1117/12.246826
Proc. SPIE 2776, Structural, compositional, and optical characterization of thin TiOxNy coatings fabricated by dual ion beam sputtering, 0000 (19 August 1996); doi: 10.1117/12.246827
Measurements
Proc. SPIE 2776, Ellipsometric analysis of quasirugate films: regularization technique revisited, 0000 (19 August 1996); doi: 10.1117/12.246828
Proc. SPIE 2776, Kinetics and Rutherford backscattering study of the photo-induced solid state chemical reaction between silver and amorphous As33S67 layers, 0000 (19 August 1996); doi: 10.1117/12.246830
Proc. SPIE 2776, Narrowband polarizing interference filter, 0000 (19 August 1996); doi: 10.1117/12.246831
Proc. SPIE 2776, Dichroic mirror for diode-pumped YAG:Nd laser, 0000 (19 August 1996); doi: 10.1117/12.246832
Proc. SPIE 2776, Fabry-Perot resonators for high-resolution infrared gas sensors, 0000 (19 August 1996); doi: 10.1117/12.246833
Proc. SPIE 2776, Pd-based films produced by PECVD for optical recording, 0000 (19 August 1996); doi: 10.1117/12.246834
Proc. SPIE 2776, Design, fabrication, and characterization of subwavelength periodic structures for semiconductor antireflection coating in the visible domain, 0000 (19 August 1996); doi: 10.1117/12.246835
Proc. SPIE 2776, Structure characteristics of stratified and single fluoride optical coatings, 0000 (19 August 1996); doi: 10.1117/12.246836
Deposition Processes
Proc. SPIE 2776, Broadband IR transparent rain and sand erosion protective coating for the AV8-B and GR-7 Harrier forward-looking infrared germanium window, 0000 (19 August 1996); doi: 10.1117/12.246837
Measurements
Proc. SPIE 2776, Numerical study of the design of beam splitters for the far-IR foruse in Fourier transform spectrometers, 0000 (19 August 1996); doi: 10.1117/12.246839
Deposition Processes
Proc. SPIE 2776, Deposition of conventional and gradient optical coatings by ECR plasma-enhanced chemical vapor deposition, 0000 (19 August 1996); doi: 10.1117/12.246840
Measurements
Proc. SPIE 2776, UV-VUV mirrors for storage ring FELs: present performances and requirements, 0000 (19 August 1996); doi: 10.1117/12.246841
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