PROCEEDINGS VOLUME 2782
LASERS, OPTICS, AND VISION FOR PRODUCTIVITY IN MANUFACTURING I | 10-14 JUNE 1996
Optical Inspection and Micromeasurements
LASERS, OPTICS, AND VISION FOR PRODUCTIVITY IN MANUFACTURING I
10-14 June 1996
Besancon, France
Plenary Papers
Proc. SPIE 2782, Coherence multiplexing and applications to desitributed microsensors and integrated optics, 0000 (18 September 1996); doi: 10.1117/12.250728
Proc. SPIE 2782, Micromeasurements: a challenge for photomechanics, 0000 (18 September 1996); doi: 10.1117/12.250743
Microtopographic Inspection
Proc. SPIE 2782, Computerized interferometric measurement of surface microstructure, 0000 (18 September 1996); doi: 10.1117/12.250754
Proc. SPIE 2782, Double spectral modulation for surface analysis, 0000 (18 September 1996); doi: 10.1117/12.250765
Proc. SPIE 2782, Optical flying-height testing of magnetic read-write heads, 0000 (18 September 1996); doi: 10.1117/12.250775
Proc. SPIE 2782, Measuring roughness with dichromatic speckle correlation, 0000 (18 September 1996); doi: 10.1117/12.250785
Proc. SPIE 2782, Differential optical profilometer using a single-probe beam, 0000 (18 September 1996); doi: 10.1117/12.250795
Proc. SPIE 2782, Use of CCD arrays versus PSD detectors in an optical triangulation-based microtopographer, 0000 (18 September 1996); doi: 10.1117/12.250813
Sensors
Proc. SPIE 2782, Application of a PLL and ALL noise reduction for an optical sensing system, 0000 (18 September 1996); doi: 10.1117/12.250729
Proc. SPIE 2782, Development and laboratory tests of deformation fiber optic sensors for civil engineering applications, 0000 (18 September 1996); doi: 10.1117/12.250734
Proc. SPIE 2782, Photothermal inspection of material changes in ceramic surfaces induced by mechanical load or laser treatment, 0000 (18 September 1996); doi: 10.1117/12.250735
Proc. SPIE 2782, Integrated structural evaluation: combining ultrasonics and optics, 0000 (18 September 1996); doi: 10.1117/12.250736
Proc. SPIE 2782, Noncontact phosphor thermometry for process control, 0000 (18 September 1996); doi: 10.1117/12.250737
Proc. SPIE 2782, Micronic intensity analysis and imaging in laser optics by means of micro-thermoelectrical sensors, 0000 (18 September 1996); doi: 10.1117/12.250738
Proc. SPIE 2782, Study of magneto-optical properties in magnetic liquids from ac measurements, 0000 (18 September 1996); doi: 10.1117/12.250739
Displacement, Deformation, and Strain Measurements
Proc. SPIE 2782, Steps towards the use of DSPI for high-temperature strain measurement, 0000 (18 September 1996); doi: 10.1117/12.250740
Proc. SPIE 2782, Measurement of the strain field in a micrometer-sized region at a notch-tip, 0000 (18 September 1996); doi: 10.1117/12.250741
Proc. SPIE 2782, Interferometric deformation measurement using object-induced dynamic phase-shifting, 0000 (18 September 1996); doi: 10.1117/12.250742
Proc. SPIE 2782, Observing deformations of 20 nm with a low-numerical aperture light microscope, 0000 (18 September 1996); doi: 10.1117/12.250744
Proc. SPIE 2782, Fast optical distance measurement by analysis of the focus of a holographic lens, 0000 (18 September 1996); doi: 10.1117/12.250745
Proc. SPIE 2782, Combination of optically measured coordinates and displacements for quantitative investigation of complex objects, 0000 (18 September 1996); doi: 10.1117/12.250746
Grating Interferometry and Related Topics
Holographic Metrology
Proc. SPIE 2782, Recovery of interference fringes in holograpic interferometry, 0000 (18 September 1996); doi: 10.1117/12.250753
Proc. SPIE 2782, Real-time holography of ultrasonic surface waves, 0000 (18 September 1996); doi: 10.1117/12.250755
Proc. SPIE 2782, Holographic illumination for comparison in interferometry, 0000 (18 September 1996); doi: 10.1117/12.250756
Proc. SPIE 2782, Full field tomographic reconstruction of acoustic fields using TV holography: theory, developments, and possibilities, 0000 (18 September 1996); doi: 10.1117/12.250757
Proc. SPIE 2782, In-situ thin film stress measurement using high-stability portable holographic interferometer, 0000 (18 September 1996); doi: 10.1117/12.250758
Proc. SPIE 2782, Holographic data acquisition and display in real and quasi-real time: friendly for industrial inspections, 0000 (18 September 1996); doi: 10.1117/12.250759
Proc. SPIE 2782, Bridging the gap between electronic speckle pattern interferometry and holography, 0000 (18 September 1996); doi: 10.1117/12.250760
Fringe Pattern Analysis
Proc. SPIE 2782, Recent progress in phase-unwrapping techniques, 0000 (18 September 1996); doi: 10.1117/12.250761
Proc. SPIE 2782, Adaptive automatic shape measurement system, 0000 (18 September 1996); doi: 10.1117/12.250762
Proc. SPIE 2782, Active stabilization and real-time analysis of interference fringes, 0000 (18 September 1996); doi: 10.1117/12.250763
Proc. SPIE 2782, Fuzzy logic: a new tool for 3D displacement measurements, 0000 (18 September 1996); doi: 10.1117/12.250764
Proc. SPIE 2782, High-speed two-dimensional fringe analysis using frequency demodultion, 0000 (18 September 1996); doi: 10.1117/12.250766
Speckle Metrology
Proc. SPIE 2782, Applicability of electronic speckle pattern interferometry to the characterization of building materials, 0000 (18 September 1996); doi: 10.1117/12.250767
Proc. SPIE 2782, Interferometric study of a machine tool, 0000 (18 September 1996); doi: 10.1117/12.250768
Proc. SPIE 2782, Measurement optimization in speckle interferometry: the influence of the imaging lens aperture, 0000 (18 September 1996); doi: 10.1117/12.250769
Proc. SPIE 2782, Laser-optical strain sensor for noncontact and whole-field strain analysis, 0000 (18 September 1996); doi: 10.1117/12.250770
Proc. SPIE 2782, Speckle pattern correlation for local approach of damage evaluation, 0000 (18 September 1996); doi: 10.1117/12.250771
New Approaches
Proc. SPIE 2782, Linear approximation of the coherence function of a white-light source for efficient phase-shifting interferometry, 0000 (18 September 1996); doi: 10.1117/12.250772
Proc. SPIE 2782, Equivalent wavelength interferometry using diffractive optics, 0000 (18 September 1996); doi: 10.1117/12.250773
Proc. SPIE 2782, Deep field refelction mode for high-resolution surface relief exploration by coherence probe microscopy, 0000 (18 September 1996); doi: 10.1117/12.250774
Proc. SPIE 2782, Detection of ultrasonic vibrations on rough surfaces through the photorefractive effect, 0000 (18 September 1996); doi: 10.1117/12.250776
Proc. SPIE 2782, New heterodyne interferometers using double passing, 0000 (18 September 1996); doi: 10.1117/12.250777
Material Characterization
Proc. SPIE 2782, Laser-ultrasound imaging of defects in carbon fiber composite materials, 0000 (18 September 1996); doi: 10.1117/12.250778
Proc. SPIE 2782, Surface deformation measurement by photothermal deflection technique, 0000 (18 September 1996); doi: 10.1117/12.250779
Proc. SPIE 2782, Polycrystalline materials studies by automatic grating interferometry, 0000 (18 September 1996); doi: 10.1117/12.250780
Near-Field Microscopy
Proc. SPIE 2782, Reflection mode scanning near-field optical microscope (SNOM) with the tetrahedral tip, 0000 (18 September 1996); doi: 10.1117/12.250781
Proc. SPIE 2782, Determination of the resolution in scanning near-field optical images with the help of shear force feedback, 0000 (18 September 1996); doi: 10.1117/12.250782
Proc. SPIE 2782, Acoustic control of tip-sample distance for optical near-field microscopy, 0000 (18 September 1996); doi: 10.1117/12.250783
Proc. SPIE 2782, Lithography on PMMA-DR1 with reflection near-filed optical microscopy (R-SNOM) and probe characterization, 0000 (18 September 1996); doi: 10.1117/12.250784
Proc. SPIE 2782, Near-field study of magneto-optical samples: theoretical comparison of transversal and polar effects, 0000 (18 September 1996); doi: 10.1117/12.250786
Proc. SPIE 2782, Versatile scanning near-field optical microscope using an apertureless metallic probe, 0000 (18 September 1996); doi: 10.1117/12.250787