PROCEEDINGS VOLUME 2860
SPIE'S 1996 INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 4-9 AUGUST 1996
Laser Interferometry VIII: Techniques and Analysis
SPIE'S 1996 INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
4-9 August 1996
Denver, CO, United States
New Approaches
Proc. SPIE 2860, General hierarchical approach in absolute phase measurement, 0000 (17 July 1996); doi: 10.1117/12.276292
Proc. SPIE 2860, Smart fringe image processing system, 0000 (17 July 1996); doi: 10.1117/12.276303
Proc. SPIE 2860, Some applications of quadratic cost functionals in fringe analysis, 0000 (17 July 1996); doi: 10.1117/12.276314
Proc. SPIE 2860, Generalized algorithm for phase shifting interferometry, 0000 (17 July 1996); doi: 10.1117/12.276324
New Algorithms
Proc. SPIE 2860, Spatially frequency-multiplexed number-theoretic phase unwrapping technique for the Fourier-transform profilometry of objects with height discontinuities and/or spatial isolations, 0000 (17 July 1996); doi: 10.1117/12.276333
Proc. SPIE 2860, Fourier transform technique for phase unwrapping with minimized boundary effects, 0000 (17 July 1996); doi: 10.1117/12.276336
Proc. SPIE 2860, Unwrapping of noisy phase maps: a comparison of two methods, 0000 (17 July 1996); doi: 10.1117/12.276337
Proc. SPIE 2860, Errors in two-directional spatial-carrier phase shifting method for closed fringe patterns analysis, 0000 (17 July 1996); doi: 10.1117/12.276338
Proc. SPIE 2860, Least-squares fitting of a sinusoidal signal and its Fourier analysis, 0000 (17 July 1996); doi: 10.1117/12.276339
Proc. SPIE 2860, Self-calibrating five-frame algorithm for phase-shifting interferometry, 0000 (17 July 1996); doi: 10.1117/12.276293
New Techniques
Proc. SPIE 2860, Achromatic phase shifting for polarization interferometry, 0000 (17 July 1996); doi: 10.1117/12.276294
Proc. SPIE 2860, Evaluation of fringe patterns in an optimized holographic interferometric microscope with conjugated reconstruction, 0000 (17 July 1996); doi: 10.1117/12.276295
Proc. SPIE 2860, Holographic microscope for measuring displacements of vibrating microbeams using time-average holography, 0000 (17 July 1996); doi: 10.1117/12.276296
Proc. SPIE 2860, Precise surface measurement by local sampling phase shifting technique, 0000 (17 July 1996); doi: 10.1117/12.276297
Proc. SPIE 2860, Speckle noise removal in interference fringes by optoelectronic preprocessing with Epson liquid crystal television, 0000 (17 July 1996); doi: 10.1117/12.276298
Proc. SPIE 2860, Light-in-flight measurements by digital holography, 0000 (17 July 1996); doi: 10.1117/12.276299
ESPI and Shearography Techniques
Proc. SPIE 2860, Actively phase-compensated portable fiber optic electronic speckle pattern interferometer (ESPI) for long-term in-situ measurements, 0000 (17 July 1996); doi: 10.1117/12.276300
Proc. SPIE 2860, Measurement of shape and vibration using a single electronic speckle interferometry configuration, 0000 (17 July 1996); doi: 10.1117/12.276301
Proc. SPIE 2860, Surface profile determination by additive-subtractive phase-modulated ESPI with Fourier analysis, 0000 (17 July 1996); doi: 10.1117/12.276302
Proc. SPIE 2860, Digital shearography for pure in-plane strain measurement on the object surface under three-dimensional strain conditions, 0000 (17 July 1996); doi: 10.1117/12.276304
Proc. SPIE 2860, Double shear speckle interferometry for curvature measurement, 0000 (17 July 1996); doi: 10.1117/12.276305
Interferometric Sensors I
Proc. SPIE 2860, Optoelectronic developments in speckle interferometry, 0000 (17 July 1996); doi: 10.1117/12.276306
Proc. SPIE 2860, Laseroptical strain sensor: technique and applications, 0000 (17 July 1996); doi: 10.1117/12.276307
Proc. SPIE 2860, Infrared interferometer for optical testing, 0000 (17 July 1996); doi: 10.1117/12.276308
Proc. SPIE 2860, Feedback type of laser diode interferometer with an optical fiber, 0000 (17 July 1996); doi: 10.1117/12.276309
Proc. SPIE 2860, Dynamic holographic interferometric-DHI sensor on adaptive supergrating, 0000 (17 July 1996); doi: 10.1117/12.276310
Interferometric Sensors II
Proc. SPIE 2860, Influence of the spectral properties of a wavelength-modulated laser diode on the resulting interferogram, 0000 (17 July 1996); doi: 10.1117/12.276311
Proc. SPIE 2860, Modified in-plane electronic speckle pattern shearing interferometry (ESPSI), 0000 (17 July 1996); doi: 10.1117/12.276312
Proc. SPIE 2860, Phase-shifted real-time laser feedback interferometry, 0000 (17 July 1996); doi: 10.1117/12.276313
Proc. SPIE 2860, Source modulation for phase shifting in static and dynamic speckle shearing interferometry, 0000 (17 July 1996); doi: 10.1117/12.276315
Proc. SPIE 2860, Optical device positioning by using Becke lines, 0000 (17 July 1996); doi: 10.1117/12.276316
Interferometric and Holographic Techniques
Proc. SPIE 2860, Real-time visualization of dynamic holographic interferometric images using photorefractive crystals, 0000 (17 July 1996); doi: 10.1117/12.276317
Proc. SPIE 2860, Nonoptical surface measurement by oblique incidence interferometry, 0000 (17 July 1996); doi: 10.1117/12.276318
Proc. SPIE 2860, Optical flat surfaces: subtraction of small-scale irregularities of the reference surface, 0000 (17 July 1996); doi: 10.1117/12.276319
Proc. SPIE 2860, Recordable depth-of-view and allowable farthest far-field distance of off-axis holography for particle sizing, 0000 (17 July 1996); doi: 10.1117/12.276320
Proc. SPIE 2860, Surface measurement of optical cylinder using multiaperture overlap-scanning technique (MAOST), 0000 (17 July 1996); doi: 10.1117/12.276321
Poster Session
Proc. SPIE 2860, Leaky waveguide laser diodes for advanced manufacturing and metrology, 0000 (17 July 1996); doi: 10.1117/12.276322
Proc. SPIE 2860, Spatial domain method of DSPI fringe pattern recognition, 0000 (17 July 1996); doi: 10.1117/12.276323
Proc. SPIE 2860, Desensitized TV holography applied to static and vibrating objects for large deformation measurements, 0000 (17 July 1996); doi: 10.1117/12.276325
Proc. SPIE 2860, Application of imaging conoscope for optical inhomogeneity testing in LiNbO3 crystals and components, 0000 (17 July 1996); doi: 10.1117/12.276326
Proc. SPIE 2860, Stereometric matching using Gabor functions versus structured light-shape detection methods, 0000 (17 July 1996); doi: 10.1117/12.276327
Proc. SPIE 2860, Minimizing the effects of threshold setting errors, detection, shading, and noise errors in fringe patterns, 0000 (17 July 1996); doi: 10.1117/12.276328
Proc. SPIE 2860, Improved signal processing method for heterodyne interferometer, 0000 (17 July 1996); doi: 10.1117/12.276329
Proc. SPIE 2860, Investigation of speckle displacement effects on speckle interferometry, 0000 (17 July 1996); doi: 10.1117/12.276330
Proc. SPIE 2860, Measuring convergence or divergence power with moire fringes, 0000 (17 July 1996); doi: 10.1117/12.276331
Proc. SPIE 2860, Holographic analogy of the spatial radial carrier analysis of interferograms, 0000 (17 July 1996); doi: 10.1117/12.276332
Proc. SPIE 2860, Design of a 24-in. phase shifting Fizeau interferometer, 0000 (17 July 1996); doi: 10.1117/12.276334
Interferometric Sensors I
Proc. SPIE 2860, Two-color laser speckle shift strain measurement system, 0000 (17 July 1996); doi: 10.1117/12.276335
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