PROCEEDINGS VOLUME 2873
INTERNATIONAL SYMPOSIUM ON POLARIZATION ANALYSIS AND APPLICATIONS TO DEVICE TECHNOLOGY | 12-14 JUNE 1996
International Symposium on Polarization Analysis and Applications to Device Technology
IN THIS VOLUME

0 Sessions, 86 Papers, 0 Presentations
Session 1  (86)
INTERNATIONAL SYMPOSIUM ON POLARIZATION ANALYSIS AND APPLICATIONS TO DEVICE TECHNOLOGY
12-14 June 1996
Yokohama, Japan
Session 1
Proc. SPIE 2873, Keynote Speech: Recent developments of division-of-amplitude photopolarimeters, 0000 (16 August 1996); doi: 10.1117/12.246175
Proc. SPIE 2873, Mueller matrix imaging polarimetry: an overview, 0000 (16 August 1996); doi: 10.1117/12.246186
Proc. SPIE 2873, High-sensitivity two-dimensional observation of thermal birefringence in the laser diode pumped solid state lasers, 0000 (16 August 1996); doi: 10.1117/12.246197
Proc. SPIE 2873, Measurement of low-level strain birefringence in optical elements using a photoelastic modulator, 0000 (16 August 1996); doi: 10.1117/12.246208
Proc. SPIE 2873, Retardation-modulated differential interference microscope and its application to 3D shape measurement, 0000 (16 August 1996); doi: 10.1117/12.246219
Proc. SPIE 2873, Application of spectro-polimetry for remote sensing, 0000 (16 August 1996); doi: 10.1117/12.246230
Proc. SPIE 2873, Simultaneous measurement of linear and circular birefringence with heterodyne interferometry, 0000 (16 August 1996); doi: 10.1117/12.246241
Proc. SPIE 2873, Real-time measurement of two-dimensional birefringence, 0000 (16 August 1996); doi: 10.1117/12.246252
Proc. SPIE 2873, Dynamic observation of surface charge distribution by electro-optic Pockels effect technique, 0000 (16 August 1996); doi: 10.1117/12.246260
Proc. SPIE 2873, Dynamic variation of internal stress distribution in the curing process of epoxy resin using highly sensitive birefringence measurement system, 0000 (16 August 1996); doi: 10.1117/12.246176
Proc. SPIE 2873, Measurement of the magneto-optical Kerr effect using a polarimetric method, 0000 (16 August 1996); doi: 10.1117/12.246177
Proc. SPIE 2873, Development of an imaging spectro-polarimeter, 0000 (16 August 1996); doi: 10.1117/12.246178
Proc. SPIE 2873, Optical CT imaging in highly scattering media by extraction of photons preserving initial polarization, 0000 (16 August 1996); doi: 10.1117/12.246179
Proc. SPIE 2873, Measurement of molecular orientation of polymer films during rapid elongation process by means of birefringence using phase modulation technology, 0000 (16 August 1996); doi: 10.1117/12.246180
Proc. SPIE 2873, Characterization of the polarization properties of a laser output from a CO2 laser with a special intracavity mirror, 0000 (16 August 1996); doi: 10.1117/12.246181
Proc. SPIE 2873, Optical polarization measurements of exciton-Zeeman splitting and carrier-spin relaxation in ZnxCd1-xSe/ZnSe multiquantum wells, 0000 (16 August 1996); doi: 10.1117/12.246182
Proc. SPIE 2873, First thin film ellipsometry at a photon energy of 97eV with use of high-performance multilayer polarizers, 0000 (16 August 1996); doi: 10.1117/12.246183
Proc. SPIE 2873, Development of EUV free-standing multilayer polarizers, 0000 (16 August 1996); doi: 10.1117/12.246184
Proc. SPIE 2873, Field-of-view analysis of the four-detector photopolarimeter (Stokesmeter), 0000 (16 August 1996); doi: 10.1117/12.246185
Proc. SPIE 2873, Birefringence-sensitive interference microscope, 0000 (16 August 1996); doi: 10.1117/12.246187
Proc. SPIE 2873, Element-specific soft x-ray magneto-optic rotation studies of magnetic films and multilayers, 0000 (16 August 1996); doi: 10.1117/12.246188
Proc. SPIE 2873, Progress report on recent research with polarizing undulator, 0000 (16 August 1996); doi: 10.1117/12.246189
Proc. SPIE 2873, Polarization studies on the B 1s exciton emission from h-BN using a soft x-ray multilayer polarizer, 0000 (16 August 1996); doi: 10.1117/12.246190
Proc. SPIE 2873, Faraday effect and x-ray birefringence at cobalt K-absorption edge with the tunable x-ray polarimeter, 0000 (16 August 1996); doi: 10.1117/12.246191
Proc. SPIE 2873, Superflat high-reflectivity semitransparent polarizer for soft x-ray, 0000 (16 August 1996); doi: 10.1117/12.246192
Proc. SPIE 2873, Reference measurement for fiber optic polarimetric sensors, 0000 (16 August 1996); doi: 10.1117/12.246193
Proc. SPIE 2873, In-situ growth control of x-ray multilayers using visible light kinetic ellipsometry and grazing incidence x-ray reflectometry, 0000 (16 August 1996); doi: 10.1117/12.246194
Proc. SPIE 2873, Fast birefringence measurement using right and left hand circulary polarized laser, 0000 (16 August 1996); doi: 10.1117/12.246195
Proc. SPIE 2873, Heterodyne interferometer for film thickness and refractive index measurements of optical thin film, 0000 (16 August 1996); doi: 10.1117/12.246196
Proc. SPIE 2873, Optical heterodyne polarimeter with spatiotemporal carrier frequencies for studying dynamic photoelastic stresses, 0000 (16 August 1996); doi: 10.1117/12.246198
Proc. SPIE 2873, Innovative miniature differential laser Doppler interferometer, 0000 (16 August 1996); doi: 10.1117/12.246199
Proc. SPIE 2873, Measurements of the ellipsometric parameters of optical components inside an active laser, 0000 (16 August 1996); doi: 10.1117/12.246200
Proc. SPIE 2873, Automated spectroscopic ellipsometry for characterization of complex multilayers for 550x650x0.7-mm LCD production control, 0000 (16 August 1996); doi: 10.1117/12.246201
Proc. SPIE 2873, In-situ monitor and control using fast spectroscopic ellipsometry, 0000 (16 August 1996); doi: 10.1117/12.246202
Proc. SPIE 2873, Compact polarization analyzer for a free-space/fiber lightwave, 0000 (16 August 1996); doi: 10.1117/12.246203
Proc. SPIE 2873, Infrared reflection polarizers using uniform and diffuse low-index layers buried in high-index substrates, 0000 (16 August 1996); doi: 10.1117/12.246204
Proc. SPIE 2873, Fast ellipsometry and Mueller matrix ellipsometry using the division-of-amplitude photopolarimeter, 0000 (16 August 1996); doi: 10.1117/12.246205
Proc. SPIE 2873, Retardation measurements of light scattered by metallic rough surfaces, 0000 (16 August 1996); doi: 10.1117/12.246206
Proc. SPIE 2873, Measurement of two-dimensional birefringence distribution for laser materials, 0000 (16 August 1996); doi: 10.1117/12.246207
Proc. SPIE 2873, Vibration detection using photorefractive two-wave mixing in KNSBN:Cu crystal and its polarization effect, 0000 (16 August 1996); doi: 10.1117/12.246209
Proc. SPIE 2873, In-situ ellipsometric study of growth of Au thin films, 0000 (16 August 1996); doi: 10.1117/12.246210
Proc. SPIE 2873, Ellipsometric topometry for technical surfaces, 0000 (16 August 1996); doi: 10.1117/12.246211
Proc. SPIE 2873, Photoelastic microellipsometer: a new tool for high-resolution force vector measurements, 0000 (16 August 1996); doi: 10.1117/12.246212
Proc. SPIE 2873, In-situ ultrahigh vacuum spectroscopic ellipsometry, 0000 (16 August 1996); doi: 10.1117/12.246213
Proc. SPIE 2873, Spectroscopic ellipsometry and photometry applied to color filter characterization, 0000 (16 August 1996); doi: 10.1117/12.246214
Proc. SPIE 2873, Spectroellipsometric study of amorphous thin films, 0000 (16 August 1996); doi: 10.1117/12.246215
Proc. SPIE 2873, Orthogonal linear polarized laser wave oscillation in a thin film integrated laser chip for MO disk signal detection, 0000 (16 August 1996); doi: 10.1117/12.246216
Proc. SPIE 2873, Mueller matrix polarimetry of electro-optic PLZT spatial light modulators, 0000 (16 August 1996); doi: 10.1117/12.246217
Proc. SPIE 2873, Novel superbroadband reflective polarizer, 0000 (16 August 1996); doi: 10.1117/12.246218
Proc. SPIE 2873, Liquid crystal spatial light modulators for precision optics applications, 0000 (16 August 1996); doi: 10.1117/12.246220
Proc. SPIE 2873, Optical retardance standard: a progress report, 0000 (16 August 1996); doi: 10.1117/12.246221
Proc. SPIE 2873, Recording and readout properties of PRIZ spatial light modulator in photorefractive crystal, 0000 (16 August 1996); doi: 10.1117/12.246222
Proc. SPIE 2873, Simultaneous oblique deposition from opposite azimuthal directions for fabrication of thin film retardation plates, 0000 (16 August 1996); doi: 10.1117/12.246223
Proc. SPIE 2873, Subwavelength gratings optimized for broadband quarter-wave plates, 0000 (16 August 1996); doi: 10.1117/12.246224
Proc. SPIE 2873, Dual-beam light-scattering tomography (LST) for detection of functional defects in nonlinear optical crystals, 0000 (16 August 1996); doi: 10.1117/12.246225
Proc. SPIE 2873, Characterization of modulation-doped n-AlxGa1-xAs/GaAs heterostructure using spectroscopic ellipsometry and photoreflectance, 0000 (16 August 1996); doi: 10.1117/12.246226
Proc. SPIE 2873, Ellipsometric study of rare gas films physisorbed on a surface of a metal single crystal, 0000 (16 August 1996); doi: 10.1117/12.246227
Proc. SPIE 2873, Determination of microstructure related optical constants of titanium dioxide thin films using optical methods, 0000 (16 August 1996); doi: 10.1117/12.246228
Proc. SPIE 2873, Effect of crystalline orientation on photoelastic constant of Si single crystal, 0000 (16 August 1996); doi: 10.1117/12.246229