PROCEEDINGS VOLUME 2894
PHOTONICS CHINA '96 | 4-7 NOVEMBER 1996
Detectors, Focal Plane Arrays, and Applications
PHOTONICS CHINA '96
4-7 November 1996
Beijing, China
Modeling and Analysis
Proc. SPIE 2894, Size restrictions of radiation detecting with semiconductor photodetectors, 0000 (25 September 1996); doi: 10.1117/12.252077
Testing
Proc. SPIE 2894, Characterization of infrared detectors for space applications, 0000 (25 September 1996); doi: 10.1117/12.252078
Thermal Detectors I
Proc. SPIE 2894, Uncooled multispectral detectors and their applications, 0000 (25 September 1996); doi: 10.1117/12.252079
Mercury Cadmium Telleride Detectors and Readouts
Proc. SPIE 2894, Second-generation infrared detectors: present situation and prospects in France, 0000 (25 September 1996); doi: 10.1117/12.252080
Proc. SPIE 2894, Collective flip-chip technology for HgCdTe IRFPA, 0000 (25 September 1996); doi: 10.1117/12.252081
Poster Session
Proc. SPIE 2894, Complete range of lightweight cryocoolers for integrated Dewar assembly (IDA), 0000 (25 September 1996); doi: 10.1117/12.252082
Mercury Cadmium Telleride Detectors and Readouts
Proc. SPIE 2894, HgCdTe detector technology at Kunming Institute of Physics, 0000 (25 September 1996); doi: 10.1117/12.252083
Quantum Wells and Related Technologies
Mercury Cadmium Telleride Detectors and Readouts
Proc. SPIE 2894, Interface properties of HgCdTe passivated with the combination of CdS and ZnS, 0000 (25 September 1996); doi: 10.1117/12.252086
Thermal Detectors II
Proc. SPIE 2894, Improved interconnect circuit for high Tc superconducting microbolometer, 0000 (25 September 1996); doi: 10.1117/12.252087
Applications of FPAs and Detectors
Proc. SPIE 2894, Real-time measurement of temperature field by colorimetric method, 0000 (25 September 1996); doi: 10.1117/12.252088
Thermal Detectors II
Proc. SPIE 2894, Experimental investigation on thermal imaging by a high Tc super conducting microbolometer, 0000 (25 September 1996); doi: 10.1117/12.252089
Applications of FPAs and Detectors
Proc. SPIE 2894, Double-band infrared image processing system using rosette scanning, 0000 (25 September 1996); doi: 10.1117/12.252090
Mercury Cadmium Telleride Detectors and Readouts
Proc. SPIE 2894, Influence of growth conditions on the qualities of CdxHg1-xTe (0 x 1) layers grown by MOVPE, 0000 (25 September 1996); doi: 10.1117/12.252091
Quantum Wells and Related Technologies
Modeling and Analysis
Proc. SPIE 2894, Research on P+-GexSi1-x/p-Si heterojunction internal photoemission long-wavelength infrared detector, 0000 (25 September 1996); doi: 10.1117/12.252093
Thermal Detectors II
Proc. SPIE 2894, High Tc superconducting microbolometer detector arrays, 0000 (25 September 1996); doi: 10.1117/12.252094
Thermal Detectors I
Proc. SPIE 2894, Thermal analysis of thin film resistor arrays for dynamic IR scene simulation, 0000 (25 September 1996); doi: 10.1117/12.252095
Mercury Cadmium Telleride Detectors and Readouts
Proc. SPIE 2894, Reflectivities and electronic band structure of Hg0.8Cd0.2Te, 0000 (25 September 1996); doi: 10.1117/12.252096
Microlenses and Applications
Proc. SPIE 2894, Pseudorandom encoding of fully complex modulation to biamplitude phase modulators, 0000 (25 September 1996); doi: 10.1117/12.252097
Poster Session
Proc. SPIE 2894, Gain performance research and analysis of aluminized MCP in third-generation image tube, 0000 (25 September 1996); doi: 10.1117/12.252098
Proc. SPIE 2894, Study of thermo-optical tunable reflecting filter based on dual interference effect, 0000 (25 September 1996); doi: 10.1117/12.252099
Modeling and Analysis
Proc. SPIE 2894, Theory of optical transfer function for photodetector arrays, 0000 (25 September 1996); doi: 10.1117/12.252100
Quantum Wells and Related Technologies
Applications of FPAs and Detectors
Proc. SPIE 2894, CCD camera application in the investigaton of optical materials damage processing, 0000 (25 September 1996); doi: 10.1117/12.252102
Testing
Proc. SPIE 2894, Measurement of peak power of laser pulses using avalanche photodiodes, 0000 (25 September 1996); doi: 10.1117/12.252103
Applications of FPAs and Detectors
Proc. SPIE 2894, High-speed imaging by use of a photoswitch array, 0000 (25 September 1996); doi: 10.1117/12.252104
Thermal Detectors I
Proc. SPIE 2894, New type of multijunction thermopile IR detector, 0000 (25 September 1996); doi: 10.1117/12.252105
Applications of FPAs and Detectors
Proc. SPIE 2894, High-sensitivity photoelectric pressure sensor based on a monolithic dual photodiode, 0000 (25 September 1996); doi: 10.1117/12.252106
Mercury Cadmium Telleride Detectors and Readouts
Proc. SPIE 2894, High-integration CMOS vision chips, 0000 (25 September 1996); doi: 10.1117/12.252107
Poster Session
Proc. SPIE 2894, Improving the measuring resolution of CCD by curve fitting, 0000 (25 September 1996); doi: 10.1117/12.252108
Testing
Proc. SPIE 2894, Method of using pulse laser to calibrate transient surface temperature detectors, 0000 (25 September 1996); doi: 10.1117/12.252109
Proc. SPIE 2894, Applications of a new time-frequency analysis in high-G accelerometer dynamic calibration by laser differential Doppler technique, 0000 (25 September 1996); doi: 10.1117/12.252110
Proc. SPIE 2894, Measurement of noise of photovoltaic HgCdTe and InSb infrared detector, 0000 (25 September 1996); doi: 10.1117/12.252111
Poster Session
Proc. SPIE 2894, Influence of reverse bias voltage and light intensity on some properties of position-sensitive detector (PSD), 0000 (25 September 1996); doi: 10.1117/12.252112
Proc. SPIE 2894, Characterization of HgCdTe epilayers grown on GaAs(211)B by molecular beam epitaxy, 0000 (25 September 1996); doi: 10.1117/12.252113
Proc. SPIE 2894, Four-unit composite thin film IR detector, 0000 (25 September 1996); doi: 10.1117/12.252114
Proc. SPIE 2894, Performance prediction and computer simulation of staring thermal imaging systems with OTL96, 0000 (25 September 1996); doi: 10.1117/12.252115
Proc. SPIE 2894, Detectivity limit of the LWIR photoconductive HgCdTe detector, 0000 (25 September 1996); doi: 10.1117/12.252116
Proc. SPIE 2894, Bridgman growth and assessment of CdTe and Cd1-yZnyTe crystals, 0000 (25 September 1996); doi: 10.1117/12.252117
Proc. SPIE 2894, 8x8 silicon photodiode matrix module, 0000 (25 September 1996); doi: 10.1117/12.252118
Proc. SPIE 2894, Experiment and research on the TDI CCD camera, 0000 (25 September 1996); doi: 10.1117/12.252119
Proc. SPIE 2894, Imaging approach of pyroelectric FPAs using LCDs, 0000 (25 September 1996); doi: 10.1117/12.252120
Proc. SPIE 2894, Coupling efficiency of metal gratings in a normal incident GaAs/AlGaAs quantum well infrared detector, 0000 (25 September 1996); doi: 10.1117/12.252121
Proc. SPIE 2894, Surface pretreatment of LPE HgCdTe epilayer for passivation technology of photodiode array, 0000 (25 September 1996); doi: 10.1117/12.252122
Proc. SPIE 2894, Ultraweak bioluminescence imaging and image processing, 0000 (25 September 1996); doi: 10.1117/12.252123
Proc. SPIE 2894, Digital CMOS active pixel image sensor for multimedia applications, 0000 (25 September 1996); doi: 10.1117/12.252124
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