PROCEEDINGS VOLUME 3009
PHOTONICS WEST '97 | 8-14 FEBRUARY 1997
Micromachining and Imaging
IN THIS VOLUME

0 Sessions, 17 Papers, 0 Presentations
PHOTONICS WEST '97
8-14 February 1997
San Jose, CA, United States
Imaging and Fabrication
Proc. SPIE 3009, Resistance of Ni nanowires fabricated by STM-CVD, 0000 (15 April 1997); doi: 10.1117/12.271214
Proc. SPIE 3009, Fabrication of large-area gratings with submicron pitch using mold micromachining, 0000 (15 April 1997); doi: 10.1117/12.271222
Proc. SPIE 3009, Mass-producible microtags for security applications: Tolerance analysis by rigorous coupled-wave analysis, 0000 (15 April 1997); doi: 10.1117/12.271224
Proc. SPIE 3009, Wafer level thin-film solder bonding of a hybrid sensor for interfacial force microscopy, 0000 (15 April 1997); doi: 10.1117/12.271225
Scanning Probes and Systems: General
Proc. SPIE 3009, Micromachined aperture probe tip for multifunctional scanning probe microscopy, 0000 (15 April 1997); doi: 10.1117/12.271226
Proc. SPIE 3009, Atomic force microscopy using small cantilevers, 0000 (15 April 1997); doi: 10.1117/12.271227
Proc. SPIE 3009, Atomic force microscope for small cantilevers, 0000 (15 April 1997); doi: 10.1117/12.271228
Proc. SPIE 3009, Characterization of application-specific probes for SPMs, 0000 (15 April 1997); doi: 10.1117/12.271229
Proc. SPIE 3009, Fabrication of monolithic diamond probes for scanning probe microscopy applications, 0000 (15 April 1997); doi: 10.1117/12.271230
Proc. SPIE 3009, Microelectromechanical force probe array, 0000 (15 April 1997); doi: 10.1117/12.271215
Multiprobe Microscopy
Proc. SPIE 3009, Tapping mode scanning capacitance microscopy: feasibility of quantitative capacitance measurement, 0000 (15 April 1997); doi: 10.1117/12.271216
Proc. SPIE 3009, Micromachined probes for high-frequency scanning force microscopy and scanning thermal microscopy, 0000 (15 April 1997); doi: 10.1117/12.271217
Optical and Electron Scanned Imaging
Proc. SPIE 3009, Focusing properties of a micromachined electron lens, 0000 (15 April 1997); doi: 10.1117/12.271218
Proc. SPIE 3009, Near-field optical microscopy nanoarray, 0000 (15 April 1997); doi: 10.1117/12.271219
Proc. SPIE 3009, Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes, 0000 (15 April 1997); doi: 10.1117/12.271220
Proc. SPIE 3009, Application and characterization of combined SNOM/SFM cantilever probes, 0000 (15 April 1997); doi: 10.1117/12.271221
Proc. SPIE 3009, Microfabricated biaxial electrostatic torsional scanning mirror, 0000 (15 April 1997); doi: 10.1117/12.271223
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