PROCEEDINGS VOLUME 3094
POLARIMETRY AND ELLIPSOMETRY | 20-23 MAY 1996
Polarimetry and Ellipsometry
POLARIMETRY AND ELLIPSOMETRY
20-23 May 1996
Kazimierz Dolny, Poland
Physics and Analysis of Polarized Light
Proc. SPIE 3094, Polarization characteristics of quantum-well semiconductor structures, 0000 (1 April 1997); doi: 10.1117/12.271798
Proc. SPIE 3094, Polarization properties of light emission of AlGaAs double heterostructure injection lasers, 0000 (1 April 1997); doi: 10.1117/12.271809
Proc. SPIE 3094, Analysis of polarized light in multilayers, 0000 (1 April 1997); doi: 10.1117/12.271820
Proc. SPIE 3094, Stokes-Mueller formalism and Poincare sphere representation applied to studies of monomode optical fibers, 0000 (1 April 1997); doi: 10.1117/12.271831
Proc. SPIE 3094, Weakly twisted optically anisotropic media: is there an analogy between Hi-Bi fibers and liquid crystals?, 0000 (1 April 1997); doi: 10.1117/12.271841
Proc. SPIE 3094, Depolarization behavior of multiple scattered light from an optically dense random medium, 0000 (1 April 1997); doi: 10.1117/12.271842
Proc. SPIE 3094, Static phase conjugator for pseudodepolarized laser beams, 0000 (1 April 1997); doi: 10.1117/12.271843
Proc. SPIE 3094, Associative data reconstruction for nonuniformly polarized optical fields, 0000 (1 April 1997); doi: 10.1117/12.271844
Polarimeters: Accessories and Applications
Proc. SPIE 3094, Polarization modulation polarimeter for an HPLC detector, 0000 (1 April 1997); doi: 10.1117/12.271845
Proc. SPIE 3094, Universal null polarimeter for crystal optics, 0000 (1 April 1997); doi: 10.1117/12.271799
Proc. SPIE 3094, Computer-aided automatic polarimeter, 0000 (1 April 1997); doi: 10.1117/12.271800
Proc. SPIE 3094, Electrically switched compensator in high-accuracy polarimeter, 0000 (1 April 1997); doi: 10.1117/12.271801
Proc. SPIE 3094, Nonmechanical azimuth change of a linear polarizer preceding a photodetector, 0000 (1 April 1997); doi: 10.1117/12.271802
Proc. SPIE 3094, Compensation detector of birefringence, 0000 (1 April 1997); doi: 10.1117/12.271803
Proc. SPIE 3094, Magneto-optical modulators and isolators of partially polarized light, 0000 (1 April 1997); doi: 10.1117/12.271804
Proc. SPIE 3094, Overcoated wide-angle window designed for selected light wavelength, 0000 (1 April 1997); doi: 10.1117/12.271805
Proc. SPIE 3094, Two-frequency He-Ne laser for heterodyne polarimetry and ellipsometry, 0000 (1 April 1997); doi: 10.1117/12.271806
Proc. SPIE 3094, Null-polarimetric studies of waveplate parameters, 0000 (1 April 1997); doi: 10.1117/12.271807
Proc. SPIE 3094, Polarimetric investigations of residual stresses in Czochralski-grown LiNbO3 single crystals, 0000 (1 April 1997); doi: 10.1117/12.271808
Proc. SPIE 3094, Methods for determining optical parameters in gyrotropic crystals, 0000 (1 April 1997); doi: 10.1117/12.271810
Proc. SPIE 3094, Application of polarimetry in optical computerized tomography of anisotropic media, 0000 (1 April 1997); doi: 10.1117/12.271811
Proc. SPIE 3094, Optical rotatory power of trigonal quartz and germanium dioxide single crystals, 0000 (1 April 1997); doi: 10.1117/12.271812
Proc. SPIE 3094, Peculiarities of the optical anisotropy in lead germanate-type crystals, 0000 (1 April 1997); doi: 10.1117/12.271813
Proc. SPIE 3094, Polarimetry of semiconductor exciton spectra, 0000 (1 April 1997); doi: 10.1117/12.271814
Proc. SPIE 3094, Numerical and experimental study of corneal birefringence, 0000 (1 April 1997); doi: 10.1117/12.271815
Polarimetric Fiber Optic Sensors
Proc. SPIE 3094, Distributed polarimetric fiber optic sensors using a wavelength-scanning technique, 0000 (1 April 1997); doi: 10.1117/12.271816
Proc. SPIE 3094, Polarization role in fiber optic interferometers, 0000 (1 April 1997); doi: 10.1117/12.271817
Proc. SPIE 3094, Multiplexed polarimetric sensors with highly birefringent optical fibers for smart structures, 0000 (1 April 1997); doi: 10.1117/12.271818
Ellipsometry: Instrumentation and Applications
Proc. SPIE 3094, Nonlinear polarization-modulated ellipsometry, 0000 (1 April 1997); doi: 10.1117/12.271819
Proc. SPIE 3094, Possibilities of ellipsometry with surface plasmon excitation in the investigation of thin films in comparison to separated ellipsometry and surface plasmon spectroscopy, 0000 (1 April 1997); doi: 10.1117/12.271821
Proc. SPIE 3094, Characterization of thin metal films with overlayers by transparency and multiangle including surface plasmon excitation reflectance ellipsometry method, 0000 (1 April 1997); doi: 10.1117/12.271822
Proc. SPIE 3094, Application of generalized ellipsometry to complex optical systems, 0000 (1 April 1997); doi: 10.1117/12.271823
Proc. SPIE 3094, Accuracy of traditional ellipsometry and complex ellipsometry-transmission photometry techniques for absorptive-film/transparent-substrate systems, 0000 (1 April 1997); doi: 10.1117/12.271824
Proc. SPIE 3094, Comparison of the precision of a null-ellipsometer to an ellipsometer with a rotating analyzer, 0000 (1 April 1997); doi: 10.1117/12.271825
Proc. SPIE 3094, Ellipsometric studies of photochromic ultrathin polymer films, 0000 (1 April 1997); doi: 10.1117/12.271826
Proc. SPIE 3094, Ellipsometry for determining the refractive index profiles of thin films, 0000 (1 April 1997); doi: 10.1117/12.271827
Proc. SPIE 3094, Ellipsometry for correctly determining the void fraction and true refractive index of thin films, 0000 (1 April 1997); doi: 10.1117/12.271828
Proc. SPIE 3094, Manifestation of optical activity in light reflection from gyrotropic uniaxial film, 0000 (1 April 1997); doi: 10.1117/12.271829
Proc. SPIE 3094, Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multiwave ellipsometry, 0000 (1 April 1997); doi: 10.1117/12.271830
Proc. SPIE 3094, Ellipsometric investigation of implanted GaAs, 0000 (1 April 1997); doi: 10.1117/12.271832
Proc. SPIE 3094, Determination of the optical model of the MOS structure with spectroscopic ellipsometry, 0000 (1 April 1997); doi: 10.1117/12.271833
Proc. SPIE 3094, Research of oxidation processes of a cadmium telluride film surface by ellipsometric method, 0000 (1 April 1997); doi: 10.1117/12.271834
Proc. SPIE 3094, Ellipsometric studies of the effect of a metal island structure on the optic properties of a semiconductor surface, 0000 (1 April 1997); doi: 10.1117/12.271835
Proc. SPIE 3094, Practical aspects of multiple-angle ellipsometry of semiconductor structures, 0000 (1 April 1997); doi: 10.1117/12.271836
Measuring Techniques Related to Polarimetry and Ellipsometry
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