PROCEEDINGS VOLUME 3098
LASERS AND OPTICS IN MANUFACTURING III | 16-20 JUNE 1997
Optical Inspection and Micromeasurements II
LASERS AND OPTICS IN MANUFACTURING III
16-20 June 1997
Munich, Germany
Moire Metrology
Proc. SPIE 3098, Inverse moire, 0000 (17 September 1997); doi: 10.1117/12.281146
Proc. SPIE 3098, Moire interferometry/termovision method for electronic package testing, 0000 (17 September 1997); doi: 10.1117/12.281157
Proc. SPIE 3098, Comparison of the moire two-beam phase-stepping and Fourier transform method techniques in Fizeau interferometry, 0000 (17 September 1997); doi: 10.1117/12.281167
Proc. SPIE 3098, New grazing incidence microscope for the measurement of topography with a 2lambda-algorithm, 0000 (17 September 1997); doi: 10.1117/12.281177
Proc. SPIE 3098, Fast and flexible shape control with adaptive LCD fringe masks, 0000 (17 September 1997); doi: 10.1117/12.281188
Surface Metrology
Proc. SPIE 3098, Optical metrology of difficult-to-access surfaces: micromeasurement of the inner profiles of diamond wiring dies, 0000 (17 September 1997); doi: 10.1117/12.281201
Proc. SPIE 3098, Interferometer for optical waviness and figure testing, 0000 (17 September 1997); doi: 10.1117/12.281208
Proc. SPIE 3098, Crossed data processing in spectrally resolved white-light interferometry, 0000 (17 September 1997); doi: 10.1117/12.281210
Proc. SPIE 3098, Processing of white-light correlograms: simultaneous phase and envelope measurements by wavelet transformation, 0000 (17 September 1997); doi: 10.1117/12.281147
Proc. SPIE 3098, Interferometric testing of technical surfaces with computer-generated holograms, 0000 (17 September 1997); doi: 10.1117/12.281148
Proc. SPIE 3098, Macroscopic to microscopic surface topographies evaluated by improved speckle contouring methods, 0000 (17 September 1997); doi: 10.1117/12.281149
Proc. SPIE 3098, Surface characterization of an internal combustion engine piston by angular speckle contouring, 0000 (17 September 1997); doi: 10.1117/12.281150
Proc. SPIE 3098, Three-dimensional analysis of machined surfaces by scatterometry, 0000 (17 September 1997); doi: 10.1117/12.281151
Proc. SPIE 3098, Microellipsometric surface measurement, 0000 (17 September 1997); doi: 10.1117/12.281152
Proc. SPIE 3098, Measurement and analysis of microtopography using wavelet methods, 0000 (17 September 1997); doi: 10.1117/12.281153
Speckle Metrology
Proc. SPIE 3098, Recent vibration analysis results at NTNU with video speckle interferometry, 0000 (17 September 1997); doi: 10.1117/12.281154
Proc. SPIE 3098, Vibration analysis by digital speckle pattern shearing interferometry, 0000 (17 September 1997); doi: 10.1117/12.281155
Proc. SPIE 3098, Phase-shifted double single-pulse additive stroboscopic TV holography for the measurement of high-frequency vibrations using low-bandwidth phase-modulation devices, 0000 (17 September 1997); doi: 10.1117/12.281156
Proc. SPIE 3098, Experimental modal analysis for vibration with large amplitude using moire topography, 0000 (17 September 1997); doi: 10.1117/12.281158
Proc. SPIE 3098, Electronic speckle interferometry with pulsed lasers and practical applications, 0000 (17 September 1997); doi: 10.1117/12.281159
Proc. SPIE 3098, Applications of 3D speckle interferometry to material and component testing, 0000 (17 September 1997); doi: 10.1117/12.281160
Proc. SPIE 3098, Applications of digital speckle photography in experimental mechanics, 0000 (17 September 1997); doi: 10.1117/12.281161
Proc. SPIE 3098, Modified electronic speckle pattern shearing interferometry for simultaneous derivative map measurements, 0000 (17 September 1997); doi: 10.1117/12.281162
Proc. SPIE 3098, Laser speckle contrast analysis (LASCA) for flow measurement, 0000 (17 September 1997); doi: 10.1117/12.281163
Holographic Metrology
Proc. SPIE 3098, Methods of digital holography: a comparison, 0000 (17 September 1997); doi: 10.1117/12.281164
Proc. SPIE 3098, Particle size and position measurement with digital holography, 0000 (17 September 1997); doi: 10.1117/12.281165
Proc. SPIE 3098, Stroboscopic real-time holographic interferometry with photorefractive crystals applied to modal analysis, 0000 (17 September 1997); doi: 10.1117/12.281166
Fringe Processing
Proc. SPIE 3098, Two methods for achieving subpixel resolution in phase difference determination by fringe pattern matching, 0000 (17 September 1997); doi: 10.1117/12.281168
Proc. SPIE 3098, Comparison of spatial self-filtering using numerical, photorefractive, and nonphotorefractive techniques, 0000 (17 September 1997); doi: 10.1117/12.281169
Proc. SPIE 3098, Two-step temporal phase unwrapping in profilometry, 0000 (17 September 1997); doi: 10.1117/12.281170
Proc. SPIE 3098, 101-frame algorithm for phase-shifting interferometry, 0000 (17 September 1997); doi: 10.1117/12.281171
Laser Diode and Polychromatic Light Metrology
Proc. SPIE 3098, Optical heterodyne light source using laser diodes and its application to hybrid measurement, 0000 (17 September 1997); doi: 10.1117/12.281172
Proc. SPIE 3098, Optical measurements using the spectral interferograms obtained at the output of the uncompensated Michelson interferometer, 0000 (17 September 1997); doi: 10.1117/12.281173
Proc. SPIE 3098, Real-time dispersion curve measurement from spectrally resolved white-light interferometry, 0000 (17 September 1997); doi: 10.1117/12.281174
Proc. SPIE 3098, Source considerations for low-coherence speckle interferometry, 0000 (17 September 1997); doi: 10.1117/12.281175
Proc. SPIE 3098, New modulation technique for unambiguous measurements of phase changes in diode laser interferometers, 0000 (17 September 1997); doi: 10.1117/12.281176
Optical Sensors
Proc. SPIE 3098, Stabilized Brillouin fiber ring laser (BFRL) using low-loss fused single-mode resonator couplers for application in distributed fiber sensor systems, 0000 (17 September 1997); doi: 10.1117/12.281178
Proc. SPIE 3098, Condition and control monitoring of structures using an in-situ fiber optic system, 0000 (17 September 1997); doi: 10.1117/12.281179
Proc. SPIE 3098, Detection of eddy currents with a new laser-supported eddy current sensor, 0000 (17 September 1997); doi: 10.1117/12.281180
Proc. SPIE 3098, Experimental results of the application of PLL and ALL noise reduction for an optical sensing system, 0000 (17 September 1997); doi: 10.1117/12.281181
Micromeasurements and Microsystems
Proc. SPIE 3098, Microelectromechanical systems (MEMS) and their photonic application, 0000 (17 September 1997); doi: 10.1117/12.281182
Proc. SPIE 3098, 3D-deformation analysis of microcomponents using digital holography, 0000 (17 September 1997); doi: 10.1117/12.281183
Proc. SPIE 3098, Original approach to an optically active silicon-based interferometric structure for sensing applications, 0000 (17 September 1997); doi: 10.1117/12.281184
Proc. SPIE 3098, Measurement of the nanometric deformation field in metallic microbars with microscopical ESPI, 0000 (17 September 1997); doi: 10.1117/12.281185
Proc. SPIE 3098, Interferometric displacement measurements performed with a self-mixing microinterferometer, 0000 (17 September 1997); doi: 10.1117/12.281186
Optical Diagnostics
Proc. SPIE 3098, Fast positioning of noncooperative objects, 0000 (17 September 1997); doi: 10.1117/12.281187
Proc. SPIE 3098, Determination of 3D stress by optical sensor field tomography, 0000 (17 September 1997); doi: 10.1117/12.281189
Proc. SPIE 3098, Interferometric measurement of refractive index profiles for thin film characterization, 0000 (17 September 1997); doi: 10.1117/12.281190
Proc. SPIE 3098, Wavelength dependence of the dynamic Faraday effect in magnetic liquids, 0000 (17 September 1997); doi: 10.1117/12.281191
Proc. SPIE 3098, Using dynamic Cotton and Mouton effect to study Brownian relaxation and magnetization of ferrofluids, 0000 (17 September 1997); doi: 10.1117/12.281192
Proc. SPIE 3098, Thermoelastic modeling: application to superresolution in photothermal and thermoelastic microscopy, 0000 (17 September 1997); doi: 10.1117/12.281193
Proc. SPIE 3098, Plasmon spectroscopy for high-resolution angular measurements, 0000 (17 September 1997); doi: 10.1117/12.281194
Proc. SPIE 3098, Three-dimensional measurement of the dynamical behavior of mechanical components with laser vibrometers, 0000 (17 September 1997); doi: 10.1117/12.281195
Near-Field Microscopy
Proc. SPIE 3098, Reflection and transmission imaging of nanostructures by an apertureless near-field optical microscope, 0000 (17 September 1997); doi: 10.1117/12.281196
Proc. SPIE 3098, Tunnel noise spectroscopy by reflection SNOM and STM, 0000 (17 September 1997); doi: 10.1117/12.281197
Proc. SPIE 3098, Near-field imaging of the photocurrent on Au/GaAs interface with various wavelengths, 0000 (17 September 1997); doi: 10.1117/12.281198
Poster Session
Proc. SPIE 3098, Nondestructive testing of microcracks using digital speckle pattern shearing interferometry, 0000 (17 September 1997); doi: 10.1117/12.281199
Proc. SPIE 3098, Imaging of surface plasmons with a near-field microscope, 0000 (17 September 1997); doi: 10.1117/12.281200