PROCEEDINGS VOLUME 3100
LASERS AND OPTICS IN MANUFACTURING III | 16-20 JUNE 1997
Sensors, Sensor Systems, and Sensor Data Processing
LASERS AND OPTICS IN MANUFACTURING III
16-20 June 1997
Munich, Germany
Distributed Sensor Systems--Data Fusion and Signal Processing
Proc. SPIE 3100, Signal processing technique for proper on-line exponential decay monitoring in the presence of nonexponential and multiexponential contributions, 0000 (25 September 1997); doi: 10.1117/12.281258
Proc. SPIE 3100, On-line quality visualization and mathematical evaluation of thin metal laser cuts, 0000 (25 September 1997); doi: 10.1117/12.281260
Proc. SPIE 3100, How to create pseudoredundant measurements, 0000 (25 September 1997); doi: 10.1117/12.281261
Proc. SPIE 3100, Optimal weighting of phase data with varying signal to noise ratio, 0000 (25 September 1997); doi: 10.1117/12.281262
Proc. SPIE 3100, Flexible calibration method for an image guided 3D laserradar scanner applicable for large volumina, 0000 (25 September 1997); doi: 10.1117/12.281263
Proc. SPIE 3100, Multi-sensor system for surface inspection and 3D-geometry assessment, 0000 (25 September 1997); doi: 10.1117/12.281264
Sensors and Components
Proc. SPIE 3100, High-speed identification of polymers by laser-induced breakdown spectroscopy, 0000 (25 September 1997); doi: 10.1117/12.281265
Proc. SPIE 3100, Integrated synchronous receiver channel for optical instrumentation applications, 0000 (25 September 1997); doi: 10.1117/12.281259
Proc. SPIE 3100, CMOS position-sensitive photodetectors (PSDs) for integrated sensor systems, 0000 (25 September 1997); doi: 10.1117/12.287729
Proc. SPIE 3100, CMOS binary position-sensitive photodetector (PSD) array, 0000 (25 September 1997); doi: 10.1117/12.287730
Proc. SPIE 3100, Position sensing resolution in atmospheric turbulence using a position-sensitive detector (PSD), 0000 (25 September 1997); doi: 10.1117/12.287731
Proc. SPIE 3100, Photodiodes for high-frequency applications implemented in CMOS and BiCMOS processes, 0000 (25 September 1997); doi: 10.1117/12.287732
Proc. SPIE 3100, Submicron grating adaptive sensor, 0000 (25 September 1997); doi: 10.1117/12.287733
Proc. SPIE 3100, Performances of a CCD camera from 1- to 1100-nm spectral region, 0000 (25 September 1997); doi: 10.1117/12.287734
Poster Session
Proc. SPIE 3100, Color imaging on rastered photothermoplastics, 0000 (25 September 1997); doi: 10.1117/12.287735
Distributed Sensor Systems--Data Fusion and Signal Processing
Proc. SPIE 3100, Pulsed TV holography: system description and some applications, 0000 (25 September 1997); doi: 10.1117/12.287736
Poster Session
Proc. SPIE 3100, Analogue-domain FPN compensation circuit for random access CMOS imagers, 0000 (25 September 1997); doi: 10.1117/12.287737
Proc. SPIE 3100, Fringes superposition with computer-generated moire applied to position control, 0000 (25 September 1997); doi: 10.1117/12.287738
Proc. SPIE 3100, Frequency analysis for roughness of optical surface by focal plane CCD camera, 0000 (25 September 1997); doi: 10.1117/12.287739
Proc. SPIE 3100, Single-element refractive optical device for laser beam profiling, 0000 (25 September 1997); doi: 10.1117/12.287740
Coherent Techniques, Interferometry, and Phase and Fringe Analysis
Proc. SPIE 3100, FMCW technique using self-mixing inside a LiTaO3-Nd:YAG microchip laser for absolute distance and velocity measurements, 0000 (25 September 1997); doi: 10.1117/12.287741
Proc. SPIE 3100, Automatic adaption of projected fringe patterns using a programmable LCD-projector, 0000 (25 September 1997); doi: 10.1117/12.287742
Proc. SPIE 3100, New results in calculating the unambiguous phase for SAR interferometry, 0000 (25 September 1997); doi: 10.1117/12.287743
Proc. SPIE 3100, C40 on-line demodulation of phase modulated signals using different Kalman filter models, 0000 (25 September 1997); doi: 10.1117/12.287744
Proc. SPIE 3100, Shape measurement by temporal phase unwrapping and spatial light modulator-based fringe projector, 0000 (25 September 1997); doi: 10.1117/12.287745
Proc. SPIE 3100, Reducing vibration effects in phase-shifting interferometry, 0000 (25 September 1997); doi: 10.1117/12.287746
3D Sensors and 3D Imaging
Proc. SPIE 3100, Telecentric scanner for 3D profilometry of very large objects, 0000 (25 September 1997); doi: 10.1117/12.287747
Proc. SPIE 3100, Multiple channel passive 3D range sensor, 0000 (25 September 1997); doi: 10.1117/12.287748
Proc. SPIE 3100, High-speed multichannel length measurement with a CCD scanning line, 0000 (25 September 1997); doi: 10.1117/12.287749
Proc. SPIE 3100, White light heterodyne principle for 3D-measurement, 0000 (25 September 1997); doi: 10.1117/12.287750
Proc. SPIE 3100, New electro-optical mixing and correlating sensor: facilities and applications of the photonic mixer device (PMD), 0000 (25 September 1997); doi: 10.1117/12.287751
Proc. SPIE 3100, Electro-optical correlation arrangement for fast 3D cameras: properties and facilities of the electro-optical mixer device, 0000 (25 September 1997); doi: 10.1117/12.287752
Proc. SPIE 3100, Full-hemisphere automatic optical 3D measurement system, 0000 (25 September 1997); doi: 10.1117/12.287753
1D/2D/3D Sensors: Visual Inspection I
Proc. SPIE 3100, High-accuracy liquid level meter based on pulsed time of flight principle, 0000 (25 September 1997); doi: 10.1117/12.287754
Proc. SPIE 3100, Microcontroller-based intelligent low-cost-linear-sensor-camera for general edge detection, 0000 (25 September 1997); doi: 10.1117/12.287755
Proc. SPIE 3100, Fresnel diffraction for fast and accurate in-process measurement of the diameters of rotational symmetric workpieces, 0000 (25 September 1997); doi: 10.1117/12.287756
Proc. SPIE 3100, Enhanced imaging by fusion of illumination series, 0000 (25 September 1997); doi: 10.1117/12.287757
Proc. SPIE 3100, Influence of the focusing element for CO2 laser beams on monitored process signals, 0000 (25 September 1997); doi: 10.1117/12.287758
Proc. SPIE 3100, Contactless, highly exact torsion measurement of special section tubes, 0000 (25 September 1997); doi: 10.1117/12.287759
1D/2D/3D Sensors: Visual Inspection II
Proc. SPIE 3100, Image processing for automated visual surface inspection, 0000 (25 September 1997); doi: 10.1117/12.287760
Proc. SPIE 3100, Fast inspection of radius, wall thickness, eccentricity and ovality at the end of high precision tubes: TRUDE 60-28 in the production, 0000 (25 September 1997); doi: 10.1117/12.287761
Proc. SPIE 3100, New triagulation sensor for inside inspection of small drillings and hollows with integrated image processing, 0000 (25 September 1997); doi: 10.1117/12.287762
Proc. SPIE 3100, Surface inspection of transparent materials with a compact reflection sensor, 0000 (25 September 1997); doi: 10.1117/12.287763
Proc. SPIE 3100, Fiber optical multi-channel laser radar with parallel processing, 0000 (25 September 1997); doi: 10.1117/12.287764
Poster Session
Proc. SPIE 3100, Laser scan-based spatial image encoder used in 3D vision, 0000 (25 September 1997); doi: 10.1117/12.287765
Proc. SPIE 3100, Improvement of LIDAR system by modulation of an optical pulse laser for underwater detection, 0000 (25 September 1997); doi: 10.1117/12.287766
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