PROCEEDINGS VOLUME 3185
ISMA '97 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS AND ASSEMBLY | 23-26 JUNE 1997
Automatic Inspection and Novel Instrumentation
ISMA '97 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS AND ASSEMBLY
23-26 June 1997
Singapore, Singapore
Automatic Inspection Systems I
Proc. SPIE 3185, Machine vision for alignment and inspection in die bonder, 0000 (18 August 1997); doi: 10.1117/12.284028
Proc. SPIE 3185, Computer vision techniques for IC wire-bond height inspection, 0000 (18 August 1997); doi: 10.1117/12.284035
Proc. SPIE 3185, Automated mark inspection using multiple templates, 0000 (18 August 1997); doi: 10.1117/12.284042
Three-Dimensional Imaging Techniques
Proc. SPIE 3185, Thinning by the motion of the structuring element for 3D inspection, 0000 (18 August 1997); doi: 10.1117/12.284043
Automatic Inspection Systems II
Proc. SPIE 3185, Automated inspection and dimension measurement of optoelectronic components, 0000 (18 August 1997); doi: 10.1117/12.284044
Proc. SPIE 3185, Automatic parameter optimization in inspection systems, 0000 (18 August 1997); doi: 10.1117/12.284045
Proc. SPIE 3185, Identifying IC type from its package label using character recognition technique, 0000 (18 August 1997); doi: 10.1117/12.284046
Proc. SPIE 3185, Texture image segmentation using a structured artificial neural network, 0000 (18 August 1997); doi: 10.1117/12.284029
Three-Dimensional Imaging Techniques
Proc. SPIE 3185, 3D visual inspection of IC bonding wires, 0000 (18 August 1997); doi: 10.1117/12.284030
Proc. SPIE 3185, Tracking a rigid object in 3D from a single camera, 0000 (18 August 1997); doi: 10.1117/12.284031
Novel Instrumentation and Detection Techniques I
Proc. SPIE 3185, Optical heterodyne surface profiling interferometer with automatic focusing, 0000 (18 August 1997); doi: 10.1117/12.284032
Proc. SPIE 3185, Novel edge detection technique for detecting moving objects, 0000 (18 August 1997); doi: 10.1117/12.284033
Proc. SPIE 3185, Development of a laser holographic interference system for optical grating fabrication, 0000 (18 August 1997); doi: 10.1117/12.284034
Novel Instrumentation and Detection Techniques II
Proc. SPIE 3185, Phase-shifting interferometer for surface inspection, 0000 (18 August 1997); doi: 10.1117/12.284036
Proc. SPIE 3185, Linear pattern identification system, 0000 (18 August 1997); doi: 10.1117/12.284037
Automatic Inspection Systems III
Proc. SPIE 3185, Effectiveness of integrated lead inspection and conditioning, 0000 (18 August 1997); doi: 10.1117/12.284038
Proc. SPIE 3185, Automated inspection in printed circuit board assembly (PCBA) manufacturing, 0000 (18 August 1997); doi: 10.1117/12.284039
Proc. SPIE 3185, Reading resistor values by color image processing, 0000 (18 August 1997); doi: 10.1117/12.284040
Novel Instrumentation and Detection Techniques II
Proc. SPIE 3185, Precision noncontact measurement of blind holes by machine vision technology, 0000 (18 August 1997); doi: 10.1117/12.284041
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