PROCEEDINGS VOLUME 3244
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1997 | 6-8 OCTOBER 1997
Laser-Induced Damage in Optical Materials: 1997
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1997
6-8 October 1997
Boulder, CO, United States
Surfaces and Mirrors
Proc. SPIE 3244, Surface preparation and analysis for highest ultraviolet laser damage resistivity of fluoride materials, 0000 (20 April 1998); doi: 10.1117/12.306977
Fundamental Mechanisms
Proc. SPIE 3244, Absorption of laser light by ions as a mechanism of optical damage in solids, 0000 (20 April 1998); doi: 10.1117/12.306986
Proc. SPIE 3244, Inertial-free amorphization and damage of crystals by laser field, 0000 (20 April 1998); doi: 10.1117/12.306997
Thin Films
Proc. SPIE 3244, Characterization of nodular and thermal defects in hafnia/silica multilayer coatings using optical, photothermal, and atomic force microscopy, 0000 (20 April 1998); doi: 10.1117/12.307008
Materials and Measurements
Proc. SPIE 3244, Mapping and inspection of damage and artifacts in large-scale optics, 0000 (20 April 1998); doi: 10.1117/12.307019
Thin Films
Proc. SPIE 3244, Oxygen-enriched binary composite films for high-power laser applications, 0000 (20 April 1998); doi: 10.1117/12.307027
By Title Only
Proc. SPIE 3244, Multishot laser-induced damage in optical materials: an analysis of main regularities, 0000 (20 April 1998); doi: 10.1117/12.307037
Thin Films
Proc. SPIE 3244, Ultraviolet laser damage and optical properties of high-refractive-index single layers, multiple layers, and high/low index multilayer stacks, 0000 (20 April 1998); doi: 10.1117/12.306968
Fundamental Mechanisms
Proc. SPIE 3244, Localized laser damage test facility at LOSCM: real-time optical observation and quantitative AFM study, 0000 (20 April 1998); doi: 10.1117/12.306969
Thin Films
Proc. SPIE 3244, Waveguide losses by photothermal techniques in multilayers for laser damage investigation, 0000 (20 April 1998); doi: 10.1117/12.306970
Materials and Measurements
Proc. SPIE 3244, Roughness-induced absorption, scattering ellipsometry, and multidielectric resonances for laser damage investigation, 0000 (20 April 1998); doi: 10.1117/12.306971
By Title Only
Proc. SPIE 3244, Peculiarities of laser damage of AIIBVI single crystals, 0000 (20 April 1998); doi: 10.1117/12.306972
Materials and Measurements
Proc. SPIE 3244, Laser damage threshold of rapidly grown KDP crystals grown in the direction of a preset angle of synchronism, 0000 (20 April 1998); doi: 10.1117/12.306973
Proc. SPIE 3244, Effect of radiation on the properties of water soluble crystals, 0000 (20 April 1998); doi: 10.1117/12.306974
By Title Only
Proc. SPIE 3244, Computer simulation of nonlinear evolution of laser field in multilayer optical coatings, 0000 (20 April 1998); doi: 10.1117/12.306975
Proc. SPIE 3244, Blow-up behavior of high-power laser field in tiny nonabsorbing defects in transparent materials, 0000 (20 April 1998); doi: 10.1117/12.306976
Fundamental Mechanisms
Proc. SPIE 3244, Electrodynamic resonances and instabilities in transparent medium and their role in laser-induced damage, 0000 (20 April 1998); doi: 10.1117/12.306978
Materials and Measurements
Proc. SPIE 3244, Wavelength dependence of laser-induced damage in fused silica and fused quartz, 0000 (20 April 1998); doi: 10.1117/12.306979
Proc. SPIE 3244, Laser-induced damage of Cr:LiSAF crystal at 0.85 <mu>m, 0000 (20 April 1998); doi: 10.1117/12.306980
Proc. SPIE 3244, Photo-ionization of glasses by IR femtosecond laser pulses, 0000 (20 April 1998); doi: 10.1117/12.306981
By Title Only
Proc. SPIE 3244, High-speed measurements of solid state plasma excitation and recombination processes using microwave and laser radiation, 0000 (20 April 1998); doi: 10.1117/12.306982
Fundamental Mechanisms
Proc. SPIE 3244, Comparison between cw and pulsed laser calorimetric measurement at1.06 <mu>m, 0000 (20 April 1998); doi: 10.1117/12.306983
Surfaces and Mirrors
Proc. SPIE 3244, Test of experimental setup for reflectance measurement at wavelengths 1.06 and 10.6 <mu>m, 0000 (20 April 1998); doi: 10.1117/12.306984
Materials and Measurements
Proc. SPIE 3244, Photothermal measuring techniques using pulsed laser, 0000 (20 April 1998); doi: 10.1117/12.306985
Fundamental Mechanisms
Proc. SPIE 3244, Pulse-shape and pulse-length scaling of ns pulse laser damage threshold due to rate limiting by thermal conduction, 0000 (20 April 1998); doi: 10.1117/12.306987
Materials and Measurements
Proc. SPIE 3244, Reliability of Czochralski-grown B-BaB2O4 (BBO) devices, 0000 (20 April 1998); doi: 10.1117/12.306988
Surfaces and Mirrors
Proc. SPIE 3244, High-damage-threshold fluoride UV mirrors made by ion-beam sputtering, 0000 (20 April 1998); doi: 10.1117/12.306989
Materials and Measurements
Proc. SPIE 3244, Characterization of laser components for high-power Ho:YAG lasers, 0000 (20 April 1998); doi: 10.1117/12.306990
Mini-Symposium: Damage and Lifetime Issues for Laser Diodes
Proc. SPIE 3244, Aging properties of AlGaAs/GaAs high-power diode lasers, 0000 (20 April 1998); doi: 10.1117/12.306991
Surfaces and Mirrors
Proc. SPIE 3244, Absorptance measurements of transmissive optical components by the surface thermal lensing technique, 0000 (20 April 1998); doi: 10.1117/12.306992
Materials and Measurements
Proc. SPIE 3244, Statistical study of UV-laser-induced failure of fused silica, 0000 (20 April 1998); doi: 10.1117/12.306993
Surfaces and Mirrors
Proc. SPIE 3244, End-face preparation methods for high-intensity fiber applications, 0000 (20 April 1998); doi: 10.1117/12.306994
Fundamental Mechanisms
Proc. SPIE 3244, Error sources in the damage frequency method, 0000 (20 April 1998); doi: 10.1117/12.306995
Proc. SPIE 3244, Area budgeting in the damage frequency method, 0000 (20 April 1998); doi: 10.1117/12.306996
Thin Films
Proc. SPIE 3244, Loss of transmittance in fluoropolymer films due to laser-induced damage at 1053 and 351 nm, 0000 (20 April 1998); doi: 10.1117/12.306998
Materials and Measurements
Proc. SPIE 3244, Bulk laser damage in CsLiB6O10 crystal, 0000 (20 April 1998); doi: 10.1117/12.306999
Surfaces and Mirrors
Proc. SPIE 3244, Improvement of laser-induced surface damage in CsLiB6O10 crystal by ion etching, 0000 (20 April 1998); doi: 10.1117/12.307000
Thin Films
Proc. SPIE 3244, Workshop on thin film thermal conductivity measurements, 0000 (20 April 1998); doi: 10.1117/12.307001
Fundamental Mechanisms
Proc. SPIE 3244, Toward the real threshold of the megajoule laser components, 0000 (20 April 1998); doi: 10.1117/12.307002
By Title Only
Proc. SPIE 3244, Condensed media optical property changes under influence of laser pulse repetition, 0000 (20 April 1998); doi: 10.1117/12.307003
Thin Films
Proc. SPIE 3244, Pulsed laser irridation of isothermally heated titania films, 0000 (20 April 1998); doi: 10.1117/12.307004
Materials and Measurements
Proc. SPIE 3244, Waves of reflection and conduction in ZnS, ZnSe, and Ge irradiated by single pulse of CO2 laser as a possible tool of precatastrophic damage indications, 0000 (20 April 1998); doi: 10.1117/12.307005
Proc. SPIE 3244, Slow components of wave of reflection and conduction (WRC) in plexiglass irradiated by single pulse of CO2 laser for damage threshold study, 0000 (20 April 1998); doi: 10.1117/12.307006
Proc. SPIE 3244, Cylindrical wave of reflection and conduction in IR transparent BaF2 single crystal excited by 2.5 <mu>s duration pulse of CO2 laser, 0000 (20 April 1998); doi: 10.1117/12.307007
Proc. SPIE 3244, Microstructural size effects on the dielectric response of inhomogeneous media, 0000 (20 April 1998); doi: 10.1117/12.307009
Thin Films
Proc. SPIE 3244, Interfacial effects on the transient temperature rise of multilayer coatings induced by a short-pulse laser irradiation, 0000 (20 April 1998); doi: 10.1117/12.307010
Materials and Measurements
Proc. SPIE 3244, Near-field detection of laser-induced thermal waves in optical materials, 0000 (20 April 1998); doi: 10.1117/12.307011
Proc. SPIE 3244, Investigation of optical calorimetric absorptance of Suprasil and CaF2 substrates in the UV range, 0000 (20 April 1998); doi: 10.1117/12.307012
Related Laser Diode Contributions
Proc. SPIE 3244, Pulsed-laser-induced damage in semiconductors Ge, ZnS, and ZnSe at 10.6um, 0000 (20 April 1998); doi: 10.1117/12.307013
Materials and Measurements
Proc. SPIE 3244, Damage mechanisms and transparency changes in CO2-laser-irradiated glass, 0000 (20 April 1998); doi: 10.1117/12.307014
Thin Films
Proc. SPIE 3244, Laser-induced damage in optical coatings and laser condition technology, 0000 (20 April 1998); doi: 10.1117/12.307015
Proc. SPIE 3244, Nonlinear UV damage mechanism in polymer thin films observed from below to above damage threshold, 0000 (20 April 1998); doi: 10.1117/12.307016
Proc. SPIE 3244, Perfluorinated polymer films with extraordinary UV-laser damage resistance, 0000 (20 April 1998); doi: 10.1117/12.307017
Proc. SPIE 3244, One step closer to the intrinsic laser damage threshold of HfO2 and SiO2 monolayer thin films, 0000 (20 April 1998); doi: 10.1117/12.307018
Proc. SPIE 3244, Multibillion shot high-influence exposure of Cr4+:YAG passive Q-switch, 0000 (20 April 1998); doi: 10.1117/12.307020
Related Laser Diode Contributions
Proc. SPIE 3244, Quasi-cw laser diode bar life tests, 0000 (20 April 1998); doi: 10.1117/12.307021
Materials and Measurements
Proc. SPIE 3244, Nonlinear optical crystal CsLiB6O10 for UV generation, 0000 (20 April 1998); doi: 10.1117/12.307022