PROCEEDINGS VOLUME 3306
PHOTONICS WEST '98 ELECTRONIC IMAGING | 24-30 JANUARY 1998
Machine Vision Applications in Industrial Inspection VI
IN THIS VOLUME

0 Sessions, 16 Papers, 0 Presentations
Algorithms  (3)
Applications  (4)
PHOTONICS WEST '98 ELECTRONIC IMAGING
24-30 January 1998
San Jose, CA, United States
Emerging Applications
Proc. SPIE 3306, Automatic blemish detection in liquid crystal flat panel displays, 0000 (2 February 1998); doi: 10.1117/12.301232
Proc. SPIE 3306, Automated optical inspection technology for HDD head suspension, 0000 (2 February 1998); doi: 10.1117/12.301241
Proc. SPIE 3306, Machine vision system applied to the characterization of a powder stream: application to the laser cladding process, 0000 (2 February 1998); doi: 10.1117/12.301242
Algorithms
Proc. SPIE 3306, Comparison of several artificial neural network classifiers for CT images of hardwood logs, 0000 (2 February 1998); doi: 10.1117/12.301243
Proc. SPIE 3306, Fuzzy logic connectivity in semiconductor defect clustering, 0000 (2 February 1998); doi: 10.1117/12.301244
Proc. SPIE 3306, New algorithm to calculate the center of laser reflections, 0000 (2 February 1998); doi: 10.1117/12.301245
Applications
Proc. SPIE 3306, Development of high-speed 3D inspection system for solder bumps, 0000 (2 February 1998); doi: 10.1117/12.301246
Proc. SPIE 3306, Detection of small or low-contrast defects in web inspection, 0000 (2 February 1998); doi: 10.1117/12.301247
Proc. SPIE 3306, Automated detection of Karnal bunt teliospores, 0000 (2 February 1998); doi: 10.1117/12.301233
Proc. SPIE 3306, Rule-based inspection of printed green ceramic tape, 0000 (2 February 1998); doi: 10.1117/12.301234
System Design
Proc. SPIE 3306, Shift-, rotation-, and scale-invariant shape recognition system using an optical Hough transform, 0000 (2 February 1998); doi: 10.1117/12.301235
Proc. SPIE 3306, High-speed optoelectric image processing unit for industrial inspection, 0000 (2 February 1998); doi: 10.1117/12.301236
Proc. SPIE 3306, Optoelectronic morphological processor for industrial online inspection, 0000 (2 February 1998); doi: 10.1117/12.301237
Proc. SPIE 3306, Adaptation of the fuzzy k-nearest neighbor classifier for manufacturing automation, 0000 (2 February 1998); doi: 10.1117/12.301238
Proc. SPIE 3306, Representing the object model for automatic visual inspection using a description language, 0000 (2 February 1998); doi: 10.1117/12.301239
Proc. SPIE 3306, Machine vision system for inner-wall surface inspection, 0000 (2 February 1998); doi: 10.1117/12.301240
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