State of the Art in Optical Metrology I
Proc. SPIE 3407, Nature of the optical information recorded in speckles, 0000 (29 September 1998); doi: 10.1117/12.323297
Proc. SPIE 3407, Large deformation measurement and analysis on related curved surfaces, 0000 (29 September 1998); doi: 10.1117/12.323308
Proc. SPIE 3407, Deformation measurement by optical field methods in material testing and for verification of numerical simulation, 0000 (29 September 1998); doi: 10.1117/12.323319
Proc. SPIE 3407, Real-time phase distribution analysis of fringe patterns, 0000 (29 September 1998); doi: 10.1117/12.323330
Proc. SPIE 3407, Near-field optical metrology, 0000 (29 September 1998); doi: 10.1117/12.323341
Proc. SPIE 3407, Measurement devices with and for micro-optics at the University of Erlangen, 0000 (29 September 1998); doi: 10.1117/12.323352
Progress in Phase Measurement Interferometry
Proc. SPIE 3407, Fringe pattern analysis methods: up-to-date review, 0000 (29 September 1998); doi: 10.1117/12.323363
Proc. SPIE 3407, Design of algorithms for phase measurement, 0000 (29 September 1998); doi: 10.1117/12.323372
Proc. SPIE 3407, Fourier analysis of phase-shifting algorithms, 0000 (29 September 1998); doi: 10.1117/12.323373
Proc. SPIE 3407, Progress in phase unwrapping, 0000 (29 September 1998); doi: 10.1117/12.323298
State of the Art in Optical Metrology II
Proc. SPIE 3407, Surface topometry by multiwavelength technique and temporal Fourier transformation, 0000 (29 September 1998); doi: 10.1117/12.323299
Proc. SPIE 3407, New applications of in-plane, shadow, and reflection moire methods, 0000 (29 September 1998); doi: 10.1117/12.323300
Proc. SPIE 3407, Whole-field digital analysis of photoelastic fringe patterns, 0000 (29 September 1998); doi: 10.1117/12.323301
Proc. SPIE 3407, Diffractive optical element in materials testing, 0000 (29 September 1998); doi: 10.1117/12.323302
Proc. SPIE 3407, Optical interferometry techniques in electrochemistry and corrosion, 0000 (29 September 1998); doi: 10.1117/12.323303
Proc. SPIE 3407, Roughness parameters and surface deformation measured by coherence radar, 0000 (29 September 1998); doi: 10.1117/12.323304
Proc. SPIE 3407, Surface profilometry by wavelength scanning interferometry, 0000 (29 September 1998); doi: 10.1117/12.323305
Holographic Interferometry
Proc. SPIE 3407, Pulsed TV holography system: development and some results, 0000 (29 September 1998); doi: 10.1117/12.323306
Proc. SPIE 3407, Flow diagnosis by using holographic interferometry, 0000 (29 September 1998); doi: 10.1117/12.323307
Proc. SPIE 3407, Digital holography: methods and applications, 0000 (29 September 1998); doi: 10.1117/12.323309
Proc. SPIE 3407, Contour mapping of the shape difference between two objects by holographic interferometry with reduced sensitivity, 0000 (29 September 1998); doi: 10.1117/12.323310
Proc. SPIE 3407, Holographic interferometry of strain waves as a tool for nondestructive testing, 0000 (29 September 1998); doi: 10.1117/12.323311
Proc. SPIE 3407, Combined implementation of holographic and speckle interferometry for comparative local stress analysis at different vibration modes, 0000 (29 September 1998); doi: 10.1117/12.323312
Colloquium in Recognition of Zoltan Fuzessy: International Tribute I
Proc. SPIE 3407, Holography for the investigation of technical systems, 0000 (29 September 1998); doi: 10.1117/12.323313
Proc. SPIE 3407, Applications of pulsed cineholographic interferometry, 0000 (29 September 1998); doi: 10.1117/12.323314
Proc. SPIE 3407, Pulsed digital holography for vibration analysis, 0000 (29 September 1998); doi: 10.1117/12.323315
Colloquium in Recognition of Z. Fuzessy: International Tribute II
Proc. SPIE 3407, Holography: science and art, 0000 (29 September 1998); doi: 10.1117/12.323316
Proc. SPIE 3407, Selected problems of optical metrology in industry, 0000 (29 September 1998); doi: 10.1117/12.323317
Proc. SPIE 3407, Thirty-odd years of industrial hologram interferometry, 0000 (29 September 1998); doi: 10.1117/12.323318
Colloquium in Recognition of Z. Fuzessy: Hungarian Tribute I
Proc. SPIE 3407, Estimating the shape factor of suspended particles in a liquid-borne particle counter, 0000 (29 September 1998); doi: 10.1117/12.323320
Proc. SPIE 3407, Multiwavelength ATR reflectometry of thin films, 0000 (29 September 1998); doi: 10.1117/12.323321
Proc. SPIE 3407, Size distribution measurement of particles in LDA systems using back scattering geometry, 0000 (29 September 1998); doi: 10.1117/12.323322
Proc. SPIE 3407, Adaptive system for speckle pattern interferometry, 0000 (29 September 1998); doi: 10.1117/12.323323
Proc. SPIE 3407, Electromagnetic field in optics, 0000 (29 September 1998); doi: 10.1117/12.323324
Colloquium in Recognition of Z. Fuzessy: Hungarian Tribute II
Proc. SPIE 3407, Beyond the upper limit of holographic and speckle interferometry, 0000 (29 September 1998); doi: 10.1117/12.323325
Proc. SPIE 3407, Measurement of thermal gradient in solutions generated by laser illumination, 0000 (29 September 1998); doi: 10.1117/12.323326
Proc. SPIE 3407, Velocity measurements in the nanosecond range realized by variably delayed dye laser exposition, 0000 (29 September 1998); doi: 10.1117/12.323327
Proc. SPIE 3407, Numerical simulation package for speckle metrology, 0000 (29 September 1998); doi: 10.1117/12.323328
State of the Art in Optical Metrology I
Proc. SPIE 3407, Evolution of optical interferometry in view of practical applications, 0000 (29 September 1998); doi: 10.1117/12.323329
Speckle Metrology I
Proc. SPIE 3407, Digital shearography for slope measurement, 0000 (29 September 1998); doi: 10.1117/12.323331
Proc. SPIE 3407, Speckle interferometry with nanoparticles, 0000 (29 September 1998); doi: 10.1117/12.323332
Proc. SPIE 3407, ESPI deformation measurement on lightweight structures under thermal load, 0000 (29 September 1998); doi: 10.1117/12.323333
Proc. SPIE 3407, Optical strain gauge, 0000 (29 September 1998); doi: 10.1117/12.323334
Proc. SPIE 3407, Fiber optical single-frame speckle interferometer for measuring industrial surfaces, 0000 (29 September 1998); doi: 10.1117/12.323335
Proc. SPIE 3407, Shear ESPI with small objects, 0000 (29 September 1998); doi: 10.1117/12.323336
Optical Methods for the Testing of Microsystem Elements
Proc. SPIE 3407, Optical measurement methods for MEMS applications, 0000 (29 September 1998); doi: 10.1117/12.323337
Proc. SPIE 3407, Combined measurement of silicon microbeams by grating interferometry and digital holography, 0000 (29 September 1998); doi: 10.1117/12.323338
Proc. SPIE 3407, Holographic microscopic interferometry with respect to the estimation of stress and strain in micro-opto-electro-mechanical systems (MOEMS), 0000 (29 September 1998); doi: 10.1117/12.323339
Fiber Optic Sensors and Applications
Proc. SPIE 3407, Distribution sensing by synthesis of the optical coherence function, 0000 (29 September 1998); doi: 10.1117/12.323340
Proc. SPIE 3407, Applications of distributed Brillouin fiber sensing, 0000 (29 September 1998); doi: 10.1117/12.323342
Proc. SPIE 3407, Structural analysis of bridges and beams using long-gage fiber optic sensors, 0000 (29 September 1998); doi: 10.1117/12.323343
Proc. SPIE 3407, Application of optical fiber sensors on the power dam of Luzzone, 0000 (29 September 1998); doi: 10.1117/12.323344
Proc. SPIE 3407, Testing of the Swiss Expo 2001 structural models by fiber optic and whole field optical methods, 0000 (29 September 1998); doi: 10.1117/12.323345
Speckle Metrology II
Proc. SPIE 3407, Speckle interferometry to investigate degradation processes of stressed solid materials, 0000 (29 September 1998); doi: 10.1117/12.323346
Proc. SPIE 3407, Measurement of stress distribution in fiber-glass-reinforced timber joint, 0000 (29 September 1998); doi: 10.1117/12.323347
Proc. SPIE 3407, Application of ESPI technique to evaluate the crack propagation zone of prenotched clay elements, 0000 (29 September 1998); doi: 10.1117/12.323348
Specialized Techniques and Applications I
Proc. SPIE 3407, Scanning optical microscopy and its applications to nondestructive materials testing, 0000 (29 September 1998); doi: 10.1117/12.323349
Proc. SPIE 3407, Effect of anomalous particle light scattering on PIV image quality, 0000 (29 September 1998); doi: 10.1117/12.323350
Proc. SPIE 3407, Experimental and numerical analysis of the thermal deformation of composite tubes, 0000 (29 September 1998); doi: 10.1117/12.323351