PROCEEDINGS VOLUME 3415
LASERS AND MATERIALS IN INDUSTRY AND OPTO-CONTACT WORKSHOP | 13-16 JULY 1998
Laser Diodes and Applications III
IN THIS VOLUME

0 Sessions, 22 Papers, 0 Presentations
LASERS AND MATERIALS IN INDUSTRY AND OPTO-CONTACT WORKSHOP
13-16 July 1998
Quebec, Canada
Laser Diodes I
Proc. SPIE 3415, Temperature dependence of self-pulsation in narrow-stripe gain-guided compact disk laser diodes, 0000 (8 October 1998); doi: 10.1117/12.326618
Proc. SPIE 3415, Self-mode-locked semiconductor diode laser, 0000 (8 October 1998); doi: 10.1117/12.326625
Proc. SPIE 3415, Oscillation frequency stabilization of a semiconductor laser using the magneto-optical effects of Rb-D2 absorption line, 0000 (8 October 1998); doi: 10.1117/12.326635
Proc. SPIE 3415, Compact frequency standard at 1556 nm based on the two-photon transition in rubidium at 778 nm, 0000 (8 October 1998); doi: 10.1117/12.326636
Laser Diodes II
Proc. SPIE 3415, High-brightness stack arrays for DPSSL laser applications, 0000 (8 October 1998); doi: 10.1117/12.326637
Proc. SPIE 3415, Dual-wavelength operation in a semiconductor laser with an apodizing holographic grating, 0000 (8 October 1998); doi: 10.1117/12.326638
Proc. SPIE 3415, Effect of nonradiative recombination coefficient and gain saturation parameter on second harmonic distortion in 1.55-um InGaAsP semiconductor laser diodes, 0000 (8 October 1998); doi: 10.1117/12.326639
Laser Diode Applications I
Proc. SPIE 3415, High-power amplification of a pulsed fiber laser, 0000 (8 October 1998); doi: 10.1117/12.326619
Laser Diode Applications II
Proc. SPIE 3415, Direct use of diode lasers: an overview, 0000 (8 October 1998); doi: 10.1117/12.326620
Proc. SPIE 3415, Visual navigation assistance using DPSSL, 0000 (8 October 1998); doi: 10.1117/12.326621
Proc. SPIE 3415, Application of laser diodes in digital speckle pattern shearing interferometry, 0000 (8 October 1998); doi: 10.1117/12.326622
Proc. SPIE 3415, Laser scanning technique for 3D measurement, 0000 (8 October 1998); doi: 10.1117/12.326623
Laser Diode Applications III
Proc. SPIE 3415, Generation of intensity squeezed light with VCSELs: theory and experiment, 0000 (8 October 1998); doi: 10.1117/12.326624
Proc. SPIE 3415, Influence of a weak optical feedback on the spectral characteristics of a semiconductor laser for sensing applications, 0000 (8 October 1998); doi: 10.1117/12.326626
Proc. SPIE 3415, Semiconductor lasers used as the metrology source in Fourier-transform spectrometers: effect of their noise, 0000 (8 October 1998); doi: 10.1117/12.326627
Proc. SPIE 3415, Laser diodes applications for contamination control in microelectronics fabrication processes, 0000 (8 October 1998); doi: 10.1117/12.326628
Proc. SPIE 3415, Optocontact mini-displacement measurement instrument, 0000 (8 October 1998); doi: 10.1117/12.326629
Laser Diodes III
Proc. SPIE 3415, Measurement and parameter extraction of semiconductor lasers: experiences of the pan-European action COST 240, 0000 (8 October 1998); doi: 10.1117/12.326630
Proc. SPIE 3415, Frequency noise, Allan variance, and lineshape of semiconductor lasers, 0000 (8 October 1998); doi: 10.1117/12.326631
Proc. SPIE 3415, Oscillation wavelength shifts of visible and infrared laser diodes in a magnetic field, 0000 (8 October 1998); doi: 10.1117/12.326632
Proc. SPIE 3415, Oscillation frequency stabilization of a semiconductor laser under direct FSK by using the PEAK method, 0000 (8 October 1998); doi: 10.1117/12.326633
Proc. SPIE 3415, Different approach for distortion analysis of external-cavity laser diode using volterra series, 0000 (8 October 1998); doi: 10.1117/12.326634
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